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US4011471A
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Surface potential stabilizing circuit for charge-coupled devices radiation hardening
Assignee: United States Department of the Air Force
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Filing: 1975-11-18
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Granted: 1977-03-08
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Expires: 1995-11-18
Abstract
Abstract An integrable circuit incorporated with charge-coupled devices to stabilize the surface potential against oxide charging effects by regulating the applied gate voltage. By incorporating the circuit with charge-coupled devices, the complete integrated unit is effectively radiation hardened over an extended range of operation.
Inventors
- 👤 Leonard R. Rockett, Jr.
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 19:37
CPC Classifications
G; G11; G11C; G11C19/00; G11C19/28; G11C19/282; G11C19/285; H; H04; H04N; H04N25/00; H04N25/70; H04N25/71; H10; H10D; H10D84/00; H10D84/891; H10D89/00; H10D89/211; H10D89/213; Y; Y10; Y10S; Y10S257/00; Y10S257/906
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
165 words
A surface potential stabilizing circuit for charge-coupled device radiation hardening comprising first and second MOSFET devices, in combination, forming a source follower stage, said first MOSFET device having a first predetermined threshold voltage and operating as an input device to receive an applied voltage, V G ', said source follower stage modifying said applied voltage, V G ', by an amount equal to said first predetermined threshold voltage, said second MOSFET device being a saturated MOS load for said source follower stage, third and fourth MOSFET devices, in combination, forming an inverter stage, said fourth MOSFET device having a second predetermined threshold voltage, the modified applied voltage from said source follower stage being received by said fourth MOSFET device to offset any threshold voltage error to appear at the stabilized circuit output with the stabilized circuit output voltage being the sum of V G ' and said second predetermined threshold voltage, said third MOSFET device operating as a saturated MOS load for said inverter stage.
Claim 2
Dependent Claim
165 words
A surface potential stabilizing circuit for charge-coupled device radiation hardening comprising first and second MOSFET devices, in combination, forming a source follower stage, said first MOSFET device having a first predetermined threshold voltage and operating as an input device to receive an applied voltage, V G ', said source follower stage modifying said applied voltage, V G ', by an amount equal to said first predetermined threshold voltage, said second MOSFET device being a saturated MOS load for said source follower stage, third and fourth MOSFET devices, in combination, forming an inverter stage, said fourth MOSFET device having a second predetermined threshold voltage, the modified applied voltage from said source follower stage being received by said fourth MOSFET device to offset any threshold voltage error to appear at the stabilized circuit output with the stabilized circuit output voltage being the sum of V G ' and said second predetermined threshold voltage, said third MOSFET device operating as a saturated MOS load for said inverter stage.
Claim 3
Dependent Claim
94 words
A surface potential stabilizing circuit as described in claim 1 wherein said first, second, third and fourth MOSFET devices each include a gate, source, and drain, each of said gates having a gate oxide predetermined thickness, with the gate oxide thickness of said fourth MOSFET device being t ox .sbsb.4 matching exactly the charge-coupled device integrated therewith, said gate of said first MOSFET receiving as an input the voltage V G ' and said drain of said first MOSFET and said gate and drain of said third MOSFET receiving a voltage V DD .
Claim 4
Dependent Claim
128 words
A surface potential stabilizing circuit as described in claim 1 wherein said first, second, third and fourth MOSFET devices each include a gate, source, and drain, with each of said gates having a predetermined oxide thickness with the gate oxide thickness of said fourth MOSFET device being a specified t ox .sbsb.4 and with gate oxide thickness t ox .sbsb.1 of said first MOSFET device being equal to gate oxide thickness t ox .sbsb.3 of said third MOSFET device thereby equalizing the threshold voltages of said first and third MOSFET devices, said gate of said first MOSFET receiving as an input the voltage V G ' and said drain of said first MOSFET and said gate and drain of said third MOSFET receiving a voltage, V DD .
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-03-07 | 1980-09-06 | 1981-03-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-03-07 | 1984-09-06 | 1985-03-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-03-07 | 1988-09-06 | 1989-03-08 | $7700.00 | Window Closed / Lapsed |