Defect identification with normalizing of gain function in optical-electrical inspection

Claim 3

The method of claim 1 wherein said identification of said defect-related signals is enhanced by coherent adding of said difference signals for a plurality of said scans.

Claim 4

The method of claim 2 wherein said difference signals are accumulated over several scans in an order such that the instantaneous difference signal waveforms for alternate scans are inverted and combined with shifted partial sum values of said accumulated difference signals, thereby effectively nullifying the accumulation of periodic bias level changes.

Claim 5

Apparatus for defect identification with normalizing of the optical-electrical inspection system gain function of scans across a full width of a running product web comprising, in electrical circuit in the sequence recited, a source of electrical scan signals A, a memory storing a sufficient accumulation of a number of said signals A to permit the resolution of an acceptable average reference signal R, means computing said average signal R as the quotient of said accumulation of said number of said signals A divided by said number of said signals A accumulated, means computing the difference signal A-R for succeeding scan signals A, thereby effectively equalizing each successive scan signal A while preserving defect-related signals, and means identifying said defect-related signals by amplitude discrimination of said difference signal A-R.

Claim 6

Apparatus for defect identification with normalizing of the optical-electrical inspection system gain function of scans across a full width of a running product web comprising, in electrical circuit in the sequence recited, a source of electrical scan signals A, a memory storing a sufficient accumulation of a number of said signals A to permit the resolution of an acceptable average reference signal R, means computing said average signal R as the quotient of said accumulation of said number of said signals A divided by said number of said signals A accumulated, means computing the difference signal A-R for succeeding scan signals A, thereby effectively equalizing each successive scan signal A while preserving defect-related signals, and means identifying said defect-related signals by amplitude discrimination of said difference signal A-R.

Claim 7

Apparatus according to claim 4 provided with means for coherent adding of the difference signals A-R for a plurality of said scans.

Claim 8

Apparatus according to claim 5 provided with a second memory means for accumulation of said difference signals A-R over several scans, means for shifting the address locations of the partial sum values stored in said second memory means a preselected number of units on successive even (or odd) scans, means for inverting instantaneous difference signals A-R on said even (or odd) scans and means combining said inverted instantaneous difference signals A-R with said stored partial sum values of said accumulation of said difference signals over several scans, thereby effectively nullifying the accumulation of periodic bias level changes.

Claim 11

The method of claim 7 wherein said identification of said defect-related signals is enhanced by coherent adding of said logarithmic ratio signals A/R for a plurality of said scans.

Claim 12

The method of claim 7 wherein said logarithmic ratio signals A/R are accumulated over several scans in an order such that the instantaneous logarithmic ratio signal waveforms for alternate scans are inverted and combined with shifted partial sum values of said accumulated logarithmic ratio signals A/R, thereby effectively nullifying the accumulation of periodic bias level changes.

Claim 13

Apparatus for defect identification with normalizing of the optical-electrical inspection system gain function of scans across a full width of a running product web comprising, in electrical circuit in the sequence recited, an Analog/Digital converter to which logarithmically processed electrical scan signals A are input, a memory storing a sufficient accumulation of a number of said scan signals A to permit the resolution of an acceptable average reference signal R, means computing said average signal R as the quotient of said accumulation of said number of said scan signals A divided by said number of said scan signals A accumulated, means computing the logarithmic ratio signal A/R for each successive scan signal A, by subtraction of the logarithms of signals A and R, thereby effectively equalizing each successive scan signal A while preserving defect-related signals in true perspective to the non-defect containing portions of said signal A/R, and means identifying said defect-related signals by amplitude discrimination of said logarithmic ratio signal A/R.

Claim 14

Apparatus for defect identification with normalizing of the optical-electrical inspection system gain function of scans across a full width of a running product web comprising, in electrical circuit in the sequence recited, an Analog/Digital converter to which logarithmically processed electrical scan signals A are input, a memory storing a sufficient accumulation of a number of said scan signals A to permit the resolution of an acceptable average reference signal R, means computing said average signal R as the quotient of said accumulation of said number of said scan signals A divided by said number of said scan signals A accumulated, means computing the logarithmic ratio signal A/R for each successive scan signal A, by subtraction of the logarithms of signals A and R, thereby effectively equalizing each successive scan signal A while preserving defect-related signals in true perspective to the non-defect containing portions of said signal A/R, and means identifying said defect-related signals by amplitude discrimination of said logarithmic ratio signal A/R.

Claim 15

Apparatus according to claim 10 provided with means for coherent adding of the logarithmic ratio signals for a plurality of said scans.

Claim 16

Apparatus according to claim 11 provided with a second memory means for accumulation of said logarithmic ratio signals A/R over several scans, means for shifting the address locations of the partial sum values stored in said second memory means a preselected number of units on successive even (or odd) scans, means for inverting instantaneous logarithmic ratio signals A/R on said even (or odd) scans and means combining said inverted instantaneous logarithmic ratio signals A/R with said stored partial sum values of said accumulation of said logarithmic ratio signals A/R over several scans, thereby effectively nullifying the accumulation of periodic bias level changes.