US4001050A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of fabricating an isolated p-n junction
Assignee: NCR Voyix Corp
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Filing: 1975-11-10
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Granted: 1977-01-04
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Expires: 1995-11-10
Abstract
Abstract A method of forming dielectrically isolated islands of semiconductor material on which discrete devices may be formed is disclosed. A wafer of semiconductive material is provided with an oxide layer and, by ion implantation, is lightly doped after which, openings are formed in the oxide. The portions of wafer exposed by the openings are then heavily doped and the wafer is then subjected to a high temperature step to drive in the dopants and produce isolated areas.
Inventors
- 👤 Tuh-Kai Koo
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 07:54
CPC Classifications
H; H10; H10P; H10P30/00; H10P30/20; H10P30/202; H10P30/204; H10P30/21; H10P30/212; H10P32/00; H10P32/10; H10P32/14; H10P32/1404; H10P32/17; H10P32/171; H10W; H10W10/00; H10W10/01; H10W10/031; H10W10/30
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
81 words
A method of forming a semiconductor device comprising the steps of: providing a semiconductor wafer of given conductivity; implanting a given concentration of a first dopant, of an impurity of the opposite type of conductivity, under the surface of the wafer; thermally diffusing a second dopant, of the given conductivity, into selected areas on the surface of the wafer, the second dopant concentration being greater than the concentration of the first dopant; driving the first and second dopant into the wafer.
Claim 2
Independent Claim
81 words
A method of forming a semiconductor device comprising the steps of: providing a semiconductor wafer of given conductivity; implanting a given concentration of a first dopant, of an impurity of the opposite type of conductivity, under the surface of the wafer; thermally diffusing a second dopant, of the given conductivity, into selected areas on the surface of the wafer, the second dopant concentration being greater than the concentration of the first dopant; driving the first and second dopant into the wafer.
Claim 3
Dependent Claim
44 words
The method of claim 1 wherein the step of driving the first and second dopants into the wafer comprises: heating the surface doped wafer at an elevated temperature wherein the second dopant penetrates the wafer, in the thickness direction, deeper than the first dopant.
Claim 4
Independent Claim
117 words
A method of forming a semiconductor device comprising the steps of: providing a semiconductor wafer of a given conductivity; growing a layer of oxide on one surface of the wafer; implanting a given concentration of a first dopant, of the opposite type conductivity, in the wafer below the interface with the oxide; masking selected portions of the implanted surface of the wafer, the unmasked portion representing areas to be isolated; thermally diffusing a second dopant, of the given conductivity, into the unmasked portions of the wafer; driving the first and second dopants into the wafer; removing the layer of oxide; removing the mask; and forming active devices on the portions of the wafer surface that were masked.
Claim 5
Independent Claim
117 words
A method of forming a semiconductor device comprising the steps of: providing a semiconductor wafer of a given conductivity; growing a layer of oxide on one surface of the wafer; implanting a given concentration of a first dopant, of the opposite type conductivity, in the wafer below the interface with the oxide; masking selected portions of the implanted surface of the wafer, the unmasked portion representing areas to be isolated; thermally diffusing a second dopant, of the given conductivity, into the unmasked portions of the wafer; driving the first and second dopants into the wafer; removing the layer of oxide; removing the mask; and forming active devices on the portions of the wafer surface that were masked.
Claim 6
Dependent Claim
44 words
The method of claim 3 wherein the step of driving the first and second dopants into the wafer comprises: heating the surface doped wafer at an elevated temperature wherein the second dopant penetrates the wafer, in the thickness direction, deeper than the first dopant.
Claim 7
Dependent Claim
44 words
The method of claim 4 wherein: the first dopant is implanted over the entire surface of the wafer below the interface with the oxide; and the active devices are formed by diffusing areas of first conductivity in the previously masked portion of the wafer.
Claim 8
Dependent Claim
9 words
The product formed by the process of claim 5.
Claim 9
Dependent Claim
46 words
The method of claim 4 wherein: the first dopant is implanted in the area of the wafer to be isolated; and the active devices are formed by diffusing areas of second conductivity into the wafer in the portions that were not implanted with the first dopant.
Claim 10
Dependent Claim
9 words
The product formed by the process of claim 7.
Claim 11
Dependent Claim
33 words
The method of claim 4 comprising the further step of: providing the oxide with an ion impervious mask to prevent the implantation of ions of the first dopant into areas of the wafer.
Claim 12
Dependent Claim
27 words
The method of claim 9 comprising the further step of: forming active devices in the unimplanted area of the wafer by diffusing areas of second conductivity therein.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-01-04 | 1980-07-05 | 1981-01-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-01-04 | 1984-07-05 | 1985-01-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-01-04 | 1988-07-05 | 1989-01-04 | $7700.00 | Window Closed / Lapsed |