Patent US3963984A successfully refreshed from Google Patents.
US3963984A
Expired / Lapsed
US
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Method and system for cleaning an aperture in a particle study device
Assignee: Coulter Electronics Inc
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Filing: 1974-11-04
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Granted: 1976-06-15
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Expires: 1994-11-04
Abstract
Abstract In both the method and system for clearing the debris from the aperture of a particle study device combinations of pulses of predetermined, waveform amplitude and frequency are developed and coupled through the conductive fluid passing through the particle study device aperture. The pulses cause the fluid in the aperture to vaporize and form a gas. The gas explodes away any debris clogging the aperture as it escapes from the aperture.
Inventors
- 👤 Wallace H. Coulter
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 16:48
CPC Classifications
G; G01; G01N; G01N15/00; G01N15/10; G01N15/1031; G01N15/12; G01N15/131
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
142 words
In a particle study device having an aperture through which particles to be studied pass, which aperture clogs with debris, and wherein the particles are suspended in an electrically conductive fluid which flows through said aperture, an aperture cleaning system including in combination, a first electrode positioned in said fluid an on one side of said aperture, a second electrode positioned in said fluid and on the second side of the said aperture, Pulse generation means for developing combinations of pulses, having a repetition rate approximately in the range of 5 to 100 KHz said electrodes being coupled to said pulse generation means and operative to couple said combinations of pulses through said fluid and said aperture between said first and second electrodes, said fluid in said aperture being responsive to said pulses passing therethrough to remove said debris clogging said aperture.
Claim 2
Dependent Claim
142 words
In a particle study device having an aperture through which particles to be studied pass, which aperture clogs with debris, and wherein the particles are suspended in an electrically conductive fluid which flows through said aperture, an aperture cleaning system including in combination, a first electrode positioned in said fluid an on one side of said aperture, a second electrode positioned in said fluid and on the second side of the said aperture, Pulse generation means for developing combinations of pulses, having a repetition rate approximately in the range of 5 to 100 KHz said electrodes being coupled to said pulse generation means and operative to couple said combinations of pulses through said fluid and said aperture between said first and second electrodes, said fluid in said aperture being responsive to said pulses passing therethrough to remove said debris clogging said aperture.
Claim 3
Dependent Claim
31 words
The system of claim 1 further including switch means coupled between said first and second electrodes and said pulse generation means for selectively coupling said pulse generation means to said electrodes.
Claim 4
Dependent Claim
27 words
The system of claim 1 wherein said pulse generation means is a pulse generator and said combinations of pulses have a repetition rate of approximately 10 KHz.
Claim 5
Dependent Claim
14 words
The system of claim 1 wherein said pulse generation means is a pulse generator.
Claim 6
Dependent Claim
45 words
The system of claim 1 further including, control means coupled to said pulse generation means and operative to develop a control signal in response to predetermined conditions, said pulse generation means being operative to develop said combinations of pulses in response to said control signal.
Claim 7
Dependent Claim
40 words
The system of claim 1 wherein said electrodes are further selectively coupled to a particle analyzing device and are operative in response to electrical excitation received therefrom and passage of a particle through said aperture to develop a particle pulse.
Claim 8
Dependent Claim
61 words
The system of claim 6 wherein said particle analyzing device develops a first signal, and further including, control means coupled to said particle analyzing device and said pulse generation means and operative in response to said first signal to develop a control signal, said pulse generation means being operative to develop said combinations of pulses in response to said control signal.
Claim 9
Dependent Claim
23 words
The system of claim 7 wherein said first signal is at least one of a start signal, stop signal and debris alarm signal.
Claim 10
Dependent Claim
30 words
The system of claim 1 wherein said fluid in said aperture vaporizes in response to said combinations of pulses passing therethrough said vaporized fluid exploding said debris from said aperture.
Claim 11
Dependent Claim
91 words
In a particle study device having an aperture through which particles to be studied pass and which clogs with debris, and wherein the particles are suspended in an electrically conductive fluid which flows through said aperture, a method of clearing the aperture of debris including the steps of: developing combinations of pulses of predetermined amplitude, frequency, waveform, and repetition and having a repetition rate approximately in the range of 5 to 100 KHz, coupling said pulses through said electrically conductive fluid and said aperture for exploding said debris from said aperture.
Claim 12
Dependent Claim
91 words
In a particle study device having an aperture through which particles to be studied pass and which clogs with debris, and wherein the particles are suspended in an electrically conductive fluid which flows through said aperture, a method of clearing the aperture of debris including the steps of: developing combinations of pulses of predetermined amplitude, frequency, waveform, and repetition and having a repetition rate approximately in the range of 5 to 100 KHz, coupling said pulses through said electrically conductive fluid and said aperture for exploding said debris from said aperture.
Claim 13
Dependent Claim
28 words
The method of claim 10 wherein said pulses vaporize the fluid in the aperture and explode said debris from said aperture by allowing said vaporized fluid to escape.
Claim 14
Dependent Claim
31 words
The method of claim 10 wherein said step of coupling said combinations of pulses through said fluid and aperture includes selectively coupling said combinations of pulses to said fluid and aperture.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1979-06-15 | 1979-12-15 | 1980-06-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1983-06-15 | 1983-12-15 | 1984-06-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1987-06-15 | 1987-12-15 | 1988-06-15 | $7700.00 | Window Closed / Lapsed |