Prefilter-ionizer apparatus for use with quadrupole type secondary-ion mass spectrometers

Claim 3

An apparatus according to claim 1, wherein the diameter of said center portion of said entrance aperture plate, the diameter of said circular opening in said exit aperture plate and the distance from the end of the unidimensional electrode adjacent said exit aperture plate to said exit aperture plate are all approximately equal.

Claim 4

An apparatus according to claim 1, further comprising a source of electrons and an electron permeable chamber whereby the application of an electrical bias to said chamber with respect to said source of electrons causes electrons produced by said source to be directed toward and to pass into the chamber to ionize atoms therein and the application of other predetermined potentials to said grid and to said entrance and exit aperture plates causes said ionized atoms to be directed through said exit aperture plate.

Claim 5

An apparatus according to claim 3 further comprising an electrostatic shield surrounding said chamber, said electron source being positioned between said chamber and said electrostatic shield.

Claim 6

An apparatus according to claim 3, wherein said electron source is a filament comprising an elongated helix of a refractory metal, the filament being positioned between the shell and grid, the axis of the helix being parallel to the common axis of the shell and grid.

Claim 7

An apparatus according to claim 1, wherein said grid and said entrance and exit aperture plates define an electron permeable chamber and said apparatus further comprises a cylindrical electrically conductive electron impermeable shell concentrically positioned outside said grid and a source of electrons between said shell and said grid, whereby the energization of said source of electrons and the application of an electrical bias to said grid with respect to said source of electrons causes electrons to be directed toward and to pass into said chamber and the application of other predetermined potentials to said entrance and exit aperture plates with respect to said grid causes said ionized atoms to be directed through said exit aperture plate.

Claim 8

A secondary ion mass spectrometer comprising an ion gun adapted for bombardment of a material to thereby sputter and ionize atoms from said material, an ion selection apparatus including an electrically conductive cylindrical grid having entrance and exit ends allowing the axial passage of ions therethrough, an electrically conductive entrance aperture plate electrically insulated from said grid and positioned adjacent the entrance end thereof such that the plane of the entrance plate is normal to the longitudinal axis of said grid, said entrance aperture plate having an annular opening concentric with the longitudinal axis of said grid through which ions may be admitted into said grid, the center portion of the entrance aperture plate forming a baffle to prevent ions such as may be directed toward the entrance end from passing directly along said axis through said grid and having a substantially unidimensional electrode attached to the center portion and extending within said grid and along said axis thereof substantially the full length of said grid, an electrically conductive exit aperture plate electrically insulated from said grid and positioned adjacent the exit end thereof such that the plane of said exit aperture plate is normal to said axis of said grid, said exit aperture plate having a circular opening concentric with said axis to restrict the passage of ions out of said grid, whereby the application of predetermined potentials to said grid and to the entrance and exit aperture plates respectively causes ions entering the grid through said annular opening and which have a relatively low energy to be selectively transmitted out through said opening in said exit aperture plate, a quadrupole mass analyzer axially positioned adjacent the exit aperture plate, the longitudinal axis of said grid and that of said analyzer being in line such that ions transmitted through said exit aperture plate pass into the analyzer and are selectively transported therethrough in accordance with the mass of said ions and the potentials applied to said quadrupole mass analyzer, and ion detecting means positioned adjacent said quadrupole analyzer to receive ions transmitted therethrough and to generate a signal corresponding to such transmitted ions.

Claim 9

A secondary ion mass spectrometer comprising an ion gun adapted for bombardment of a material to thereby sputter and ionize atoms from said material, an ion selection apparatus including an electrically conductive cylindrical grid having entrance and exit ends allowing the axial passage of ions therethrough, an electrically conductive entrance aperture plate electrically insulated from said grid and positioned adjacent the entrance end thereof such that the plane of the entrance plate is normal to the longitudinal axis of said grid, said entrance aperture plate having an annular opening concentric with the longitudinal axis of said grid through which ions may be admitted into said grid, the center portion of the entrance aperture plate forming a baffle to prevent ions such as may be directed toward the entrance end from passing directly along said axis through said grid and having a substantially unidimensional electrode attached to the center portion and extending within said grid and along said axis thereof substantially the full length of said grid, an electrically conductive exit aperture plate electrically insulated from said grid and positioned adjacent the exit end thereof such that the plane of said exit aperture plate is normal to said axis of said grid, said exit aperture plate having a circular opening concentric with said axis to restrict the passage of ions out of said grid, whereby the application of predetermined potentials to said grid and to the entrance and exit aperture plates respectively causes ions entering the grid through said annular opening and which have a relatively low energy to be selectively transmitted out through said opening in said exit aperture plate, a quadrupole mass analyzer axially positioned adjacent the exit aperture plate, the longitudinal axis of said grid and that of said analyzer being in line such that ions transmitted through said exit aperture plate pass into the analyzer and are selectively transported therethrough in accordance with the mass of said ions and the potentials applied to said quadrupole mass analyzer, and ion detecting means positioned adjacent said quadrupole analyzer to receive ions transmitted therethrough and to generate a signal corresponding to such transmitted ions.

Claim 10

An ion mass spectrometer according to claim 7, further comprising a source of electrons and an electron permeable chamber electrically biased with respect to said source of electrons to cause electrons produced by said source to be directed toward and to pass into said chamber to ionize atoms contained therein whereby the application of other predetermined potentials to the grid and to said entrance and exit aperture plates causes said ionized atoms to be directed through said grid and into said quadrupole mass analyzer to determine the mass of said ionized atoms.