Patent US3919504A successfully refreshed from Google Patents.
US3919504A
Expired / Lapsed
US
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Method and apparatus on in-circuit testing of a group of sequentially-operated system output bistable devices
Assignee: AG Communication Systems Corp
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Filing: 1974-02-27
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Granted: 1975-11-11
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Expires: 1994-02-27
Abstract
Abstract A method and apparatus of in-circuit testing of bi-stable devices in a system having a sequentially-operated control unit including a sequence state counter for setting and resetting the bi-stable devices, includes advancing the sequence state counter to a sequence state associated with the selected device under test, enabling sequentially the selected device under test to be controlled by the output of the counter, providing a processing unit for determining the proper output condition of the selected device under test and selectively gating subsequently the output of the selected bi-stable device under test to the processing unit to determine whether or not the device under test is operative.
Inventors
- 👤 Thomas W Crosley
- 👤 Howard R Miller
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 17:36
CPC Classifications
G; G06; G06F; G06F11/00; G06F11/22; H; H04; H04Q; H04Q3/00; H04Q3/42; H04Q3/54; H04Q3/545; H04Q3/54575; H04Q3/54591
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
112 words
In a system having a sequentially-operated control unit including a group of bi-stable output devices responsive to the outputs of a sequence state counter, a method of in-circuit testing a selected one of the bi-stable devices, comprising: advancing the sequence state counter to a sequence state associated with the selected device under test; enabling subsequently the selected device under test to be controlled by the output of the counter; providing processing means for determining the proper output condition for the selected device under test; and selectively gating subsequently the output of the selected bistable device under test to said processing means to determine whether or not the device under test is operative.
Claim 2
Dependent Claim
112 words
In a system having a sequentially-operated control unit including a group of bi-stable output devices responsive to the outputs of a sequence state counter, a method of in-circuit testing a selected one of the bi-stable devices, comprising: advancing the sequence state counter to a sequence state associated with the selected device under test; enabling subsequently the selected device under test to be controlled by the output of the counter; providing processing means for determining the proper output condition for the selected device under test; and selectively gating subsequently the output of the selected bistable device under test to said processing means to determine whether or not the device under test is operative.
Claim 3
Dependent Claim
117 words
In a system having a sequentially-operated control unit including a group of bi-stable output devices responsive to the outputs of a sequence state counter, an apparatus for incircuit testing a selected one of the bi-stable devices, comprising: means for advancing the sequence state counter to a sequence state associated with the selected device under test; means for enabling subsequently the selected device under test to be controlled by the output of the counter; processing means for determining the proper output condition for the selected device under test; and means for selectively gating subsequently the output of the selected bi-stable device under test to said processing means to determine whether or not the device under test is operative.
Claim 4
Dependent Claim
117 words
In a system having a sequentially-operated control unit including a group of bi-stable output devices responsive to the outputs of a sequence state counter, an apparatus for incircuit testing a selected one of the bi-stable devices, comprising: means for advancing the sequence state counter to a sequence state associated with the selected device under test; means for enabling subsequently the selected device under test to be controlled by the output of the counter; processing means for determining the proper output condition for the selected device under test; and means for selectively gating subsequently the output of the selected bi-stable device under test to said processing means to determine whether or not the device under test is operative.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1978-11-10 | 1979-05-12 | 1979-11-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1982-11-10 | 1983-05-12 | 1983-11-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1986-11-10 | 1987-05-12 | 1987-11-11 | $7700.00 | Window Closed / Lapsed |