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US3915764A Expired / Lapsed US ⏱️ 0.0 years remaining

Sputtering method for growth of thin uniform layers of epitaxial semiconductive materials doped with impurities

Assignee: Westinghouse Electric Corp
•
Filing: 1973-05-18
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Granted: 1975-10-28
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Expires: 1993-05-18
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Abstract

Abstract An RF sputtering process which permits the controlled growth of doped, epitaxial layers of semiconductive materials, highly uniform in thickness and suitable for high frequency microwave applications. An essential feature of the process is the introduction, during sputtering, of an N-type or P-type impurity as a gaseous chemical compound in which the metallic element is liberated in the confined RF discharge.

Inventors

  • 👤 Alexander J Noreika
  • 👤 Maurice H Francombe

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 01:40
CPC Classifications
C; C30; C30B; C30B23/00; C30B23/02; C30B23/002; C30B29/00; C30B29/10; C30B29/40; C30B29/42; Y; Y10; Y10S; Y10S148/00; Y10S148/049; Y10S148/056; Y10S148/065; Y10S148/122; Y10S148/158; Y10S252/00; Y10S252/95; Y10S252/951; Y10S438/00; Y10S438/914; Y10S438/925

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 206 words
A METHOD FOR GROWING UNIFORMLY THIN DOPED LAYERS OF EPITAXIAL SEMICONDUCTIVE MATERIAL COMPRISING THE STEPS OF: A. POSITIONING ADJACENT ONE OF TWO OPPOSITELY-DISPOSED ELECTRODES A SUBSTRATE ON WHICH THE EPITAXIAL LAYER OF SEMICONDUCTIVE MATERIAL IS TO BE GROWN, B. POSITIONING A TARGET OF SEMICONDUCTIVE MATERIAL FROM WHICH THE EPITIAXIAL LAYER IS TO BE FORMED ON THE OTHER OF SAID TWO ELECTRODES, (C) HEATING SAID SUBSTRATE TO A TEMPERATURE OF ABOUT 530*C TO 600*C, D. EVACUATING THE SPACE AROUND SAID ELECTRODES OF AIR WHILE INTRODUCING INTO SAID SPACE CONTROLLED AMOUNTS OF AN INERT IONIZABLE GAS TOGETHER WITH A REACTIVE CHEMICAL COMPOUND IN THE VAPOR STATE IN WHICH A P-TYPE OR N-TYPE DEPONANT ELEMENT IS LIBERATED IN A CONFINED RADIO-FREQUENCY DISCHARGE, THE INOIZABLE GAS PRESSURE BEING IN THE RANGE OF ABOUT 2 TO 8X10**-3 TORR WITH THE REACTIVE COMPOUND BEING PRESENT IN THE AMOUNT OF ABOUT 1 PART TO 10**2-10**3 PARTS INERT GAS, AND E. APPLYING A RADIO-FREQUENCY POTENTIAL ACROSS SAID TWO ELECTRODES TO THEREBY ESTABLISH A RADIO-FREQUENCY DISCHARGE BETWEEN THE ELECTRODES WHEREBY ATOMS OF THE TARGET WILL BE KNOCKED LOOSE FROM THE TARGET BY IMPINGING IONS OF THE IONIZABLE GAS AND WILL TRAVEL TO THE SUBSTRATE TO FORM AN EPITAXIAL LAYER DOPED WITH THE LIBERTED DOPANT ELEMENT.
Claim 2
Independent Claim 206 words
A METHOD FOR GROWING UNIFORMLY THIN DOPED LAYERS OF EPITAXIAL SEMICONDUCTIVE MATERIAL COMPRISING THE STEPS OF: A. POSITIONING ADJACENT ONE OF TWO OPPOSITELY-DISPOSED ELECTRODES A SUBSTRATE ON WHICH THE EPITAXIAL LAYER OF SEMICONDUCTIVE MATERIAL IS TO BE GROWN, B. POSITIONING A TARGET OF SEMICONDUCTIVE MATERIAL FROM WHICH THE EPITIAXIAL LAYER IS TO BE FORMED ON THE OTHER OF SAID TWO ELECTRODES, (C) HEATING SAID SUBSTRATE TO A TEMPERATURE OF ABOUT 530*C TO 600*C, D. EVACUATING THE SPACE AROUND SAID ELECTRODES OF AIR WHILE INTRODUCING INTO SAID SPACE CONTROLLED AMOUNTS OF AN INERT IONIZABLE GAS TOGETHER WITH A REACTIVE CHEMICAL COMPOUND IN THE VAPOR STATE IN WHICH A P-TYPE OR N-TYPE DEPONANT ELEMENT IS LIBERATED IN A CONFINED RADIO-FREQUENCY DISCHARGE, THE INOIZABLE GAS PRESSURE BEING IN THE RANGE OF ABOUT 2 TO 8X10**-3 TORR WITH THE REACTIVE COMPOUND BEING PRESENT IN THE AMOUNT OF ABOUT 1 PART TO 10**2-10**3 PARTS INERT GAS, AND E. APPLYING A RADIO-FREQUENCY POTENTIAL ACROSS SAID TWO ELECTRODES TO THEREBY ESTABLISH A RADIO-FREQUENCY DISCHARGE BETWEEN THE ELECTRODES WHEREBY ATOMS OF THE TARGET WILL BE KNOCKED LOOSE FROM THE TARGET BY IMPINGING IONS OF THE IONIZABLE GAS AND WILL TRAVEL TO THE SUBSTRATE TO FORM AN EPITAXIAL LAYER DOPED WITH THE LIBERTED DOPANT ELEMENT.
Claim 3
Dependent Claim 11 words
The method of claim 1 wherein said ionizable gas comprises argon.
Claim 4
Dependent Claim 18 words
The method of claim 1 wherein said semiconductive material from which the target is formed comprises gallium arsenide.
Claim 5
Dependent Claim 13 words
The method of claim 1 wherein said reactive chemical compound comprises a gas.
Claim 6
Dependent Claim 49 words
The method of claim 1 wherein said reactive chemical compound is initially in the form of a liquid organometallic compound, and including the steps of bubbling said ionizable gas through a bath of the liquid organometallic compound to form a vapor, and thereafter introducing said vapor into said space.
Claim 7
Dependent Claim 29 words
The method of claim 1 wherein said chemical compound in which a dopant element is liberated is selected from the group consisting of SiH4, GeH4H2Se, H2S, Zn(CH3)2 and Zn(CH3)4.

References Cited (Backward Citations)

US3450581A Cited
US3372069A Cited
US3673071A Cited
US3660180A Cited
US3716404A Cited
US3751310A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1978-10-27 1979-04-28 1979-10-28 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1982-10-27 1983-04-28 1983-10-28 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1986-10-27 1987-04-28 1987-10-28 $7700.00 Window Closed / Lapsed

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