Patent US3898561A successfully refreshed from Google Patents.
US3898561A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Tester for electrical devices
Assignee: Heath Co
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Filing: 1973-08-20
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Granted: 1975-08-05
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Expires: 1993-08-20
Abstract
Abstract A tester for automobile-type solid state voltage regulators which provides normal and extreme operating condition tests, such as a low temperature-high current test, a high temperature and current test, and a high temperature-low current test. Additionally, the tester provides both low temperature and high temperature tests for other internal circuits of the voltage regulator, such as the battery disconnect protection circuit, the voltage level sensor circuit and the temperature compensation circuit of the regulator. The temperature of the regulator is raised by heating a test chamber which contains the regulator under test and a power transistor which is a part of the supply circuit of the test current provided by the tester.
Inventors
- 👤 Sr Thomas H Leighton
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 16:40
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/005; G01R31/006
Claims Analysis
Total Claims: 37
Claim 1
Independent Claim
190 words
A tester for voltage regulators each having a field current switch circuit, said tester comprising: means for testing the field current switch circuit of a voltage regulator at a low temperature with a high test current applied to said field current switch circuit; means disposed in heat exchanging relationship with said field current switch circuit and responsive to said high test current for gradually raising its temperature and thereby raising the temperature of said field current switch circuit; means responsive to the raising of the temperature of said field current switch circuit for testing the field circuit of the voltage regulator at a high temperature with said high test current; means responsive to the reaching of a defined threshold level by said raised temperature for testing the field circuit of the voltage regulator at a high temperature with a test current which is low as compared to said high test current; and means for indicating the results of each of the tests at a low temperature and a high test current, at a high temperature and a high test current and at a high temperature and a low test current.
Claim 2
Dependent Claim
190 words
A tester for voltage regulators each having a field current switch circuit, said tester comprising: means for testing the field current switch circuit of a voltage regulator at a low temperature with a high test current applied to said field current switch circuit; means disposed in heat exchanging relationship with said field current switch circuit and responsive to said high test current for gradually raising its temperature and thereby raising the temperature of said field current switch circuit; means responsive to the raising of the temperature of said field current switch circuit for testing the field circuit of the voltage regulator at a high temperature with said high test current; means responsive to the reaching of a defined threshold level by said raised temperature for testing the field circuit of the voltage regulator at a high temperature with a test current which is low as compared to said high test current; and means for indicating the results of each of the tests at a low temperature and a high test current, at a high temperature and a high test current and at a high temperature and a low test current.
Claim 3
Dependent Claim
33 words
A tester as in claim 1 wherein the voltage regulator includes a battery disconnect protection circuit and the tester includes means for testing said protection circuit at high temperature and at low temperature.
Claim 4
Dependent Claim
33 words
A tester as in claim 2 wherein the voltage regulator includes a voltage level sensor circuit, and the tester includes means for testing said sensor circuit at high temperature and at low temperature.
Claim 5
Dependent Claim
28 words
A tester as in claim 3 wherein the means for testing the voltage level sensor circuit include means for testing the sensor circuit at high and low voltage.
Claim 6
Dependent Claim
30 words
A tester as in claim 4 wherein the voltage regulator includes a temperature compensation circuit, and the tester includes means for testing said compensation circuit at low and high temperature.
Claim 7
Dependent Claim
31 words
A tester as in claim 1 wherein the voltage regulator includes a voltage level sensor circuit and the tester includes means for testing the sensor circuit at high and low temperature.
Claim 8
Dependent Claim
28 words
A tester as in claim 6 wherein the means for testing the voltage level sensor circuit include means for testing the sensor circuit at high and low voltage.
Claim 9
Dependent Claim
31 words
A tester as in claim 7 wherein the voltage regulator includes a battery disconnect protection circuit and the tester includes means for testing said protection circuit at high and low temperature.
Claim 10
Dependent Claim
30 words
A tester as in claim 8 wherein the voltage regulator includes a temperature compensation circuit and the tester includes means for testing said compensation circuit at low and high temperature.
Claim 11
Dependent Claim
30 words
A tester as in claim 1 wherein the voltage regulator includes a temperature compensation circuit and the tester includes means for testing said compensation circuit at low and high temperature.
Claim 12
Dependent Claim
31 words
A tester as in claim 10 wherein the voltage regulator includes a battery disconnect protection circuit and the tester includes means for testing said protection circuit at high and low temperature.
Claim 13
Dependent Claim
31 words
A tester as in claim 11 wherein the voltage regulator includes a voltage level sensor circuit and the tester includes means for testing said sensor circuit at high and low temperature.
Claim 14
Dependent Claim
26 words
A tester as in claim 12 wherein the means for testing the sensor circuit includes means for testing the sensor circuit at high and low voltage.
Claim 15
Dependent Claim
31 words
A tester as in claim 1 wherein the voltage regulator includes a voltage level sensor circuit and the tester includes means for testing the sensor circuit at low and high voltage.
Claim 16
Dependent Claim
112 words
A tester comprising: a test chamber for receiving a voltage regulator for testing; and means for applying a test current to the voltage regulator, said means comprising a first current source circuit including a power transistor through which said test current passes, said transistor disposed in a heat exchange relationship with said test chamber and the voltage regulator received therein, whereby the said of test current to the voltage regulator raises the temperature in the test chamber by heat transfer thereto from siad power transistor, and the voltage regulator is tested at lower temperature at the start of the current through the transistor and at a higher temperature at a later time.
Claim 17
Dependent Claim
112 words
A tester comprising: a test chamber for receiving a voltage regulator for testing; and means for applying a test current to the voltage regulator, said means comprising a first current source circuit including a power transistor through which said test current passes, said transistor disposed in a heat exchange relationship with said test chamber and the voltage regulator received therein, whereby the said of test current to the voltage regulator raises the temperature in the test chamber by heat transfer thereto from siad power transistor, and the voltage regulator is tested at lower temperature at the start of the current through the transistor and at a higher temperature at a later time.
Claim 18
Dependent Claim
115 words
A tester as in claim 15 wherein the means for applying test current include: a second current source circuit; temperature responsive switch means disposed in a heat exchange relationship with the test chamber and connected to the first and second current source circuit for discontinuing the test current through the first current source circuit and for establishing a test current through the second current source circuit when the temperature in the test chamber exceeds a first selected level and for discontinuing the test current through the second current source circuit and for establishing the test current through the first current source circuit when the temperature in the test chamber falls below a second selected level.
Claim 19
Dependent Claim
66 words
A tester as in claim 16 wherein the current through the first source circuit is a relatively high current and the current through the second source circuit is a relatively low current, whereby the voltage regulator in the test chamber is tested, in sequence, at low temperature and high test current, at high temperature and low test current, and at high temperature and high test current.
Claim 20
Dependent Claim
33 words
A tester as in claim 17 wherein the voltage regulator received in the test chamber has a field current switch circuit and the test current is applied to said field current switch circuit.
Claim 21
Dependent Claim
31 words
A tester as in claim 18 wherein the voltage regulator includes a battery disconnect protection circuit and the tester includes means for testing said protection circuit at high and low temperature.
Claim 22
Dependent Claim
31 words
A tester as in claim 19 wherein the voltage regulator includes a voltage level sensor circuit and the tester includes means for testing the sensor circuit at high and low temperature.
Claim 23
Dependent Claim
30 words
A tester as in claim 20 wherein the voltage regulator includes a temperature compensation circuit and the tester includes means for testing the compensation circuit at low and high temperature.
Claim 24
Dependent Claim
31 words
A tester as in claim 18 wherein the voltage regulator includes a voltage level sensor circuit and the tester includes means for testing the sensor circuit at high and low temperature.
Claim 25
Dependent Claim
31 words
A tester as in claim 18 wherein the voltage regulator includes a battery disconnect protection circuit and the tester includes means for testing the protection circuit at high and low temperature.
Claim 26
Dependent Claim
30 words
A tester as in claim 18 wherein the voltage regulator includes a temperature compensation circuit and the tester includes means for testing the compensation circuit at low and high temperature.
Claim 27
Dependent Claim
160 words
A tester for electrical devices comprising: a test chamber for receiving a device for testing; a current source circuit for applying a test current to the device in the test chamber, said circuit including: current passing means disposed in heat exchange relationship with said test chamber and generating heat when passing current, and means defining a first current path for passing current through said current passing means and for applying said current to the device, whereby the test chamber and the device received therein are heated when current is passing through said first path; and temperature responsive switch means disposed in heat exchange relationship with said test chamber and means defining a second current path, said temperature switch means establishing a test current through said first path when the temperature in the test chamber is below a selected level and establishing a test current through said second path when the temperature in the test chamber is above a selected level.
Claim 28
Dependent Claim
160 words
A tester for electrical devices comprising: a test chamber for receiving a device for testing; a current source circuit for applying a test current to the device in the test chamber, said circuit including: current passing means disposed in heat exchange relationship with said test chamber and generating heat when passing current, and means defining a first current path for passing current through said current passing means and for applying said current to the device, whereby the test chamber and the device received therein are heated when current is passing through said first path; and temperature responsive switch means disposed in heat exchange relationship with said test chamber and means defining a second current path, said temperature switch means establishing a test current through said first path when the temperature in the test chamber is below a selected level and establishing a test current through said second path when the temperature in the test chamber is above a selected level.
Claim 29
Dependent Claim
61 words
A tester as in claim 25 wherein the test current through the first path is a relatively high current and the test current through the second path is a relatively low current, whereby the device received in the test chamber is tested, in sequence, at low temperature and high current, high temperature and low curreNt and high temperature and high current.
Claim 30
Independent Claim
173 words
A method of testing electrical devices comprising: providing a test chamber for a device for testing; applying a first test current to the device therein through a first current source circuit that includes a current passing means disposed in a heat exchange relationship with the test chamber and generating heat when passing current, whereby the application of test current to the device raises the temperature of the test chamber by heat transfer thereto from the current passing means, for testing the device at lower temperature at the start of the test current and at a higher temperature at a later time; and detecting the temperature of the device, permitting the first test current only when the device temperature is below a selected level, and applying a second test current when the device temperature is above a selected level, said first and second current being high and low current respectively, thereby testing the device, sequentially, at low temperature and high current, at high temperature and high current and at high temperature and low current.
Claim 31
Independent Claim
173 words
A method of testing electrical devices comprising: providing a test chamber for a device for testing; applying a first test current to the device therein through a first current source circuit that includes a current passing means disposed in a heat exchange relationship with the test chamber and generating heat when passing current, whereby the application of test current to the device raises the temperature of the test chamber by heat transfer thereto from the current passing means, for testing the device at lower temperature at the start of the test current and at a higher temperature at a later time; and detecting the temperature of the device, permitting the first test current only when the device temperature is below a selected level, and applying a second test current when the device temperature is above a selected level, said first and second current being high and low current respectively, thereby testing the device, sequentially, at low temperature and high current, at high temperature and high current and at high temperature and low current.
Claim 32
Independent Claim
177 words
A method of testing voltage regulators each having a field current switch circuit comprising the steps of: testing the field current switch circuit of a voltage regulator at a low temperature by applying a high test current to said field current switch circuit; raising the temperature of said field circuit by providing a current responsive device disposed in a heat exchanging relationship with said field current switch circuit and gradually raising the temperature of said device by said high test current therethrough; testing the field current switch circuit of the voltage regulator after its temperature has been raised to a high temperature by applying thereto said high test current; testing the field current switch circuit of the voltage regulator substantially at said high temperature by applying thereto a test current which is low as compared to said high test current; and indicating the results of each of said tests at a low temperature and a high test current, at a high temperature and a high test current and at a high temperature and a low test current.
Claim 33
Independent Claim
177 words
A method of testing voltage regulators each having a field current switch circuit comprising the steps of: testing the field current switch circuit of a voltage regulator at a low temperature by applying a high test current to said field current switch circuit; raising the temperature of said field circuit by providing a current responsive device disposed in a heat exchanging relationship with said field current switch circuit and gradually raising the temperature of said device by said high test current therethrough; testing the field current switch circuit of the voltage regulator after its temperature has been raised to a high temperature by applying thereto said high test current; testing the field current switch circuit of the voltage regulator substantially at said high temperature by applying thereto a test current which is low as compared to said high test current; and indicating the results of each of said tests at a low temperature and a high test current, at a high temperature and a high test current and at a high temperature and a low test current.
Claim 34
Dependent Claim
33 words
A method as in claim 28 wherein the voltage regulator includes a battery disconnect protection circuit and including the additional step of testing the protection circuit at high temperature and at low temperature.
Claim 35
Dependent Claim
32 words
A method as in claim 28 wherein the voltage regulator includes a voltage level sensor circuit and including the additional step of testing said sensor circuit at high and at low temperature.
Claim 36
Dependent Claim
22 words
A method as in claim 30 including the additional step of testing the sensor circuit at high and at low applied voltage.
Claim 37
Dependent Claim
31 words
A method as in claim 28 wherein the voltage regulator includes a temperature compensation circuit, and including the additional step of testing the compensation circuit at low and at high temperature.
References Cited (Backward Citations)
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1978-08-04 | 1979-02-03 | 1979-08-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1982-08-04 | 1983-02-03 | 1983-08-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1986-08-04 | 1987-02-03 | 1987-08-05 | $7700.00 | Window Closed / Lapsed |