US3886357A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Multiple ion beam type double focusing mass spectrometer
Assignee: Jeol Ltd
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Filing: 1973-12-18
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Granted: 1975-05-27
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Expires: 1993-12-18
Abstract
Abstract A multiple ion beam type double focusing mass spectrometer designed to control ion beams from a plurality of ion sources so as to form a single beam. The single ion beam is introduced into an electric field while the accelerating voltages or electric field intensity is varied stepwise so that by means of the energy dispersion effect of said electric field, the respective ion beams accelerated at different accelerating voltages are repeatedly and sequentially introduced into a magnetic field. At the output side of the magnetic detector, an ion detector detects said repeatedly and sequentially introduced ion beams and converts them into time shared signals.
Inventors
- 👤 Motohiro Naito
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 14:41
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/26; H01J49/28; H01J49/32; H01J49/02; H01J49/022; H01J49/10; H01J49/14
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
242 words
In a double focusing mass spectrometer comprising an electrostatic analyzer with adjustable power supply, a magnetic analyzer with adjustable power supply, at least one baffle with an aperture therein between said electrostatic and magnetic analyzers, an ion detector and a plurality of ion sources, the improvement comprising means for guiding the plurality of ion beams emitted from said sources along a common path in a single ion beam to the electrostatic analyzer, individually adjustable power supplies for each ion source, adjusting circuit means associated with at least one of the adjustable power supplies for adjusting the ratio of the ion source accelerating voltages and the electric field strength of the electrostatic analyzer, said adjusting circuit means including a control pulse generator for directing the adjusting circuit means for some period of time to pass more than one ion beam to the magnetic analyzer but for that period to pass no more than one ion beam from a given source continually to the magnetic analyzer and to pass the ion beam from at least one source intermittently to the magnetic analyzer, means associated with at least one of the adjustable power supplies for sweeping the ratio of the energy of the ion beams passing the electrostatic analyzer and the magnetic field strength of the magnetic analyzer such that the detector detects time shared multiple signals indicative of the mass to charge ratios of ions comprising the ion beams passed to the magnetic analyzer.
Claim 2
Dependent Claim
242 words
In a double focusing mass spectrometer comprising an electrostatic analyzer with adjustable power supply, a magnetic analyzer with adjustable power supply, at least one baffle with an aperture therein between said electrostatic and magnetic analyzers, an ion detector and a plurality of ion sources, the improvement comprising means for guiding the plurality of ion beams emitted from said sources along a common path in a single ion beam to the electrostatic analyzer, individually adjustable power supplies for each ion source, adjusting circuit means associated with at least one of the adjustable power supplies for adjusting the ratio of the ion source accelerating voltages and the electric field strength of the electrostatic analyzer, said adjusting circuit means including a control pulse generator for directing the adjusting circuit means for some period of time to pass more than one ion beam to the magnetic analyzer but for that period to pass no more than one ion beam from a given source continually to the magnetic analyzer and to pass the ion beam from at least one source intermittently to the magnetic analyzer, means associated with at least one of the adjustable power supplies for sweeping the ratio of the energy of the ion beams passing the electrostatic analyzer and the magnetic field strength of the magnetic analyzer such that the detector detects time shared multiple signals indicative of the mass to charge ratios of ions comprising the ion beams passed to the magnetic analyzer.
Claim 3
Dependent Claim
45 words
The improvement set forth in claim 1 wherein said adjusting circuit means adjusts the ratio of the each ion source accelerating voltage and the electrostatic field ad seriatim such that ion beams from each ion source pass in pulses to the magnetic analyzer ad seriatim.
Claim 4
Dependent Claim
52 words
The improvement according to claim 2, wherein adjusting circuit means comprising means for intermittently bringing the accelerating voltage of at least one power source to a reference voltage, said reference voltage being in the correct ratio with the strength of the electrostatic field to pass the ion beam to the magnetic analyzer.
Claim 5
Dependent Claim
43 words
The improvement according to claim 3 comprising a signal generator for determining the ion forming period, repitition frequency and phase thereof so that the ion beams do not pass through the electric field during the rise and fall times of the accelerating voltages.
Claim 6
Dependent Claim
55 words
The improvement according to claim 2 wherein said adjusting circuit means comprises means for fixing said ion source accelerating voltages at mutually different levels and for adjusting the intensity of the electric field in a repeated seqUence so that the ion beams accelerated by said accelerating voltages are introduced into the magnetic field ad seriatim.
Claim 7
Dependent Claim
42 words
The improvement according to claim 5 comprising a signal generator for determining the ion forming period, repitition frequency and phase so that the ion beams do not pass through the electric field while the intensity of said electric field is being varied.
Claim 8
Dependent Claim
59 words
The improvement set forth in claim 1 wherein said adjusting circuit means adjusts the ratios of each ion source voltage and the electric field to permit the ion beam from one ion source to be continously passed to the magnetic analyzer and the ion beams from at least another ion source to pass in pulses to the magnetic analyzer.
Claim 9
Dependent Claim
54 words
The improvement according to claim 7 wherein the adjusting circuit means comprises means for holding one ion source accelerating voltage at a reference voltage and the strength of the electric field to pass ions accelerated through the reference voltage and adjusting the accelerating voltages of at least another ion source to the reference voltage.
Claim 10
Dependent Claim
56 words
The improvement according to claim 8 comprising a signal generator for generating signals for determining the ion forming period of said ion sources, the repitition frequency, and phase thereof relating to said adjusting circuit so that the ion beams do not pass through the electric field during the rise and fall times of the accelerating voltages.
Claim 11
Dependent Claim
35 words
The improvement set forth in claim 1 comprising a signal processing circuit in synchronism with said adjusting circuit means for recovering signals indicative of the mass spectra of the ion beam from each ion source.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1978-05-26 | 1978-11-25 | 1979-05-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1982-05-26 | 1982-11-25 | 1983-05-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1986-05-26 | 1986-11-25 | 1987-05-27 | $7700.00 | Window Closed / Lapsed |