US3796872A
Expired / Lapsed
US
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Mass spectrometry
Assignee: Associated Electrical Industries Ltd
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Filing: 1971-12-13
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Granted: 1974-03-12
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Expires: 1991-12-13
Abstract
Abstract A mass spectrometer in which plural beams of ions are generated from a common substance for simultaneous passage through an analyzer region. An auxiliary electrostatic analysis is performed on one of the analyzed beams which are received by separate collectors. Metastable ions are observed at one collector while their parents are observed at another collector.
Inventors
- 👤 T Merren
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 23:04
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/26; H01J49/28; H01J49/32; H01J49/326; H01J49/02; H01J49/10; H01J49/107
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
95 words
A method of mass spectrometry performed with a plural beam mass spectrometer wherein a plurality of ion beams formed from a common substance are passed through a common analyser means including magnetic and electrostatic analysers and collected by individual ion collectors, comprising the steps of further electrostatically analysing one of the beams between the common analyser means and the respective ion collector, and directly collecting at least one other ion beam on a respective other ion collector without electrostatic analysis of said other ion beam between the common analyser means and said other ion collector.
Claim 2
Independent Claim
95 words
A method of mass spectrometry performed with a plural beam mass spectrometer wherein a plurality of ion beams formed from a common substance are passed through a common analyser means including magnetic and electrostatic analysers and collected by individual ion collectors, comprising the steps of further electrostatically analysing one of the beams between the common analyser means and the respective ion collector, and directly collecting at least one other ion beam on a respective other ion collector without electrostatic analysis of said other ion beam between the common analyser means and said other ion collector.
Claim 3
Dependent Claim
29 words
The method of claim 1, wherein metastable ions are collected by said respective ion collector and parent ions of said metastable ions are collected by said other ion collector.
Claim 4
Dependent Claim
25 words
The method of claim 1, wherein parent ions are collected by said respective ion collector and metastable ions are collected by said other ion collector.
Claim 5
Dependent Claim
27 words
The method of claim 1 wherein the further electrostatic analysis of said one of the beams is performed by making a scanning variation of an electrostatic field.
Claim 6
Dependent Claim
23 words
The method of claim 1 wherein the further electrostatic analysis of said one of the beams is performed with a fixed electric field.
Claim 7
Independent Claim
118 words
A method of mass spectrometry performed with a double-beam mass spectrometer having ion source means, a common analyser means including magnetic and electrostatic analysers, an auxiliary electrostatic analyser, and two ion collectors, comprising the steps of: a. introducing a substance into said ion source means and forming two ion beams therefrom; b. passing the two ion beams through the common analyser means; c. thereafter collecting one of said ion beams directly on one of said ion collectors; aNd, d. passing the other of said ion beams through said auxiliary electrostatic analyser, performing an auxiliary electrostatic analysis on said other ion beam and subsequently collecting ions passing through said auxiliary electrostatic analyser on the other of said ion collectors.
Claim 8
Independent Claim
118 words
A method of mass spectrometry performed with a double-beam mass spectrometer having ion source means, a common analyser means including magnetic and electrostatic analysers, an auxiliary electrostatic analyser, and two ion collectors, comprising the steps of: a. introducing a substance into said ion source means and forming two ion beams therefrom; b. passing the two ion beams through the common analyser means; c. thereafter collecting one of said ion beams directly on one of said ion collectors; aNd, d. passing the other of said ion beams through said auxiliary electrostatic analyser, performing an auxiliary electrostatic analysis on said other ion beam and subsequently collecting ions passing through said auxiliary electrostatic analyser on the other of said ion collectors.
Claim 9
Dependent Claim
22 words
The method of claim 6 wherein the auxiliary electrostatic analysis is performed by a fixed electric field within said auxiliary electrostatic analyzer.
Claim 10
Dependent Claim
26 words
The method of claim 6 wherein the auxiliary electrostatic analysis is performed by making a scanning variation of an electric field within said auxiliary electrostatic analyzer.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-03-11 | 1977-09-10 | 1978-03-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-03-11 | 1981-09-10 | 1982-03-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-03-11 | 1985-09-10 | 1986-03-12 | $7700.00 | Window Closed / Lapsed |