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US3884696A Expired / Lapsed US ⏱️ 0.0 years remaining

Positive photoresist comprising polysulfones formed by reacting vinyl aromatic hydrocarbons with sulfur dioxide

Assignee: AT&T Inc
•
Filing: 1974-03-05
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Granted: 1975-05-20
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Expires: 1994-03-05
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Abstract

Abstract A technique is described for the generation of a patterned relief image in a sensitive positive photoresist comprising a polysulfone formed by reacting vinyl aromatic hydrocarbons with sulfur dioxide. Pattern generation is effected by exposure of the polysulfone to ultraviolet radiation of a wavelength within the range of 1,700-4,000 A. and selective removal of the exposed portion with a suitable solvent.

Inventors

  • 👤 Murrae John Stanley Bowden
  • 👤 Edwin Arthur Chandross

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 17:42
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/004; G03F7/039; C; C07; C07F; C07F9/00; C07F9/02; C07F9/28; C07F9/54; C07F9/5407

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 69 words
THE METHOD OF FORMING A PATTERNED RESIST ON THE SURFACE OF A SUBSTRATE WHICH COMPRISES EXPOSING A PORTION OF AN ARYLATED POLYSULFONE FILM ON SAID SUBSTRATE TO ULTRAVIOLET RADIATION HAVING A WAVELENGTH WITHIN THE RANGE OF 1,700-4,000 A FOR A TIME PERIOD SUFFICIENT TO LOWER THE MOLECULAR WEIGHT OF THE POLYSULFONE, AND SELECTIVELY REMOVING THE EXPOSED PORTION FROM SAID SUBSTRATE, SAID POLYSULFONE BEING SELECTED FROM THE GROUP CONSISTING OF
Claim 2
Independent Claim 69 words
THE METHOD OF FORMING A PATTERNED RESIST ON THE SURFACE OF A SUBSTRATE WHICH COMPRISES EXPOSING A PORTION OF AN ARYLATED POLYSULFONE FILM ON SAID SUBSTRATE TO ULTRAVIOLET RADIATION HAVING A WAVELENGTH WITHIN THE RANGE OF 1,700-4,000 A FOR A TIME PERIOD SUFFICIENT TO LOWER THE MOLECULAR WEIGHT OF THE POLYSULFONE, AND SELECTIVELY REMOVING THE EXPOSED PORTION FROM SAID SUBSTRATE, SAID POLYSULFONE BEING SELECTED FROM THE GROUP CONSISTING OF
Claim 3
Dependent Claim 13 words
Method in accordance with claim 1 wherein R is a 1.8 naphthylidene radical.
Claim 4
Dependent Claim 13 words
Method in accordance with claim 1 wherein said radical is a naphthyl radical.
Claim 5
Dependent Claim 13 words
Method in accordance with claim 1 wherein said radical is a phenyl radical.
Claim 6
Independent Claim 124 words
The method of forming a patterned resist on the surface of a substrate which comprises exposing a portion of a film of a polysulfone, made up of polymer chains having recurring -CH -SO2- linkages, on said substrate to sufficient radiation to lower the molecular weight of said exposed portion and selectively removing the exposed portion of lower molecular weight from said substrate, characterized in that the carbon atoms in said linkages in the initial polysulfone are bonded by one of their valences to the ring of an aromatic radical so as to render said linkages sensitive to ultraviolet radiation and characterized further in that the radiation to which said portions are exposed is ultraviolet radiation, said polysulfone being selected from the group consisting of
Claim 7
Independent Claim 124 words
The method of forming a patterned resist on the surface of a substrate which comprises exposing a portion of a film of a polysulfone, made up of polymer chains having recurring -CH -SO2- linkages, on said substrate to sufficient radiation to lower the molecular weight of said exposed portion and selectively removing the exposed portion of lower molecular weight from said substrate, characterized in that the carbon atoms in said linkages in the initial polysulfone are bonded by one of their valences to the ring of an aromatic radical so as to render said linkages sensitive to ultraviolet radiation and characterized further in that the radiation to which said portions are exposed is ultraviolet radiation, said polysulfone being selected from the group consisting of

References Cited (Backward Citations)

US3535137A Cited
US3585118A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1978-05-19 1978-11-18 1979-05-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1982-05-19 1982-11-18 1983-05-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1986-05-19 1986-11-18 1987-05-20 $7700.00 Window Closed / Lapsed

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