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US3871931A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for selectively etching silicon nitride

Assignee: Plessey Inc
•
Filing: 1974-01-17
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Granted: 1975-03-18
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Expires: 1994-01-17
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Abstract

Abstract Etching of silicon nitride with a hot solution of arsenic acid is faster than the conventionally-employed phosphoric acid, and has the additional advantage of not attacking either silicon dioxide or heavily doped silicon. The invention is useful in the fabrication of silicon integrated circuits and in the surface treatment of silicon nitride bodies, i. e. chemical milling.

Inventors

  • 👤 Geoffrey Allan Godber

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 12:27
CPC Classifications
C; C04; C04B; C04B41/00; C04B41/009; C04B41/53; C04B41/5338; C04B41/5353; C04B41/80; C04B41/91; H; H10; H10P; H10P50/00; H10P50/20; H10P50/28; H10P50/282; H10P50/283; Y; Y10; Y10S; Y10S148/00; Y10S148/043; Y10S148/051

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 36 words
A METHOD OF SELECTIVELY ETCHING SILICON NITRIDE COMPRISING: PROVIDING AN ETCH SOLUTION OF ARSENIC ACID, HEATING SAID ETCH SOLUTION OF AN ELEVATED TEMPERATURE; AND EXPOSING SELECTED AREAS OF SAID SILICON NITRIDE TO THE HEATED ETCH SOLUTION.
Claim 2
Independent Claim 36 words
A METHOD OF SELECTIVELY ETCHING SILICON NITRIDE COMPRISING: PROVIDING AN ETCH SOLUTION OF ARSENIC ACID, HEATING SAID ETCH SOLUTION OF AN ELEVATED TEMPERATURE; AND EXPOSING SELECTED AREAS OF SAID SILICON NITRIDE TO THE HEATED ETCH SOLUTION.
Claim 3
Dependent Claim 19 words
The method as claimed in claim 1, wherein said selected areas are defined by openings in an etch-resistant mask.
Claim 4
Dependent Claim 14 words
The method as claimed in claim 2, wherein said mask is a photo resist.
Claim 5
Dependent Claim 13 words
The method as claimed in claim 2, wherein said mask is silicon dioxide.
Claim 6
Dependent Claim 22 words
The method as claimed in claim 1, and additionally comprising adding a stabilizing arsenic compound to said etch solution prior to etching.
Claim 7
Dependent Claim 13 words
The method as claimed in claim 5, wherein said compound is arsenic pentoxide.
Claim 8
Dependent Claim 16 words
The method as claimed in claim 1, wherein said etch solution is heated to approximately 140*C.
Claim 9
Dependent Claim 23 words
In a method for the etching of silicon nitride by reaction thereof with a hot acid, the improvement comprising using hot arsenic acid.
Claim 10
Dependent Claim 23 words
In a method for the etching of silicon nitride by reaction thereof with a hot acid, the improvement comprising using hot arsenic acid.
Claim 11
Dependent Claim 15 words
The method as claimed in claim 8, wherein said arsenic acid is at about 140*C.

References Cited (Backward Citations)

US3706612A Cited
US3671437A Cited
US3709749A Cited
US3759768A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1978-03-17 1978-09-16 1979-03-18 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1982-03-17 1982-09-16 1983-03-18 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1986-03-17 1986-09-16 1987-03-18 $7700.00 Window Closed / Lapsed

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