Patent US3859535A successfully refreshed from Google Patents.
US3859535A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus for imparting contrast to a microscope object
Assignee: Ernst Leitz Wetzlar GmbH
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Filing: 1972-06-12
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Granted: 1975-01-07
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Expires: 1992-06-12
Abstract
Abstract The method of imparting contrast to the surface of an object to be viewed microscopically comprises the steps of introducing the object into a vacuum chamber, connecting the object to the positive pole of a high voltage d.c. source, evacuating the chamber, bombarding the surface of the object with a gasconcentrated electron-ion beam, and feeding into the chamber a gas which reacts chemically with the bombarded object surface. Under the effect of the electron beam and negative or neutralized ions then forms a reaction layer characteristic of the component parts of the object material which layer, after the conclusion of the contrasting process can be observed and evaluated under a microscope.
Inventors
- 👤 Gunter Bartz
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 03:07
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/32; H01J37/34; H01J2237/00; H01J2237/30; H01J2237/31; H01J2237/3151
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
240 words
An apparatus for imparting contrast to the surface portion of an object to be investigated microscopically, the apparatus comprising: a. a non-grounded vacuum chamber (1); b. an object carrier (2) inside the vacuum chamber for disposing an object thereon, the carrier being connected to one wall of the chamber; c. a high voltage D.C. source (3) outside the vacuum chamber, the positive pole of the D.C. source being connected to the object carrier and to the ground; d. a combined electron-ion gun (5) of the gas discharging type mounted in the wall of the vacuum chamber opposite from the object carrier, the cathode of said combined electron-ion gun being connected to the negative pole of the D.C. source and being so adjusted that an electron-ion-beam derived from the gun impinges on an object, which is electrically conductive, positioned on the object carrier, and wherein the ion gun of the said combined electron-ion gun has a regulatable gas source connected thereto for bombarding said surface portion of an object with a gas concentrated electron ion-beam; e. means for supplying a reagent gas into the vacuum chamber; f. means for evacuating the vacuum chamber; and g. switching means located between said negative pole and said electron-ion upon closing of which the voltage between the object and the electron-ion gun causes an electron-ion beam to impinge on the object where a layer characteristic of the component parts of the object material is formed.
Claim 2
Independent Claim
240 words
An apparatus for imparting contrast to the surface portion of an object to be investigated microscopically, the apparatus comprising: a. a non-grounded vacuum chamber (1); b. an object carrier (2) inside the vacuum chamber for disposing an object thereon, the carrier being connected to one wall of the chamber; c. a high voltage D.C. source (3) outside the vacuum chamber, the positive pole of the D.C. source being connected to the object carrier and to the ground; d. a combined electron-ion gun (5) of the gas discharging type mounted in the wall of the vacuum chamber opposite from the object carrier, the cathode of said combined electron-ion gun being connected to the negative pole of the D.C. source and being so adjusted that an electron-ion-beam derived from the gun impinges on an object, which is electrically conductive, positioned on the object carrier, and wherein the ion gun of the said combined electron-ion gun has a regulatable gas source connected thereto for bombarding said surface portion of an object with a gas concentrated electron ion-beam; e. means for supplying a reagent gas into the vacuum chamber; f. means for evacuating the vacuum chamber; and g. switching means located between said negative pole and said electron-ion upon closing of which the voltage between the object and the electron-ion gun causes an electron-ion beam to impinge on the object where a layer characteristic of the component parts of the object material is formed.
References Cited (Backward Citations)
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1978-01-06 | 1978-07-08 | 1979-01-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1982-01-06 | 1982-07-08 | 1983-01-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1986-01-06 | 1986-07-08 | 1987-01-07 | $7700.00 | Window Closed / Lapsed |