Patent US5353734A successfully refreshed from Google Patents.
Patent US3852594A successfully refreshed from Google Patents.
US3852594A
Expired / Lapsed
US
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X-ray diffraction apparatus
Assignee: Pepi Inc
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Filing: 1973-07-25
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Granted: 1974-12-03
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Expires: 1993-07-25
Abstract
Abstract An X-ray diffraction apparatus comprising means for rotating a specimen in the path of an X-ray beam and means for rotating a diffraction slit simultaneously with the specimen but at a lower angular velocity, so that the X-ray irradiated portion of the specimen remains substantially constant in size during such rotation.
Inventors
- 👤 F Paolini
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 10:39
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/20; G01N23/207
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
133 words
An X-ray diffraction apparatus comprising: a. a source of X-rays; b. means for holding an X-ray diffraction specimen in the path of said X-ray beam such that a portion of said specimen can be impinged by said beam; c. means for rotating said specimen at a first angular velocity from a first position to a second position; d. a diffraction slit disposed between said specimen and said source such that said X-rays pass through the opening of said slit; e. means for rotating said diffraction slit simultaneously with the specimen, said diffraction slit being so rotated at a second angular velocity lower than said first angular velocity; and f. means for measuring the intensity of X-rays reflected from said specimen, whereby said irradiated portion remains substantially constant throughout the rotation of said specimen.
Claim 2
Dependent Claim
133 words
An X-ray diffraction apparatus comprising: a. a source of X-rays; b. means for holding an X-ray diffraction specimen in the path of said X-ray beam such that a portion of said specimen can be impinged by said beam; c. means for rotating said specimen at a first angular velocity from a first position to a second position; d. a diffraction slit disposed between said specimen and said source such that said X-rays pass through the opening of said slit; e. means for rotating said diffraction slit simultaneously with the specimen, said diffraction slit being so rotated at a second angular velocity lower than said first angular velocity; and f. means for measuring the intensity of X-rays reflected from said specimen, whereby said irradiated portion remains substantially constant throughout the rotation of said specimen.
Claim 3
Dependent Claim
101 words
An X-ray diffraction apparatus as defined in claim 1, wherein at said first position said position is substantially perpendicular to an imaginary line extending from said X-ray source to the center of said portion and said second position said portion is substantially parallel to said imaginary lines and said diffraction slit is rotated between third and fourth positions, said diffraction on slit at said third position being substantially parallel to said specimen at said third position being substantially parallel to said specimen at said first position and at said fourth position being obliquely disposed to said specimen at said second position.
Claim 4
Dependent Claim
40 words
An X-ray diffraction appparatus as defined in claim 1, wherein said means for rotating said specimen comprises a first cog wheel and said means for rotating said diffraction slit comprises a second cog wheel driven by said first cog wheel.
Claim 5
Dependent Claim
27 words
An X-ray diffraction apparatus as defined in claim 3, wherein the gear ratio of said first cog wheel to said second gear wheel is less than one.
Claim 6
Dependent Claim
24 words
An X-ray diffraction apparatus as defined in claim 4, wherein said first gear wheel is mechanically linked to and drives said second gear wheel.
Claim 7
Dependent Claim
83 words
An X-ray diffraction apparatus as defined in claim 3, wherein the angular displacement theta '' of said second gear wheel is determinable from the expression: theta '' N/N'' theta + epsilon , where N and N'' are the teeth numbers for said first and second gear wheels, respectively; theta is the angular displacement of said first gear wheel; and epsilon is the angular orientation of said second gear wheel when said beam is cut off from said specimen located at said second position.
Claim 8
Independent Claim
150 words
A method of operating an X-ray diffraction apparatus comprising the steps of: a. providing an X-ray beam source; b. providing an X-ray diffraction specimen disposed at an angle of substantially zero degrees with respect to said X-ray beam; c. providing an X-ray diffraction slit between the source of said beam and said specimen, said diffraction slit being disposed at substantially the extinction angle thereof when said specimen is disposed at 0* with respect to said beam, said specimen being rotatable over a range of said angles of from zero to about 90* and said slit being rotatable at a lower angular velocity than said specimen and over an angular range extending from said extinction angle to about 90*; d. irradiating said specimen with said X-ray beam and simultaneously rotating said specimen and said slit over said ranges of angles; and e. measuring the intensity of X-rays reflected from said specimen.
Claim 9
Independent Claim
150 words
A method of operating an X-ray diffraction apparatus comprising the steps of: a. providing an X-ray beam source; b. providing an X-ray diffraction specimen disposed at an angle of substantially zero degrees with respect to said X-ray beam; c. providing an X-ray diffraction slit between the source of said beam and said specimen, said diffraction slit being disposed at substantially the extinction angle thereof when said specimen is disposed at 0* with respect to said beam, said specimen being rotatable over a range of said angles of from zero to about 90* and said slit being rotatable at a lower angular velocity than said specimen and over an angular range extending from said extinction angle to about 90*; d. irradiating said specimen with said X-ray beam and simultaneously rotating said specimen and said slit over said ranges of angles; and e. measuring the intensity of X-rays reflected from said specimen.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-12-02 | 1978-06-03 | 1978-12-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-12-02 | 1982-06-03 | 1982-12-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-12-02 | 1986-06-03 | 1986-12-03 | $7700.00 | Window Closed / Lapsed |