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US3829691A Expired / Lapsed US ⏱️ 0.0 years remaining

Image signal enhancement system for a scanning electron microscope

Assignee: Etec Systems Inc
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Filing: 1969-09-22
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Granted: 1974-08-13
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Expires: 1989-09-22
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Abstract

Abstract The invention pertains to a method and apparatus for reducing the effect of aberrations in an optical or electron-optical system. This is done by varying the focal point over a range and altering the reproduced images to produce a composite image substantially free of the said aberrations.

Inventors

  • 👤 R Hufnagel

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 19:46
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/26; H01J37/28

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 107 words
In a scanning electron microscope having a source of electrons, means for focusing the electrons at a sample object, means for scanning the electrons in mutually perpendicular directions across said object, and means for providing an electrical output signal representative of the object, means to reproduce an image of said object, said microscope exhibiting a symmetrical aberration, the improvement for increasing the conformity between a reproduced image and the object comprising means for varying the location of the focal point during a scanning interval at each of a plurality of information element locations and means for altering the output signal in accordance with a predetermined electrical signal.
Claim 2
Dependent Claim 107 words
In a scanning electron microscope having a source of electrons, means for focusing the electrons at a sample object, means for scanning the electrons in mutually perpendicular directions across said object, and means for providing an electrical output signal representative of the object, means to reproduce an image of said object, said microscope exhibiting a symmetrical aberration, the improvement for increasing the conformity between a reproduced image and the object comprising means for varying the location of the focal point during a scanning interval at each of a plurality of information element locations and means for altering the output signal in accordance with a predetermined electrical signal.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1977-08-12 1978-02-11 1978-08-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1981-08-12 1982-02-11 1982-08-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1985-08-12 1986-02-11 1986-08-13 $7700.00 Window Closed / Lapsed

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