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US3828283A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for improving semiconductor surface wave transducer efficiency

Assignee: Westinghouse Electric Corp
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Filing: 1973-07-24
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Granted: 1974-08-06
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Expires: 1993-07-24
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Abstract

Abstract An improved semiconductor surface wave transducer and method for improving the efficiency of a surface wave transducer comprising a semiconductor substrate upon which is deposited a thin piezoelectric film which has deposited or fabricated thereon at least one interdigital electrode grid. The method comprises increasing the carrier concentration of the semiconductor substrate to provide at least a plane of electrical conductivity underlying the piezoelectric film and electrode grid having a resistivity of less than 1.0 ohms-cm at 20*C.

Inventors

  • 👤 M Daniel

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 15:41
CPC Classifications
H; H03; H03H; H03H9/00; H03H9/02; H03H9/02535; H03H9/02543; H03H9/02566

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 64 words
A method for increasing the efficiency of a surface wave transducer having a semiconductor substrate including thereon at least one thin piezoelectric film and at least one electrode grid deposited on said film, said method comprising: increasing the carrier concentration of the semiconductor substrate to provide at least a plane of conductivity underlying the piezoelectric film having a resistivity of less than 1.0 ohm-cm.
Claim 2
Independent Claim 64 words
A method for increasing the efficiency of a surface wave transducer having a semiconductor substrate including thereon at least one thin piezoelectric film and at least one electrode grid deposited on said film, said method comprising: increasing the carrier concentration of the semiconductor substrate to provide at least a plane of conductivity underlying the piezoelectric film having a resistivity of less than 1.0 ohm-cm.
Claim 3
Dependent Claim 20 words
A method as set forth in claim 1 wherein said carrier concentration is increased in a plane underlying said film.
Claim 4
Dependent Claim 32 words
A method as set forth in claim 1 wherein said carrier concentration is increased in a plane underlying said film and having a configuration conforming to the configuration of the electrode grid.
Claim 5
Dependent Claim 18 words
A method as set forth in claim 1 wherein said resistivity is from about 0.05 to 0.001 ohm-cm.
Claim 6
Dependent Claim 17 words
A method as set forth in claim 1 including the step of grounding said plane of conductivity.
Claim 7
Dependent Claim 60 words
In a surface wave transducer device having a semiconductor substrate including thereon at least one thin piezoelectric film and at least one electrode grid deposited on said film, the improvement comprising: said semiconductor substrate having an increased carrier concentration sufficient to provide at least a plane of conductivity underlying said piezoelectric film having a resistivity of less than 1.0 ohm-cm.
Claim 8
Dependent Claim 60 words
In a surface wave transducer device having a semiconductor substrate including thereon at least one thin piezoelectric film and at least one electrode grid deposited on said film, the improvement comprising: said semiconductor substrate having an increased carrier concentration sufficient to provide at least a plane of conductivity underlying said piezoelectric film having a resistivity of less than 1.0 ohm-cm.
Claim 9
Dependent Claim 18 words
An improvement as set forth in Claim 6 wherein said resistivity is between about 0.05 and 0.001 ohm-cm.
Claim 10
Dependent Claim 34 words
An improvement as set forth in claim 6 wherein said carrier concentration is between 1018 and 5(10)20 cm 3 for a p-type carrier and from 1017 to 5(10)20 cm 3 for an n-type carrier.
Claim 11
Dependent Claim 24 words
An improvement as set forth in claim 6 wherein said plane of conductivity has a configuration conforming to the configuration of said electrode grid.
Claim 12
Dependent Claim 15 words
An improvement as set forth in claim 6 wherein said plane of conductivity is grounded.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1977-08-05 1978-02-04 1978-08-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1981-08-05 1982-02-04 1982-08-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1985-08-05 1986-02-04 1986-08-06 $7700.00 Window Closed / Lapsed

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