US3827073A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Gated bilateral switching semiconductor device
Assignee: Texas Instruments Inc
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Filing: 1971-09-07
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Granted: 1974-07-30
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Expires: 1991-09-07
Abstract
Abstract There is disclosed herein a self-triggering switching device which may be either symmetrical or non-symmetrical. The device comprises a plurality of interleaved layers of semiconductor materials of opposite conductivity types forming a plurality of p-n junctions. Two main current-carrying electrodes are affixed to the external layers and a trigger electrode including a layer of active glass is affixed to one of the intermediate layers providing controlled ''''turn-on'''' of the device.
Inventors
- 👤 J Mize
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 22:57
CPC Classifications
H; H10; H10D; H10D99/00; H10D64/00; H10D64/20; H10D64/27
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
277 words
A gated bilateral switching semiconductor device comprising in combination: a. a main body of single crystal semiconductor material having first, second and third layers of alternating conductivity types forming first and second p-n junctions between said first and second layers and between said second and third layers, respectively; said first and third layers each having therein a region of a conductivity type opposite that of the main portion of said first and third layers and forming third and fourth p-n junctions, said regions being in non-overlapping relationship to each other; and a second region of conductivity type opposite that of said third layer within said third layer remote from said first region therein providing a fifth p-n junction; b. a first main electrode overlying and secured to said first layer including said first region therein; c. a second main electrode having an opening therein such that said electrode is overlying and secured to said third layer including said first region but not said second region therein; d. a layer of active glass overlying and secured to said second region and spaced from said second main electrode, said active glass layer exhibiting high impedance characteristics when a voltage below a predetermined threshold is applied thereacross and low impedance characteristics when a voltage above said predetermined threshold is applied thereacross; and e. gate electrode means overlying and secured to said active glass layer for applying gating signals to said device; whereby said device exhibits high or low impedance characteristics between said main electrodes in dependence upon a gating signal applied to said gate electrodes producing a voltage across said active glass layer below or above said predetermined threshold voltage.
Claim 2
Dependent Claim
277 words
A gated bilateral switching semiconductor device comprising in combination: a. a main body of single crystal semiconductor material having first, second and third layers of alternating conductivity types forming first and second p-n junctions between said first and second layers and between said second and third layers, respectively; said first and third layers each having therein a region of a conductivity type opposite that of the main portion of said first and third layers and forming third and fourth p-n junctions, said regions being in non-overlapping relationship to each other; and a second region of conductivity type opposite that of said third layer within said third layer remote from said first region therein providing a fifth p-n junction; b. a first main electrode overlying and secured to said first layer including said first region therein; c. a second main electrode having an opening therein such that said electrode is overlying and secured to said third layer including said first region but not said second region therein; d. a layer of active glass overlying and secured to said second region and spaced from said second main electrode, said active glass layer exhibiting high impedance characteristics when a voltage below a predetermined threshold is applied thereacross and low impedance characteristics when a voltage above said predetermined threshold is applied thereacross; and e. gate electrode means overlying and secured to said active glass layer for applying gating signals to said device; whereby said device exhibits high or low impedance characteristics between said main electrodes in dependence upon a gating signal applied to said gate electrodes producing a voltage across said active glass layer below or above said predetermined threshold voltage.
Claim 3
Dependent Claim
21 words
The gated semiconductor device of claim 1 wherein said one conductivity type if N-type and said opposite conductivity type is P-type.
Claim 4
Dependent Claim
46 words
The gated semiconductor device of claim 1 wherein said active glass layer is a composition of tellurium, arsenic, germanium and silicon of preselected portions to achieve said high and low impedance characteristics when voltages below and above said predetermined value threshold voltage are respectively applied thereacross.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-07-29 | 1978-01-28 | 1978-07-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-07-29 | 1982-01-28 | 1982-07-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-07-29 | 1986-01-28 | 1986-07-30 | $7700.00 | Window Closed / Lapsed |