Patent US3825828A successfully refreshed from Google Patents.
US3825828A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Device for testing semiconductors and other electrical components
Assignee: Individual
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Filing: 1972-12-21
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Granted: 1974-07-23
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Expires: 1992-12-21
Abstract
Abstract A device for testing the dynamic operation of semiconductor and other electrical components which may exhibit amplifier characteristics, having circuitry adapted to form an electronic oscillator in association with such a component, an amplifier stage coupled to the circuitry, and an indicator lamp connected to the amplifier stage to detect the presence of oscillations in the circuitry. An additional feature includes a second indicator lamp connected to the circuitry to detect current flow through various electrodes of the component under test to indicate its d.c. electrical continuity. The polarity of a d.c. potential applicable to the component being tested is reversible to permit testing of the dynamic properties of both PNP and NPN type semiconductors as well as for testing the rectifier properties of transistor junctions, diodes, thyristors and other electrical components. The device also features means for testing its own operation including a transistor which may be switched into the circuitry of the oscillator stage in place of the component to be tested. Collector feedback bias is utilized in the operation of the oscillator stage to minimize thermal instability thereof and to permit operation of the stage at radio frequencies.
Inventors
- 👤 J Pfeiffer
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 20:10
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2607; G01R31/2608
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
96 words
A device for testing a semiconductor of the type which may exhibit amplifier characteristics comprising circuit means adapted for operative association with said semiconductor to produce feedback induced oscillations, amplifying means coupled to said circuit means and responsive to said oscillations, detecting means responsively connected to said amplifying means for indicating the presence of said oscillations in said circuit means, a second semiconductor capable of exhibiting amplifier characteristics, and switching means for selectively applying said second semiconductor to said circuit means in place of said semiconductor to be tested, to test whether said device is operative.
Claim 2
Independent Claim
96 words
A device for testing a semiconductor of the type which may exhibit amplifier characteristics comprising circuit means adapted for operative association with said semiconductor to produce feedback induced oscillations, amplifying means coupled to said circuit means and responsive to said oscillations, detecting means responsively connected to said amplifying means for indicating the presence of said oscillations in said circuit means, a second semiconductor capable of exhibiting amplifier characteristics, and switching means for selectively applying said second semiconductor to said circuit means in place of said semiconductor to be tested, to test whether said device is operative.
Claim 3
Dependent Claim
24 words
The device of claim 1 further comprising second switching means for selectively reversing the polarity of a d.c. potential applicable to said circuit means.
Claim 4
Dependent Claim
19 words
The device of claim 1 further comprising a source of d.c. potential applicable to said circuit and amplifying means.
Claim 5
Dependent Claim
17 words
The device of claim 1 further comprising means for inductively coupling said oscillation to said amplifying means.
Claim 6
Dependent Claim
35 words
The device of claim 1 further comprising second detecting means responsively connected to said circuit means for indicating the presence of current flowing through said semiconductor, whereby the continuity of electrical components may be tested.
Claim 7
Dependent Claim
23 words
The device of claim 1 wherein said circuit means forms an oscillator stage of the Hartley type when operatively associated with said semiconductor.
Claim 8
Dependent Claim
12 words
The device of claim 1 wherein said detecting means comprises a lamp.
Claim 9
Dependent Claim
35 words
The device of claim 1 further comprising a second lamp responsively connected to said circuit means for indicating the presence of current flow through said semiconductor, whereby the continuity of electrical components may be tested.
Claim 10
Dependent Claim
18 words
The device of claim 1 wherein said circuit means is adapted to produce said oscillations at radio frequencies.
Claim 11
Dependent Claim
22 words
The device of claim 1 further comprising means for selectively applying a source of d.c. potential to said circuit and amplifying means.
Claim 12
Independent Claim
278 words
A device for testing the amplification properties of a transistor and other semiconductors and for testing the d.c. electrical continuity and rectifier characteristics of electrical components comprising circuit means adapted for operative association with said transistor to produce feedback induced radio frequency oscillations, an amplifier stage responsively coupled to said circuit means, an interstage transformer having a primary winding connectable in receiving relationship to the collector and emitter electrodes of said transistor and a secondary winding operatively connected to said amplifier stage, a self-test transistor, first switching means for selectively applying said self-test transistor to said circuit means in place of said transistor, a source of d.c. potential to power said transistor, self-test transistor and amplifier stage, an on/off switch for selectively applying said source to said circuit means, and amplifier stage, a first lamp connected in receiving relation to said amplifier stage to detect oscillations in said cirCuit means, a second lamp connected to said circuit means in receiving relationship to said emitter electrode for indicating current flow therethrough, means for reversing the polarity of said source applicable to said transistor, a variable resistance connectable between the collector and base electrode of said transistor for providing d.c. bias thereto, a d.c. blocking capacitor connectable between said base electrode and said primary winding for inhibiting the flow of d.c. current to and from said base electrode through the a.c. signal feedback path of said circuit means, and an a.c. blocking capacitor connected between said secondary winding and amplifier stage to inhibit relatively low frequency self oscillation between said circuit means and amplifier stage and to pass said feedback induced oscillations from said circuit means to said amplifier stage.
Claim 13
Independent Claim
278 words
A device for testing the amplification properties of a transistor and other semiconductors and for testing the d.c. electrical continuity and rectifier characteristics of electrical components comprising circuit means adapted for operative association with said transistor to produce feedback induced radio frequency oscillations, an amplifier stage responsively coupled to said circuit means, an interstage transformer having a primary winding connectable in receiving relationship to the collector and emitter electrodes of said transistor and a secondary winding operatively connected to said amplifier stage, a self-test transistor, first switching means for selectively applying said self-test transistor to said circuit means in place of said transistor, a source of d.c. potential to power said transistor, self-test transistor and amplifier stage, an on/off switch for selectively applying said source to said circuit means, and amplifier stage, a first lamp connected in receiving relation to said amplifier stage to detect oscillations in said cirCuit means, a second lamp connected to said circuit means in receiving relationship to said emitter electrode for indicating current flow therethrough, means for reversing the polarity of said source applicable to said transistor, a variable resistance connectable between the collector and base electrode of said transistor for providing d.c. bias thereto, a d.c. blocking capacitor connectable between said base electrode and said primary winding for inhibiting the flow of d.c. current to and from said base electrode through the a.c. signal feedback path of said circuit means, and an a.c. blocking capacitor connected between said secondary winding and amplifier stage to inhibit relatively low frequency self oscillation between said circuit means and amplifier stage and to pass said feedback induced oscillations from said circuit means to said amplifier stage.
References Cited (Backward Citations)
US2894206A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-07-22 | 1978-01-21 | 1978-07-23 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-07-22 | 1982-01-21 | 1982-07-23 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-07-22 | 1986-01-21 | 1986-07-23 | $7700.00 | Window Closed / Lapsed |