Reflectometer for on-line analysis of granular powders

Claim 5

A method according to claim 2 whereby said relating the standardized signals includes detecting the difference between the standardized signals at the first and second wavelength regions to provide a second indicator signal.

Claim 6

A method according to claim 3 including averaging the standardized signals at the first, second and third wavelength regions to provide a third indicator signal.

Claim 7

Apparatus for determining the optical properties of a granular crystalline powder sample by measuring the reflectance of said granular crystalline powdEr sample in a solid state relative to the reflectance of a reference whereby the effect of the powder particle size on such determination is minimized comprising: optical assembly means for deriving electrical signals indicative of sample and reference specimen reflectance at first and second wavelength regions which are respectively sensitive and insensitive to a change in the sample optical properties to be determined; means for effecting a ratio comparison of the sample signal to the reference signal at each of the wavelengths to provide distinct standardized signals; and logic means for generating an output indicator signal comprising the difference in standardized signals at first and second wavelength regions which is representative of the sample optical properties unaffected by particle size.

Claim 8

Apparatus for determining the optical properties of a granular crystalline powder sample by measuring the reflectance of said granular crystalline powdEr sample in a solid state relative to the reflectance of a reference whereby the effect of the powder particle size on such determination is minimized comprising: optical assembly means for deriving electrical signals indicative of sample and reference specimen reflectance at first and second wavelength regions which are respectively sensitive and insensitive to a change in the sample optical properties to be determined; means for effecting a ratio comparison of the sample signal to the reference signal at each of the wavelengths to provide distinct standardized signals; and logic means for generating an output indicator signal comprising the difference in standardized signals at first and second wavelength regions which is representative of the sample optical properties unaffected by particle size.

Claim 9

Apparatus for determining the optical properties of a granular crystalline powder sample by measuring the reflectance of said granular crystalline powder sample in a solid state relative to the reflectance of a reference whereby the effect of the powder particle size on such determination is minimized comprising: optical assembly means for deriving electrical signals indicative of sample and reference specimen reflectance at first, second and third wavelength regions the first and third sensitive to and the second insensitive to a change in the sample optical properties to be determined; means for effecting a ratio comparison of the sample signal to the reference signal at each of the wavelengths to provide distinct standardized signals; and, logic means which comprises means for generating a first output indicator signal comprising the difference in standardized signals at first and second wavelength regions which is representative of the sample''s optical properties unaffected by particle size, means for averaging the standardized signals at the first and third wavelength regions, means for generating a second output indicator signal which comprises the difference between the standardized signal at the second wavelength region and said averaged standardized signals which are also representative of the sample''s optical properties unaffected by particle size.

Claim 10

Apparatus for determining the optical properties of a granular crystalline powder sample by measuring the reflectance of said granular crystalline powder sample in a solid state relative to the reflectance of a reference whereby the effect of the powder particle size on such determination is minimized comprising: optical assembly means for deriving electrical signals indicative of sample and reference specimen reflectance at first, second and third wavelength regions the first and third sensitive to and the second insensitive to a change in the sample optical properties to be determined; means for effecting a ratio comparison of the sample signal to the reference signal at each of the wavelengths to provide distinct standardized signals; and, logic means which comprises means for generating a first output indicator signal comprising the difference in standardized signals at first and second wavelength regions which is representative of the sample''s optical properties unaffected by particle size, means for averaging the standardized signals at the first and third wavelength regions, means for generating a second output indicator signal which comprises the difference between the standardized signal at the second wavelength region and said averaged standardized signals which are also representative of the sample''s optical properties unaffected by particle size.

Claim 11

Apparatus according to claim 6 whereby said logic means further includes means for averaging the standardized signals at the first, second and third wavelength regions to provide a third indicator signal representative of the sample optical properties.