Probe inspection system

Claim 2

Locating means comprising: an assembly comprising a mounting element, an intermediate coupling member and a probe, means supporting said mounting element for movement in a predetermined direction, said intermediate coupling member being slidably mounted by a first slidable mounting on said mounting element to extend beyond said mounting element in said predetermined direction, said first slidable mounting of said intermediate coupling member on said mounting member being designed to allow relative sliding between said intermediate coupling member and said mounting element in a first transverse direction substantially perpendicular to said predetermined direction, said probe being slIdably mounted by a second slidable mounting on said intermediate coupling member to extend beyond said intermediate coupling member in said predetermined direction, said second slidable mounting of said probe on said intermediate coupling member being designed to allow relative sliding between said intermediate coupling member and said probe in a second transverse direction substantially perpendicular to said predetermined direction and making a substantial angle with said first transverse direction, said probe being provided with sides tapering in said predetermined direction, said first and said second slidable mountings being so designed that, during movement of said assembly in said predetermined direction, forces exerted on said tapering sides cause movement of said probe in relation to said mounting element due to such sliding movement at said first and second sliding mountings, a first transducer comprising a member mounted on said mounting member to move therewith and a cooperating member mounted on said intermediate coupling member to move therewith designed to provide a signal indicative of the relative positions of said mounting member and said intermediate coupling member, a second transducer comprising a member mounted on said intermediate coupling member to move therewith and a cooperating member mounted on said probe to move therewith designed to provide a signal indicative of the relative positions of said intermediate coupling member and said probe.

Claim 3

Locating means as claimed in claim 1, wherein first biasing means are provided to bias said intermediate coupling members to a position intermediate the limits of movement allowed by said first slidable mounting, said first biasing means being designed to exert such bias in a direction sub-stantially parallel to said first transverse direction; and wherein second biasing means are provided to bias said probe to a position intermediate the limits of movement allowed by said second slidable mounting, said second biasing means being designed to exert such bias in a direction substantially parallel to said second transverse direction.

Claim 4

Locating means as claimed in claim 2 wherein said first and second slidable mountings are arranged so that said first and second transverse directions are substantially perpendicular.

Claim 5

Means for surveying the location of a plurality of apertures in a workpiece, said means including a plurality of locating means, each comprising: an assembly comprising a mounting element, an intermediate coupling member and a probe, means supporting said mounting element for movement in a predetermined direction, said intermediate coupling member being slidably mounted by a first slidable mounting on said mounting element to extend beyond said mounting element in said predetermined direction, said first slidable mounting of said intermediate coupling member on said mounting member being designed to allow relative sliding between said intermediate coupling member and said mounting element in a first transverse direction substantially perpendicular to said predetermined direction, said probe being slidably mounted by a second slidable mounting on said intermediate coupling member to extend beyond said intermediate coupling member in said predetermined direction, said second slidable mounting of said probe on said intermediate coupling member being designed to allow relative sliding between said intermediate coupling member and said probe in a second transverse direction substantially perpendicular to said predetermined direction and making a substantial angle with said first transverse direction, said probe being provided with sides tapering in said predetermined direction, said first and said second slidable mountings being so designed that, during movement of said assembly in said predetermined direction, forces exerted on said tapering sides cause movement of said probe in relation to said mounting element due to such sliDing movement at said first and second sliding mountings, a first transducer comprising a member mounted on said mounting member to move therewith and a cooperating member mounted on said intermediate coupling member to move therewith designed to provide a signal indicative of the relative positions of said mounting member and said intermediate coupling member, a second transducer comprising a member mounted on said intermediate coupling member to move therewith and a cooperating member mounted on said probe to move therewith designed to provide a signal indicative of the relative positions of said intermediate coupling member and said probe, and including a body fixed to each said means supporting each said mounting element to maintain said plurality of locating means in fixed spaced relation to one another.

Claim 6

Means for surveying the location of a plurality of apertures in a workpiece, said means including a plurality of locating means, each comprising: an assembly comprising a mounting element, an intermediate coupling member and a probe, means supporting said mounting element for movement in a predetermined direction, said intermediate coupling member being slidably mounted by a first slidable mounting on said mounting element to extend beyond said mounting element in said predetermined direction, said first slidable mounting of said intermediate coupling member on said mounting member being designed to allow relative sliding between said intermediate coupling member and said mounting element in a first transverse direction substantially perpendicular to said predetermined direction, said probe being slidably mounted by a second slidable mounting on said intermediate coupling member to extend beyond said intermediate coupling member in said predetermined direction, said second slidable mounting of said probe on said intermediate coupling member being designed to allow relative sliding between said intermediate coupling member and said probe in a second transverse direction substantially perpendicular to said predetermined direction and making a substantial angle with said first transverse direction, said probe being provided with sides tapering in said predetermined direction, said first and said second slidable mountings being so designed that, during movement of said assembly in said predetermined direction, forces exerted on said tapering sides cause movement of said probe in relation to said mounting element due to such sliDing movement at said first and second sliding mountings, a first transducer comprising a member mounted on said mounting member to move therewith and a cooperating member mounted on said intermediate coupling member to move therewith designed to provide a signal indicative of the relative positions of said mounting member and said intermediate coupling member, a second transducer comprising a member mounted on said intermediate coupling member to move therewith and a cooperating member mounted on said probe to move therewith designed to provide a signal indicative of the relative positions of said intermediate coupling member and said probe, and including a body fixed to each said means supporting each said mounting element to maintain said plurality of locating means in fixed spaced relation to one another.

Claim 7

Means as claimed in claim 4 wherein first biasing means are provided on each assembly to bias the intermediate coupling member thereon to a position intermediate the limits of movement allowed by said first slidable mounting, said first biasing means being designed to exert such bias in a direction substantially parallel to the first transverse direction for said assembly; and wherein second biasing means are provided on each assembly to bias the probe on said assembly to a position intermediate the limits of movement allowed by the corresponding second slidable mounting, said second biasing means being designed to exert such bias in a direction substantially parallel to said second transverse direction.

Claim 8

Means as claimed in claim 5 wherein said first and second slidable mountings, in each assembly, are arranged so that said first and second transverse directions are substantially perpendicular.