Patent US3796642A successfully refreshed from Google Patents.
US3796642A
Expired / Lapsed
US
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Method and device for measuring the activity of nickel ions
Assignee: Panasonic Holdings Corp
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Filing: 1972-02-28
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Granted: 1974-03-12
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Expires: 1992-02-28
Abstract
Abstract A DEVICE FOR MEASURING AN ACTIVITY OF NICKEL IONS COMPRISES A SELECTIVE ELECTRODE AND A REFERENCE ELECTRODE IMMERSED IN A SOLUTION CONTAINING NICKEL IONS, SAID SELECTIVE ELECTRODE INCLUDING A DISC IN A BATCH COMPOSITION WHICH COMPRISES A COMBINATION OF NICKEL CHALCOGENIDE AND AT LEAST ONE MEMBER SELECTED FROM THE GROUP CONSISTING OF SILVER TELLURIDE AND SILVER SELENIDE OR A COMBINATION OF SILVER SULFIDE AND AT LEAST ONE MEMBER SELECTED FROM THE GROUP COONSISTING OF NICKEL TELLURIDE AND NICKEL SELENIDE.
Inventors
- 👤 K Higashiyama
- 👤 H Hirata
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 05:37
CPC Classifications
B; B01; B01D; B01D53/00; B01D53/34; B01D53/46; B01D53/68; G; G01; G01N; G01N27/00; G01N27/26; G01N27/28; G01N27/30; G01N27/333
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-03-11 | 1977-09-10 | 1978-03-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-03-11 | 1981-09-10 | 1982-03-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-03-11 | 1985-09-10 | 1986-03-12 | $7700.00 | Window Closed / Lapsed |