Patent US3792269A successfully refreshed from Google Patents.
US3792269A
Expired / Lapsed
US
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Slit screen for x-ray apparatus used in determining crystal topography
Assignee: Siemens AG
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Filing: 1970-11-25
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Granted: 1974-02-12
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Expires: 1990-11-25
Abstract
Abstract In an X-ray apparatus for examining crystal planes with the method of X-ray topography, in the path of the primary X-ray beam there is disposed a slit screen, the slit of which has a curved shape.
Inventors
- 👤 H Grienauer
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 08:05
CPC Classifications
G; G21; G21K; G21K1/00; G21K1/02; G21K1/04
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
149 words
In an X-ray apparatus for performing examination of a crystal sample according to the method of X-ray topography, said apparatus is of the type that includes an X-ray tube having a point focus, a planar slit screen disposed in the path of the Xray beam between said focus and said crystal sample at an angle normal to the central ray of said beam and means responsive to Xrays diffracted by said crystal sample, the improvement in said slit screen comprising a slit having the shape of a conic section determined by the equation y2(1-tan2 omega ) - 2 R''y tan omega x2tan2 omega 0 wherein x and y are mutually perpendicular axes of a coordinate system coplanar with the slit screen, R'' is the distance between the focus and the slit screen and omega is the angle of incidence of the X-rays on the crystal plane to be examined.
Claim 2
Dependent Claim
149 words
In an X-ray apparatus for performing examination of a crystal sample according to the method of X-ray topography, said apparatus is of the type that includes an X-ray tube having a point focus, a planar slit screen disposed in the path of the Xray beam between said focus and said crystal sample at an angle normal to the central ray of said beam and means responsive to Xrays diffracted by said crystal sample, the improvement in said slit screen comprising a slit having the shape of a conic section determined by the equation y2(1-tan2 omega ) - 2 R''y tan omega x2tan2 omega 0 wherein x and y are mutually perpendicular axes of a coordinate system coplanar with the slit screen, R'' is the distance between the focus and the slit screen and omega is the angle of incidence of the X-rays on the crystal plane to be examined.
Claim 3
Dependent Claim
63 words
An improvement as defined in claim 1, wherein said conic section is a circular arc and is determined by the equation r'' R'' / tan omega wherein r'' IS the radius of said circular arc, R'' is the distance between the focus and the slit screen and omega is the angle of incidence of the X-rays on the crystal plane to be examined.
Claim 4
Dependent Claim
130 words
In an X-ray apparatus for performing examination of a crystal sample according to the method of X-ray topography, said apparatus is of the type that includes an X-ray tube having a point focus, a planar slit screen disposed in the path of the X-ray beam between said focus and said crystal sample parallel to the layers of said crystal and means responsive to X-rays diffracted by said crystal sample, the improvement in said slit screen comprising a slit having the shape of a circular arc determining by the equation r R'' cos omega wherein r is the radius of said circular arc, R'' is the distance between the focus and the slit screen and omega is the angle of incidence of the X-rays on the crystal plane to be examined.
Claim 5
Dependent Claim
130 words
In an X-ray apparatus for performing examination of a crystal sample according to the method of X-ray topography, said apparatus is of the type that includes an X-ray tube having a point focus, a planar slit screen disposed in the path of the X-ray beam between said focus and said crystal sample parallel to the layers of said crystal and means responsive to X-rays diffracted by said crystal sample, the improvement in said slit screen comprising a slit having the shape of a circular arc determining by the equation r R'' cos omega wherein r is the radius of said circular arc, R'' is the distance between the focus and the slit screen and omega is the angle of incidence of the X-rays on the crystal plane to be examined.
References Cited (Backward Citations)
US2497543A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-02-11 | 1977-08-13 | 1978-02-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-02-11 | 1981-08-13 | 1982-02-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-02-11 | 1985-08-13 | 1986-02-12 | $7700.00 | Window Closed / Lapsed |