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US3773566A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for fabricating semiconductor device having semiconductor circuit element in isolated semiconductor region

Assignee: Hitachi Ltd
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Filing: 1971-02-09
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Granted: 1973-11-20
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Expires: 1991-02-09
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Abstract

Abstract A semiconductor integrated circuit device is fabricated in an epitaxial layer of an n-type Si on a substrate of p-type Si by forming semiconductor circuit elements within one surface of the epitaxial layer, forming a mask layer on the surface of the epitaxial layer, forming grooves through the mask layer, which surround each semiconductor circuit element, so as to expose the surface of the epitaxial layer, diffusing boron into the surface of the exposed portions of the epitaxial layer through the grooves, maintaining the substrate at a temperature of 700* C, and directing 1016 argon ions per square centimeter having an energy of 50 KeV toward the surface, whereby p-type regions are extended quickly from the surface of the epitaxial layer to that of the substrate to isolate the semiconductor circuit elements from each other.

Inventors

  • 👤 T Tsuchimoto

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 21:27
CPC Classifications
H; H10; H10P; H10P30/00; H10P30/20; H10P30/202; H10P30/204; H10P30/208; H10W; H10W10/00; H10W10/01; H10W10/031; H10W10/30; Y; Y10; Y10S; Y10S148/00; Y10S148/043; Y10S148/085; Y10S148/106; Y10S438/00; Y10S438/914; Y10S438/918; Y10S438/919

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 47 words
A method for fabricating a semiconductor device according to claim 1, wherein the masking layer is selected from the group consisting of SiO2 Si3N4 Al2O3, laminated films of SiO2 and Si3N4, of SiO2 and Al2O3, and of Si3N4 and Al2O3, Ta, Al, Cr, Mo, Au and Ni.
Claim 2
Dependent Claim 44 words
A method for fabricating a semiconductor device according to claim 1, wherein said element used in the steps of ion implantation is selected from the group consisting of H, He, Ne, Ar, Kr, Xe, B, Al, N, P, As, Sb, Si, Ge and C.
Claim 3
Dependent Claim 33 words
A method for fabricating a semiconductor device according to claim 1, wherein said element used in the steps of ion implantation is selected from the group consisting of H, Ar, B and P.
Claim 4
Dependent Claim 11 words
A semiconductor substantially made according to the method of claim 1.
Claim 5
Independent Claim 123 words
A method for fabricating a semiconductor device, comprising the steps of: forming a thin layer of semiconductor on a semiconductor substrate in an electrically insulated relation thereto; forming a semiconductor circuit element within the thin layer; selectively masking a surface of said layer; selectively doping one surface portion so as to surround the semiconductor circuit element with an impurity which reverses the conductivity type of the thin layer; and irradiating said one surface portion with ions of a predetermined element, which produce a reversal of conductivity in said layer, at a temperature sufficiently high to produce diffusion at the desired speed in said layer at each irradiated surface portion, said temperature being in the range of about 600* C to about 800* C.
Claim 6
Independent Claim 96 words
A method for fabricating a semiconductor device, comprising the steps of: forming a thin layer of a semiconductor on a semiconductor substrate in an electrically insulated relation thereto; forming a semiconductor circuit element within the thin layer; selectively doping one surface portion so as to surround the semiconductor circuit element with an impurity; and irradiating at least said one surface portion with ions of a predetermined element, which produce a reversal of conductivity in said layer, at a temperature sufficiently high to produce diffusion at the desired speed in said layer at each irradiated surface portion.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1976-11-19 1977-05-21 1977-11-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1980-11-19 1981-05-21 1981-11-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1984-11-19 1985-05-21 1985-11-20 $7700.00 Window Closed / Lapsed

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