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US3766427A Expired / Lapsed US ⏱️ 0.0 years remaining

Field emission electron gun

Assignee: American Optical Corp
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Filing: 1972-02-07
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Granted: 1973-10-16
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Expires: 1992-02-07
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Abstract

Abstract A field emission electron gun comprises a field emission tip as its source of electrons. A first anode is spaced downstream from the tip and when a voltage is applied between the first anode and the tip, electrons from the tip are accelerated toward the first anode. An opening in the first anode limits the angular spread of the electron beam. A second anode is spaced downstream from the first anode and when a voltage is applied between the second anode and the tip, the energy level of the electrons at the image or specimen plane is controlled. The electrostatic field between the first and the second anode brings the electron beam into focus. For protecting the field emission tip against high voltage discharges, a third electrode in the form of a shield surrounds the field emission tip and is maintained at or near the electrical potential of the tip. Within the shield is a fourth electrode which serves, when voltage is applied thereto, to draw electrons from the tip and to restore or maintain normal operating conditions for the field emission electron gun. An iongetter vacuum pump and a reactive sublimator vacuum pump are formed in the electron gun by evaporating a highly reactive element or getter material on the inner walls of the third electrode, which serves as a collector by inducing gas molecules which strike this surface to adhere thereto and to be imbedded therein. The inner walls of the third electrode react with reactive gasses present in the region of the tip and the fourth electrode. The ion getter pump operates by ionizing residual gas molecules which are then impelled by electric fields and are imbedded under the coating of sublimed getter material. The primary electron beam from the tip strikes the surface of the fourth electrode, thereby causing reflected and secondary electrons to be emitted from the surface, which electrons form an electron cloud capable of ionizing molecules within the chamber. The electron cloud is formed and the ionized gas molecules are collected by applying the appropriate potentials to the electrodes in the gun assembly. The third electrode may be cooled by a liquid nitrogen cooling system, which functions as a cryogenic vacuum pump. This cooling system can also be used to cool the tip in order to reduce the tip flicker noise resulting in greater stability of electron emission.

Inventors

  • 👤 V Coates
  • 👤 L Welter

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 21:57
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/04; H01J37/06; H01J37/073; H01J3/00; H01J3/02; H01J3/021; H01J37/18; H01J37/248; H01J37/26; H01J37/29; H01J37/292

Claims Analysis

Total Claims: 10
Claim 1
Independent Claim 127 words
A field emission gun comprising: a housing defining a vacuum chamber; a field emission tip disposed in said vacuum chamber for providing a source of charged particles; a first electrode disposed in said chamber and spaced downstream of said field emission tip; a second electrode farther downstream of said field emission tip, said first electrode and said second electrode establishing focus and acceleration fields for forming a beam of said charged particles; an intermediate electrode located mediate of said field emission tip and said first electrode for developing an electric field to generate said charged particles; and voltage means connected to said first and second electrodes, said field emission tip, and said intermediate electrode for supplying electrical potential to establish said focus, acceleration and particle generation fields.
Claim 2
Dependent Claim 127 words
A field emission gun comprising: a housing defining a vacuum chamber; a field emission tip disposed in said vacuum chamber for providing a source of charged particles; a first electrode disposed in said chamber and spaced downstream of said field emission tip; a second electrode farther downstream of said field emission tip, said first electrode and said second electrode establishing focus and acceleration fields for forming a beam of said charged particles; an intermediate electrode located mediate of said field emission tip and said first electrode for developing an electric field to generate said charged particles; and voltage means connected to said first and second electrodes, said field emission tip, and said intermediate electrode for supplying electrical potential to establish said focus, acceleration and particle generation fields.
Claim 3
Dependent Claim 32 words
The field emission gun of claim 1 wherein said charged particles are electrons, and said potentials of said first, second and intermediate electrodes are positive with respect to said field emission tip.
Claim 4
Dependent Claim 53 words
The field emission gun of claim 1 wherein a shield electrode disposed in said vacuum chamber defines a region in which said field emission tip is disposed for preventing excessive voltage discharges to said field emission tip, and said intermediate electrode is operatively effective within said defined region to generate said charged particles.
Claim 5
Dependent Claim 73 words
The field emission gun of claim 3 wherein said voltage means includes impedance means interconnecting said intermediate electrode and said first electrode for limiting said intermediate electrode potential with respect to said field emission tip during discharge conditions from said second electrode to said first electrode, and said intermediate, first and second electrodes have centrally located apertures axially aligned with said field emission tip for passage of said charged particles forming said beam.
Claim 6
Dependent Claim 32 words
The field emission gun of claim 2 including means operatively associated with said intermediate electrode means and said field emission tip for vacuum pumping an area contiguous with said field emission tip.
Claim 7
Dependent Claim 53 words
The field emission gun of claim 5 wherein said field emission tip is disposed within a region defined by a shield electrode, and said means for vacuum pumping said area includes electrons from said field emission tip, and secondary and reflected electrons which ionize contamination particles, and means for capturing said ionized particles.
Claim 8
Dependent Claim 31 words
The field emission gun of claim 6 wherein a getter material is located within said area for capturing said contamination particles, and said ionized particles are attracted to said shield electrode.
Claim 9
Dependent Claim 51 words
The field emission gun of claim 1 including a second contiguous vacuum chamber for housing specimens upon which said charged particles beam impinges, said chamber and said specimen chamber being interconnected by at least one orifice of area selected so as to permit maintenance of said chambers at different vacuum levels.
Claim 10
Dependent Claim 44 words
The field emission gun of claim 6 wherein said chambers are interconnected by at least one orifice through which said charged particle beam passes, said charged particles are electrons, and said chamber is thereby maintained at a substantially lower pressure than said specimen chamber.

References Cited (Backward Citations)

US2363359A Cited
US3394281A Cited
US3394874A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1976-10-15 1977-04-16 1977-10-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1980-10-15 1981-04-16 1981-10-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1984-10-15 1985-04-16 1985-10-16 $7700.00 Window Closed / Lapsed

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