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US3765027A Expired / Lapsed US ⏱️ 0.0 years remaining

Ion lens recording system

Assignee: Xerox Corp
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Filing: 1971-12-30
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Granted: 1973-10-09
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Expires: 1991-12-30
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Abstract

Abstract An ion beam imaging apparatus for uniformly reducing an ion beam of a preselected shape. An ion beam is generated by supplying a suitable electrical voltage to a needle-like electrode with the ion sensitive surface of an insulating member being disposed on a conductive member and spaced away from the discharge end of the needle-like electrode. A suitable stencil having an aperture therein defining a preselected shape is positioned below and in proximity to the discharge end of the needle-like electrode and a tapered member of decreasing cross-sectional area is disposed above the ion sensitive surface in a substantially surrounding relationship to the ion beam defined by the stencil aperture. The aperture of the tapered member at the lower end thereof is disposed in proximity to the ion sensitive surface and remote from the stencil with the ion beam being converged and correspondingly reduced in cross-section at the aperture of the tapered member. The tapered member constitutes an ion imaging system as a uniformly reduced or minified latent image is defined on the ion sensitive surface of the insulating member.

Inventors

  • 👤 H Bresnick

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 14:21
CPC Classifications
G; G03; G03G; G03G15/00; G03G15/22; G03G15/32; G03G15/321

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 142 words
An ion imaging system, comprising: an ion source; an electrically conductive member spaced away from said ion source; means for receiving and positioning an insulating surface on said electrically conductive member and having an ion sensitive surface facing said ion source; means for supplying an electric voltage to said ion source to institute an ion beam discharge between said ion source and said ion sensitive surface; means for receiving a stencil member defining an aperture of preselected shape interposed between said ion source and ion sensitive surface for defining said ion beam as a shape coinciding with the preselected shape of said aperture; and tapered means disposed intermediate said aperture of preselected shape and said ion sensitive surface and spacially positioned so as to uniformly reduce said defined ion beam shape incident upon said ion sensitive surface relative to said preselected shape.
Claim 2
Dependent Claim 142 words
An ion imaging system, comprising: an ion source; an electrically conductive member spaced away from said ion source; means for receiving and positioning an insulating surface on said electrically conductive member and having an ion sensitive surface facing said ion source; means for supplying an electric voltage to said ion source to institute an ion beam discharge between said ion source and said ion sensitive surface; means for receiving a stencil member defining an aperture of preselected shape interposed between said ion source and ion sensitive surface for defining said ion beam as a shape coinciding with the preselected shape of said aperture; and tapered means disposed intermediate said aperture of preselected shape and said ion sensitive surface and spacially positioned so as to uniformly reduce said defined ion beam shape incident upon said ion sensitive surface relative to said preselected shape.
Claim 3
Dependent Claim 46 words
The system defined in claim 1 in which said tapered means comprises a tapered structure having at a narrow end thereof an aperture proximate to said ion sensitive surface for converging said defined ion beam shape at said aperture to uniformly reduce said defined shape thereat.
Claim 4
Dependent Claim 35 words
The system defined in claim 2 in which said aperture of said tapered structure is provided with a preassigned diameter for minifying said defined ion-charged shape in proportion to the preassigned diameter of said aperture.
Claim 5
Dependent Claim 37 words
The system defined in claim 1 further comprising a housing and in which said ion source comprises a needle having a tapered end disposed proximate to said stencil with said needle being substantially enclosed by said housing.
Claim 6
Dependent Claim 344 words
An ion imaging system, comprising: a conducting electrode consisting of a needle having a tapered end; an electric insulator supporting an end of said needle opposite to said tapered end thereof for disposing said needle in a direction normal to said insulator; a cylindrical housing having one open end attached to said insulator and disposed in a direction normal thereto for so enclosing said needle tapered end within said housing as to locate said needle tapered end within said housing at an area proximate to an opposite end of said housing, whereby said needle and housing are coaxiAlly aligned; an electrically conductive member disposed oppositely to said needle tapered end in spaced relation therewith in a plane normal to a lengthwise axis of said needle; means for receiving and positioning an insulating surface on said member and having an ion sensitive surface disposed to face said needle tapered end; means for supplying an electric voltage to said needle and to said member to institute an ion beam discharge therebetween and thereby onto said said ion sensitive surface; means for receiving a stencil character of preselected shape interposed between said needle tapered end and said ion sensitive surface for defining said ion beam to a shape coincident with that of said character to ion-charge said ion sensitive surface to record thereon an ion-charge shape corresponding to said stencil character shape; and tapered means disposed intermediate said stencil character and ion sensitive surface and spacially positioned so as to uniformly reduce said defined ion beam shape to minify said ion charge shape recorded on said ion sensitive surface relative to said stencil character shape; said tapered means including a funnel having an end of large diameter contiguous with said housing opposite end and an opposite end of small diameter proximate to said ion sensitive surface; said funnel opposite end formed with an aperture of preselected diameter for converging said defined ion beam shape thereat to minify said ion charge shape recorded on said ion sensitive surface in proportion to the preselected diameter of said funnel aperture.
Claim 7
Dependent Claim 344 words
An ion imaging system, comprising: a conducting electrode consisting of a needle having a tapered end; an electric insulator supporting an end of said needle opposite to said tapered end thereof for disposing said needle in a direction normal to said insulator; a cylindrical housing having one open end attached to said insulator and disposed in a direction normal thereto for so enclosing said needle tapered end within said housing as to locate said needle tapered end within said housing at an area proximate to an opposite end of said housing, whereby said needle and housing are coaxiAlly aligned; an electrically conductive member disposed oppositely to said needle tapered end in spaced relation therewith in a plane normal to a lengthwise axis of said needle; means for receiving and positioning an insulating surface on said member and having an ion sensitive surface disposed to face said needle tapered end; means for supplying an electric voltage to said needle and to said member to institute an ion beam discharge therebetween and thereby onto said said ion sensitive surface; means for receiving a stencil character of preselected shape interposed between said needle tapered end and said ion sensitive surface for defining said ion beam to a shape coincident with that of said character to ion-charge said ion sensitive surface to record thereon an ion-charge shape corresponding to said stencil character shape; and tapered means disposed intermediate said stencil character and ion sensitive surface and spacially positioned so as to uniformly reduce said defined ion beam shape to minify said ion charge shape recorded on said ion sensitive surface relative to said stencil character shape; said tapered means including a funnel having an end of large diameter contiguous with said housing opposite end and an opposite end of small diameter proximate to said ion sensitive surface; said funnel opposite end formed with an aperture of preselected diameter for converging said defined ion beam shape thereat to minify said ion charge shape recorded on said ion sensitive surface in proportion to the preselected diameter of said funnel aperture.

References Cited (Backward Citations)

US2944147A Cited
US3321768A Cited
US3358289A Cited
US3898468A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1976-10-08 1977-04-09 1977-10-09 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1980-10-08 1981-04-09 1981-10-09 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1984-10-08 1985-04-09 1985-10-09 $7700.00 Window Closed / Lapsed

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