US3755720A
Expired / Lapsed
US
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Glass encapsulated semiconductor device
Assignee: RCA Corp
•
Filing: 1972-09-25
•
Granted: 1973-08-28
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Expires: 1992-09-25
Abstract
Abstract Glass encapsulated semiconductor device in which the glass has the basic composition PbO, 70-80 wt.%; ZnO, 5-15 wt.%; and B2O3, 7-15 wt.%.
Inventors
- 👤 W Kern
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 22:17
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10W; H10W74/00; H10W74/10; H10W74/131; H10W74/40; H10W74/43
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
17 words
A device according to claim 1 in which said passivating material includes a layer of silicon nitride.
Claim 2
Dependent Claim
14 words
A device according to claim 1 in which said passivating material is silicon dioxide.
Claim 3
Dependent Claim
17 words
A device according to claim 1 in which said semiconductor material comprises at least one III-V compound.
Claim 4
Dependent Claim
82 words
An encapsulated semiconductor device comprising a body of semiconductor material having a relatively high thermal coefficient of expansion, electrode leads attached to said body, and a relatively thick layer of glass encapsulating said device, said glass having the following composition, with the total wt.% of the first three ingredients being within the range of 82-100 and the total wt.% of the second three ingredients being within the range of 0-14: wt.% PbO70-80 ZnO5-15 B2O37-15 SiO2 0-8 Al2O3 0-4 Li2O0-2 total - 100
Claim 5
Dependent Claim
21 words
A device according to claim 5 in which said body has at least one pn junction extending to a surface thereof.
Claim 6
Dependent Claim
49 words
An encapsulated semiconductor device comprising a body of semiconductor material having a relatively high temperature coefficient of expansion, electrode leads attached to said body, and a relatively thick layer of glass encapsulating said device, said glass having the composition: wt.% PbO75.5 ZnO10.5 B2O3 10.0 SiO2 2.5 Al2O3 1.0 Li2O0.5
References Cited (Backward Citations)
US2971853A
Cited
US2920971A
Cited
US3282711A
Cited
US3247428A
Cited
US3264712A
Cited
US3300339A
Cited
US3319311A
Cited
US3392312A
Cited
US3440496A
Cited
US3505571A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1976-08-27 | 1977-02-26 | 1977-08-28 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1980-08-27 | 1981-02-26 | 1981-08-28 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1984-08-27 | 1985-02-26 | 1985-08-28 | $7700.00 | Window Closed / Lapsed |