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US3755720A Expired / Lapsed US ⏱️ 0.0 years remaining

Glass encapsulated semiconductor device

Assignee: RCA Corp
•
Filing: 1972-09-25
•
Granted: 1973-08-28
•
Expires: 1992-09-25
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Abstract

Abstract Glass encapsulated semiconductor device in which the glass has the basic composition PbO, 70-80 wt.%; ZnO, 5-15 wt.%; and B2O3, 7-15 wt.%.

Inventors

  • 👤 W Kern

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-25 22:17
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10W; H10W74/00; H10W74/10; H10W74/131; H10W74/40; H10W74/43

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 17 words
A device according to claim 1 in which said passivating material includes a layer of silicon nitride.
Claim 2
Dependent Claim 14 words
A device according to claim 1 in which said passivating material is silicon dioxide.
Claim 3
Dependent Claim 17 words
A device according to claim 1 in which said semiconductor material comprises at least one III-V compound.
Claim 4
Dependent Claim 82 words
An encapsulated semiconductor device comprising a body of semiconductor material having a relatively high thermal coefficient of expansion, electrode leads attached to said body, and a relatively thick layer of glass encapsulating said device, said glass having the following composition, with the total wt.% of the first three ingredients being within the range of 82-100 and the total wt.% of the second three ingredients being within the range of 0-14: wt.% PbO70-80 ZnO5-15 B2O37-15 SiO2 0-8 Al2O3 0-4 Li2O0-2 total - 100
Claim 5
Dependent Claim 21 words
A device according to claim 5 in which said body has at least one pn junction extending to a surface thereof.
Claim 6
Dependent Claim 49 words
An encapsulated semiconductor device comprising a body of semiconductor material having a relatively high temperature coefficient of expansion, electrode leads attached to said body, and a relatively thick layer of glass encapsulating said device, said glass having the composition: wt.% PbO75.5 ZnO10.5 B2O3 10.0 SiO2 2.5 Al2O3 1.0 Li2O0.5

References Cited (Backward Citations)

US2971853A Cited
US2920971A Cited
US3282711A Cited
US3247428A Cited
US3264712A Cited
US3300339A Cited
US3319311A Cited
US3392312A Cited
US3440496A Cited
US3505571A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1976-08-27 1977-02-26 1977-08-28 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1980-08-27 1981-02-26 1981-08-28 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1984-08-27 1985-02-26 1985-08-28 $7700.00 Window Closed / Lapsed

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