Plural beam mass spectrometer

Claim 2

A mass spectrometer comprising: a. a plurality of spaced ion sources each for generating and emitting a beam of ions along a path of ion travel; b. an analyzer for deflecting generated beams of ions and separating ions of a beam according to the mass/charge ratios of the ions; c. a pair of ion sensitive structures positioned in spaced relationship and to receive ions from a beam deflected by the analyzer; d. source beam deflection means interposed between at least one ion source and the analyzer for deflection ions emitted by the one source along a path paralleling the paths of ions emitted from another source with the two paths after deflection being closer to one another than locations in said one and said another sources where ions are generated; and, e. analyzed beam deflection means between said analyzer and said structures to deflect certain of the ions of a beam onto one of the structures while other of the ions pass to the other structure.

Claim 3

The mass spectrometer of claim 1 wherein the focal length of a beam of ions traveling from the source to the one structure is substantially equal to the focal length of a beam from the source to the other structure.

Claim 4

The mass spectrometer of claim 1 wherein said source deflection means deflects ions in a plane transverse to the plane of analyzer deflection.

Claim 5

The mass spectrometer of claim 1 wherein said analyzed beam deflection means deflects ions in a plane transverse to the plane of analyzer deflection.

Claim 6

The mass spectrometer of claim 1 wherein Said source deflection means is constructed for deflecting the beam emitted by the one source toward the paths of a beam from said another source prior to deflecting the beam parallel to the path of said another ions.

Claim 7

The mass spectrometer of claim 1 wherein the source deflection means is adapted to deflect both beams toward one another and thereafter along parallel paths.

Claim 8

The mass spectrometer of claim 6 wherein said source beam deflection means comprises: first electrostatic deflector means adapted to deflect each of said two beams toward the other of said two beams; and, second electrostatic deflector means adapted to deflect each of said two beams along parallel paths.

Claim 9

The mass spectrometer of claim 7 wherein each of said electrostatic deflector means comprises arcuately shaped electrostatic deflector plates.

Claim 10

The mass spectrometer of claim 8 wherein: said first electrostatic deflector means comprises two pairs of spaced arcuately shaped deflector plates, each pair being adapted to receive one of said two beams between its plates and to deflect the beam toward the other of said two beams; and, said second electrostatic deflector means comprises a doubly arcuate-shaped center plate and a pair of arcuate-shaped deflector plates spaced from said center plate, each of said two beams being received between said center plate and a separate one of said outer plates for deflection into parallel paths.

Claim 11

The mass spectrometer of claim 7 wherein said analyzed beam deflector means comprises a pair of arcuate-shaped deflector plates adapted to receive one of said two beams and to deflect the beam toward said one structure.

Claim 12

The structure of claim 1 wherein beams of ions emitted by both said one and said other sources are deflected by said source deflection means.

Claim 13

A mass spectrometer comprising: a. a pair of spaced ion sources each for generating and emitting a beam of ions of like polarity along a path of ion travel; b. an analyzer for deflecting generated beams of ions and separating ions of each beam according to the mass/charge ratios of the ions; c. source beam deflection means interposed between at least one ion source and the analyzer for deflecting ions emitted by the one source along a path paralleling the paths of ions emitted from another source with the two paths after deflection being closer to one another than locations in said one and said another sources where ions are generated; d. a pair of ion sensitive structures positioned in spaced relationship, one of the structures being positioned to receive ions from one of the beams deflected by the analyzer and the other structure being positioned to receive ions of the other beam; and, e. analyzed beam deflection means between said analyzer and said structures to deflect the ions of said one beam onto said one structure while ions of said other beam travel to said other structure.

Claim 14

A mass spectrometer comprising: a. a pair of spaced ion sources each for generating and emitting a beam of ions of like polarity along a path of ion travel; b. an analyzer for deflecting generated beams of ions and separating ions of each beam according to the mass/charge ratios of the ions; c. source beam deflection means interposed between at least one ion source and the analyzer for deflecting ions emitted by the one source along a path paralleling the paths of ions emitted from another source with the two paths after deflection being closer to one another than locations in said one and said another sources where ions are generated; d. a pair of ion sensitive structures positioned in spaced relationship, one of the structures being positioned to receive ions from one of the beams deflected by the analyzer and the other structure being positioned to receive ions of the other beam; and, e. analyzed beam deflection means between said analyzer and said structures to deflect the ions of said one beam onto said one structure while ions of said other beam travel to said other structure.

Claim 15

The mass spectrometer of claim 12 wherein said source deflection means deflects ions in a plane transverse to the plane of analyzer deflection.

Claim 16

The mass spectrometer of claim 13 wherein the focal length of a beam of ions traveling from said one source to said one structure is substantially equal to the focal length of the beam from said other source to said other structure.

Claim 17

The mass spectrometer of claim 12 wherein said analyzed beam deflection means deflects ions in a plane transverse to the plane of analyzer deflection.