Mass spectrometer detector for collecting ions of similar but different masses

Claim 1

IN A MASS SPECTROMETER, AN ION BEAM INTENSITY MEASURING SYSTEM FOR MEASURING SIMULTANEOUSLY THE INTENSITY OF IONS OF TWO SIMILAR BUT DIFFERENT MASSES CONTAINED IN AN ION BEAM SEPARATED BY THE MASS SPECTROMETER INTO TWO DISCRETE ION BEAMS, COMPRISING TWO CHAMBERS SEPARATED BY AN ELECTRICALLY CONDUCTING PARTITION FORMING AN ELECTROSTATIC SCREEN BETWEEN THE CHAMBERS, EACH CHAMBER HAVING AN INLET FOR ADMITTING ONE OF SAID ION BEAMS TO SAID CHAMBER, ELECTRODE MEANS POSITIONED WITHIN EACH CHAMBER TO DEFLECT THE ION BEAM ENTERING THAT CHAMBER IN A DIRECTION AWAY FROM THE PARTITION, TARGET MEANS LOCATED WITHIN EACH CHAMBER TO INTERCEPT THE DEFLECTED ION BEAM IN THAT CHAMBER, SAID TARGET MEANS BEING ADAPTED TO GENERATE SECONDARY ELECTRONS UPON BOMBARDMENT BY SAID ION BEAM, MEANS FOR ESTABLISHING IN EACH CHAMBER A MAGNETIC FIELD TO DEFLECT THE SECONDARY ELECTRONS INTO A DIRECTION AVOIDING CONTACT WITH SAID PARTITION, AND MEANS LOCATED IN THE PATHS OF THE DEFLECTED SECONDARY ELECTRONS IN EACH CHAMBER FOR DETECTING SAID SECONDARY ELECTRONS.