US3702437A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Diagnostic and repair system for semiconductors
Assignee: AT&T Inc
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Filing: 1970-06-01
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Granted: 1972-11-07
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Expires: 1990-06-01
Abstract
Abstract A system is provided for diagnosing and repairing electronic assemblies which include a plurality of semiconductor devices interconnected in parallel, wherein at least one of the devices is faulty. Radiant energy is directed onto each of the devices successively and the response of each device to the radiant energy is noted. When a device causes a response dissimilar from the others it is identified as a faulty device and replaced. Alternatively, disturbing energy is transferred to the devices from a remote source by capacitive or inductive coupling through electric and magnetic fields respectively.
Inventors
- 👤 John W Mcgrath
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 12:30
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/302; G01R31/308; G01R31/311
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
121 words
A method of distinguishing between faulty and non-faulty separate semiconductor integrated circuit devices among a plurality of substantially identical separate devices connected across parallel conductors, which comprises the steps of: placing a signal of a predetermined characteristic across the parallel conductors; successively transferring disturbing energy uniformly onto the entire surface of each of the substantially identical integrated circuit devices from a source by a phenomena not requiring a substantive transmission media; detecting changes in characteristic of the signal across the parallel conductors associated with the absorption of the gross disturbing energy by each of the integrated circuit devices; and detecting dissimilarities in changes of signal characteristics produced by various ones of the devices to thereby distinguish such devices as being faulty.
Claim 2
Independent Claim
121 words
A method of distinguishing between faulty and non-faulty separate semiconductor integrated circuit devices among a plurality of substantially identical separate devices connected across parallel conductors, which comprises the steps of: placing a signal of a predetermined characteristic across the parallel conductors; successively transferring disturbing energy uniformly onto the entire surface of each of the substantially identical integrated circuit devices from a source by a phenomena not requiring a substantive transmission media; detecting changes in characteristic of the signal across the parallel conductors associated with the absorption of the gross disturbing energy by each of the integrated circuit devices; and detecting dissimilarities in changes of signal characteristics produced by various ones of the devices to thereby distinguish such devices as being faulty.
Claim 3
Dependent Claim
12 words
The method of claim 1 wherein the disturbing energy is radiant energy.
Claim 4
Dependent Claim
15 words
The method of claim 1 wherein the disturbing energy is transferred through an electric field.
Claim 5
Dependent Claim
15 words
The method of claim 1 wherein the disturbing energy is transferred through a magnetic field.
Claim 6
Independent Claim
118 words
A method of diagnosing a defective assembly of a plurality of separate substantially identical semiconductor integrated circuit devices connected across parallel conductors; which comprises the steps of: placing a signal of a predetermined characteristic across the parallel conductors; successively directing a source of radiant energy uniformly onto the entire surface of each of the separate substantially identical devices; detecting a change in characteristic of the signal across the parallel conductors associated with the gross absorption of the radiant energy by each of the devices; and identifying as faulty those devices which produce a change in signal characteristic which is different from the change associated with the gross absorption of the radiant energy by a majority of the devices.
Claim 7
Independent Claim
118 words
A method of diagnosing a defective assembly of a plurality of separate substantially identical semiconductor integrated circuit devices connected across parallel conductors; which comprises the steps of: placing a signal of a predetermined characteristic across the parallel conductors; successively directing a source of radiant energy uniformly onto the entire surface of each of the separate substantially identical devices; detecting a change in characteristic of the signal across the parallel conductors associated with the gross absorption of the radiant energy by each of the devices; and identifying as faulty those devices which produce a change in signal characteristic which is different from the change associated with the gross absorption of the radiant energy by a majority of the devices.
Claim 8
Dependent Claim
11 words
The method of claim 5 wherein the radiant energy is infrared.
Claim 9
Dependent Claim
35 words
The method of claim 6 wherein the semiconductor devices are silicon planar devices having an active side and an inactive side and the infrared radiant energy is introduced by initial passage through the inactive side.
Claim 10
Dependent Claim
115 words
Apparatus for diagnosing a defective assembly of a plurality of substantially identical separate semiconductor integrated circuit devices connected across parallel conductors, which comprises: means for placing a signal of predetermined characteristic across the parallel conductors; means for successively directing a source of disturbing radiant energy uniformly onto the entire surface of each of the devices; and means for detecting the change in signal characteristic across the parallel conductors associated with the gross absorption of the radiant energy by each of the devices to assist in identifying as faulty those devices which produce a change in signal characteristic dissimilar to the change associated with gross absorption of the radiant energy by the majority of the devices.
Claim 11
Dependent Claim
115 words
Apparatus for diagnosing a defective assembly of a plurality of substantially identical separate semiconductor integrated circuit devices connected across parallel conductors, which comprises: means for placing a signal of predetermined characteristic across the parallel conductors; means for successively directing a source of disturbing radiant energy uniformly onto the entire surface of each of the devices; and means for detecting the change in signal characteristic across the parallel conductors associated with the gross absorption of the radiant energy by each of the devices to assist in identifying as faulty those devices which produce a change in signal characteristic dissimilar to the change associated with gross absorption of the radiant energy by the majority of the devices.
Claim 12
Dependent Claim
28 words
The apparatus of claim 8 wherein the means for directing radiant energy includes a micrometer-driven positioner whereby the semiconductor devices are accurately located with respect to the source.
Claim 13
Dependent Claim
11 words
The apparatus of claim 8 wherein the radiant energy is infrared.
Claim 14
Dependent Claim
36 words
The apparatus of claim 10 wherein the semiconductor devices and planar devices having an active side and an inactive side and the infrared radiant energy source is adapted to introduce energy initially through the inactive side.
References Cited (Backward Citations)
US3549999A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1975-11-07 | 1976-05-08 | 1976-11-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1979-11-07 | 1980-05-08 | 1980-11-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1983-11-07 | 1984-05-08 | 1984-11-07 | $7700.00 | Window Closed / Lapsed |