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US3671338A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of manufacturing a semiconductor photo-sensitive device

Assignee: Toshiba Corp
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Filing: 1969-12-05
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Granted: 1972-06-20
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Expires: 1989-12-05
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Abstract

Abstract A METHOD OF MANUFACTURING A SEMICONDUCTOR PHOTOSENSITIVE DEVICE INCLUDES THE STEPS OF FORMING A POLY CRYSTAL FORMATION LAYER ON THE FLAT SURFACE OF AN N-TYPE SEMICONDUCTOR SUBSTRATE EXCLUDING THE PERIPHERAL EDGE THEREOF, DEPOSITING A CRYSTAL LAYER ON THE SURFACE INCLUDING A POLY CRYSTAL REGION OVERLAYING THE POLY CRYSTAL FORMATION LAYER, FORMING A PLURALITY OF PN JUNCTIONS IN THE OPPOSITE SURFACE OF THE SUBSTRATE, AND REMOVING THE POLY CRYSTAL REGION, THEREBY FORMING A RECESS STRUCTURE SUBSTRATE.

Inventors

  • 👤 Akihiro Fujii

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 16:42
CPC Classifications
H; H10; H10D; H10D99/00; H10F; H10F71/00; H10P; H10P95/00; Y; Y10; Y10S; Y10S148/00; Y10S148/043; Y10S148/051; Y10S148/122; Y10S438/00; Y10S438/942; Y10S438/948; Y10S438/977

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1975-06-20 1975-12-20 1976-06-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1979-06-20 1979-12-20 1980-06-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1983-06-20 1983-12-20 1984-06-20 $7700.00 Window Closed / Lapsed

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