Patent US3670162A successfully refreshed from Google Patents.
US3670162A
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Charged particle analyzer
Assignee: Avco Corp
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Filing: 1970-09-23
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Granted: 1972-06-13
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Expires: 1990-09-23
Abstract
Abstract A charged particle analyzer for analyzing charged particles with respect to their specific mass is disclosed. The charged particle analyzer employs the principle of crossed electric and magnetic fields to obtain perfect double focusing and high resolution. The electric field is radial in direction and proportional in magnitude to the radius of the analyzer at any point in the flight cylinder and is normal to the magnetic field. A suitable source of ions is provided to permit introduction of ions into the analyzer and a suitable ion receiver is provided to receive ions from the analyzer.
Inventors
- 👤 Robert E Elmore
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 06:54
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/26; H01J49/28; H01J49/32; H01J49/328
Claims Analysis
Total Claims: 20
Claim 1
Independent Claim
206 words
Apparatus for analyzing charged particles with respect to their specific mass comprising: first planar electrode means; second planar electrode means parallel to said first planar electrode means, each electrode means being formed to present alternate conductive and non-conductive sections radially outward from the center, said first and second electrode means defining an annular space therebetween; supply means connected to said first and second planar electrode means to provide a high positive potential at the peripheral conductive section and the potential of the remaining conductive sections becomes respectively increasingly negative towards the central axis wherein the electrical field is radial and varies in intensity directly with the radius within said space; means providing a magnetic field within said space normal to the electric field; means for projecting a sample of charged particles into said space at a radial distance Ro from the axis, the radial distance Ro being the radial distance at which ion focusing occurs wherein said charged particles are acted on by said electric and magnetic fields whereby particles of the same mass are caused to focus irrespective of the initial input conditions; and receiver means spaced a distance from said projecting means along the radial distance Ro for receiving particles of a given mass.
Claim 2
Dependent Claim
206 words
Apparatus for analyzing charged particles with respect to their specific mass comprising: first planar electrode means; second planar electrode means parallel to said first planar electrode means, each electrode means being formed to present alternate conductive and non-conductive sections radially outward from the center, said first and second electrode means defining an annular space therebetween; supply means connected to said first and second planar electrode means to provide a high positive potential at the peripheral conductive section and the potential of the remaining conductive sections becomes respectively increasingly negative towards the central axis wherein the electrical field is radial and varies in intensity directly with the radius within said space; means providing a magnetic field within said space normal to the electric field; means for projecting a sample of charged particles into said space at a radial distance Ro from the axis, the radial distance Ro being the radial distance at which ion focusing occurs wherein said charged particles are acted on by said electric and magnetic fields whereby particles of the same mass are caused to focus irrespective of the initial input conditions; and receiver means spaced a distance from said projecting means along the radial distance Ro for receiving particles of a given mass.
Claim 3
Dependent Claim
66 words
Apparatus as set forth in claim 1 in which said first and second planar electrode means each comprises a plurality of concentric electrode members wherein the potential of the peripheral member is maintained at a high positive potential, the member at the radial distance R0 is a reference potential and the potential of the members from the R0 member to the innermost member become increasingly negative.
Claim 4
Dependent Claim
23 words
Apparatus as set forth in claim 2 in which said plurality of concentric electrode members comprises conducting rings embedded in a dielectric base.
Claim 5
Dependent Claim
73 words
Apparatus as set forth in claim 1 in which said first and second planar electrode means each comprises a dielectric base and a plurality of concentric conducting rings secured to said dielectric base and further comprising means for connecting each of said rings with a source of power wherein the electrical potential becomes increasingly negative towards the analyzer center while the energy gradient between each respective ring decreases in intensity towards the center.
Claim 6
Dependent Claim
24 words
Apparatus as set forth in claim 4 in which each of said conducting rings is an annular electrode ring embedded in said dielectric base.
Claim 7
Dependent Claim
26 words
APparatus as set forth in claim 4 in which each of said conducting rings is a conductive film bonded to the surface of said dielectric base.
Claim 8
Dependent Claim
70 words
Apparatus as set forth in claim 4 in which said dielectric base is formed with a plurality of apertures, each aperture extending from the side opposite the conducting ring side through said dielectric base to each conducting ring; and in which said connecting means comprises a conducting pin inserted in said apertures to make contact with said conducting ring and connect said ring with a lead from a power supply.
Claim 9
Dependent Claim
52 words
Apparatus as set forth in claim 7 further comprising a plurality of radially extending grooves formed in said dielectric base, each of said grooves terminating at one of said apertures wherein the respective leads from a power supply is placed in said groove so as to make contact with said conducting pin.
Claim 10
Dependent Claim
125 words
Apparatus for analyzing charged particles with respect to their specific mass comprising: an ion source; an ion receiver; a beam of ions traversing a periodic path therebetween; means providing a uniform magnetic field normal to the path of the ion beam; and means including a pair of planar electrodes on either side of said ion beam path, each comprising a plurality of annular electrodes of increasing radius for establishing a radial electric field varying in intensity directly with the radius and acting normal to the magnetic field for focusing ions emitted from said ion source at said ion receiver, said ion source and said ion receiver being mounted between said planar electrodes at a radial distance from the central axis at which ion focusing occurs.
Claim 11
Dependent Claim
125 words
Apparatus for analyzing charged particles with respect to their specific mass comprising: an ion source; an ion receiver; a beam of ions traversing a periodic path therebetween; means providing a uniform magnetic field normal to the path of the ion beam; and means including a pair of planar electrodes on either side of said ion beam path, each comprising a plurality of annular electrodes of increasing radius for establishing a radial electric field varying in intensity directly with the radius and acting normal to the magnetic field for focusing ions emitted from said ion source at said ion receiver, said ion source and said ion receiver being mounted between said planar electrodes at a radial distance from the central axis at which ion focusing occurs.
Claim 12
Dependent Claim
84 words
Apparatus as set forth in claim 9 in which said means for providing a radial electric field comprises a first plurality of concentric electrode rings; a second plurality of concentric electrode rings complementary with said first plurality of electrode rings and mounted parallel thereto; and further comprising supply means for applying a potential to said electrodes whereby the potential of each ring becomes increasingly negative towards the analyzer center while the energy gradient between each respective concentric ring decreases in intensity towards the center.
Claim 13
Dependent Claim
40 words
Apparatus as set forth in claim 10 further comprising control means connected to said supply means to vary the electrical potential wherein the electric field between said first and second electrode rings can be changed to permit ion scan analysis.
Claim 14
Dependent Claim
23 words
Apparatus as set forth in claim 10 further comprising means to vary the intensity of the magnetic field to permit ion scan analysis.
Claim 15
Dependent Claim
16 words
Apparatus as set forth in claim 9 in which said ion receiver is an ion-electron multiplier.
Claim 16
Dependent Claim
17 words
Apparatus as set forth in claim 9 in which said ion receiver is a Faraday Cup detector.
Claim 17
Dependent Claim
83 words
Apparatus as set forth in claim 9 in which said means for providing a radial electric field is first and second planar electrode means, each electrode means comprising a dielectric base and a plurality of concentric conducting rings secured to said dielectric base and further comprising means for connecting each of said rings with a source of power wherein the electrical potential becomes increasingly negative towards the analyzer center while the energy gradient between each respective ring decreases in intensity towards the center.
Claim 18
Dependent Claim
24 words
Apparatus as set forth in claim 15 in which each of said conducting rings is a concentric electrode ring embedded in said dielectric base.
Claim 19
Dependent Claim
26 words
Apparatus as set forth in claim 15 in which each of said conducting rings is a conductive film bonded to the surface of said dielectric base.
Claim 20
Dependent Claim
112 words
Apparatus as set forth in claim 9 in which said planar electrodes further comprise a plurality of concentric conducting rings secured to a dielectric base and further comprising a source of supply means connected to said conducting rings to provide a high positive potential at the peripheral ring and an increasingly negative potential to each respeCtive conducting ring towards the central axis wherein the periodic path of the ion beam simultaneously acted on by the radial electric field and the uniform magnetic field is mathematically defined by the simultaneous solution of equations mr theta -2mr theta + or - QBr and mr mr theta 2 -QEor + or - QBr theta .
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1975-06-13 | 1975-12-13 | 1976-06-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1979-06-13 | 1979-12-13 | 1980-06-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1983-06-13 | 1983-12-13 | 1984-06-13 | $7700.00 | Window Closed / Lapsed |