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US3668484A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor device with multi-level metalization and method of making the same

Assignee: RCA Corp
•
Filing: 1970-10-28
•
Granted: 1972-06-06
•
Expires: 1990-10-28
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Abstract

Abstract A semiconductor body has thereon a first level metalization pattern, a layer of an electrical insulating material on the body and covering the first level metalization pattern, and a second level metalization pattern on the insulating material layer and extending through at least one opening in the insulating material layer to contact the first level metalization pattern. Each of the metalization patterns includes a film of titanium, a film of platinum over the titanium film and a film of gold over the platinum film. The first level metalization pattern has an opening in the gold film in alignment with each of the openings in the dielectric layer so that the titanium film of the second level metalization pattern contacts the platinum film of the first level metalization pattern.

Inventors

  • 👤 William John Greig
  • 👤 Ralph Robert Soden

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 15:57
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W20/41; H10W20/44; H10W20/4403; H10W20/4432; H10P; H10P95/00

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 25 words
A semiconductor device in accordance with claim 1 in which each of said metalization layers is in the form of a pattern including interconnecting strips.
Claim 2
Dependent Claim 43 words
A semiconductor device in accordance with claim 2 in which at least one of the interconnecting strips of the patterns of the second level metalization layer crosses over at least one of the strips of the pattern of the first level metalization layer.
Claim 3
Dependent Claim 41 words
A semiconductor device in accordance with claim 3 including a layer of an electrical insulating material between the body and the first level metalization layer, said insulating layer having openings therethrough and the first level metalization layer extends into said openings.

References Cited (Backward Citations)

US3429029A Cited
US3287612A Cited
US3421206A Cited
US3426252A Cited
US3461524A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1975-06-06 1975-12-06 1976-06-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1979-06-06 1979-12-06 1980-06-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1983-06-06 1983-12-06 1984-06-06 $7700.00 Window Closed / Lapsed

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