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Bipolar-unipolar transistor structure

Assignee: Westinghouse Electric Corp
•
Filing: 1971-01-26
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Granted: 1972-05-16
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Expires: 1991-01-26
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Abstract

Abstract A unipolar-bipolar amplifying structure which combines the use of a photosensitive thin film unipolar transistor structure with a conventional single crystal bipolar structure whereby the bipolar transistor characteristics can be varied in response to changes in radiation incident on the unipolar thin film device.

Inventors

  • 👤 Gene Strull

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-25 19:15
CPC Classifications
H; H10; H10F; H10F30/00; H10F30/20; H10F30/21; H10F30/28; H10F30/282; H10D; H10D99/00; H10F99/00; H10P; H10P95/00

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 202 words
A bipolar-unipolar transistor structure comprising a body of semiconductive material having a collector region of one conductivity type intersecting a surface of said wafer, a base region of the other conductivity type diffused into said collector region and intersecting said surface, an emitter region of the same conductivity type as said collector diffused into said base region and intersecting said surface such that the P-N junctions between said emitteR and base regions and between said base and collector regions extend to said surface, electrical contacts engaged with said emitter, base and collector regions, an oxide layer covering said surface of the wafer not covered by said contacts, a layer of semiconductive material deposited on said oxide layer, said layer of semiconductive material spanning at least one of said P-N junctions and being formed from a material productive of electron-hole pairs upon exposure to radiation, and an electrode connected to said layer of semiconductive material, the electrodes connected to said layer of semiconductive material, said base region and said emitter region comprising the gate, drain and source electrodes of a unipolar transistor, the transistor formed in said wafer being responsive to incident radiation upon the layer of semiconductive material on said oxide layer.
Claim 2
Dependent Claim 202 words
A bipolar-unipolar transistor structure comprising a body of semiconductive material having a collector region of one conductivity type intersecting a surface of said wafer, a base region of the other conductivity type diffused into said collector region and intersecting said surface, an emitter region of the same conductivity type as said collector diffused into said base region and intersecting said surface such that the P-N junctions between said emitteR and base regions and between said base and collector regions extend to said surface, electrical contacts engaged with said emitter, base and collector regions, an oxide layer covering said surface of the wafer not covered by said contacts, a layer of semiconductive material deposited on said oxide layer, said layer of semiconductive material spanning at least one of said P-N junctions and being formed from a material productive of electron-hole pairs upon exposure to radiation, and an electrode connected to said layer of semiconductive material, the electrodes connected to said layer of semiconductive material, said base region and said emitter region comprising the gate, drain and source electrodes of a unipolar transistor, the transistor formed in said wafer being responsive to incident radiation upon the layer of semiconductive material on said oxide layer.
Claim 3
Dependent Claim 23 words
The bipolar-unipolar transistor structure of claim 1 wherein said layer of semiconductive material spans the P-N junction between said emitter and base regions.
Claim 4
Dependent Claim 23 words
The bipolar-unipolar transistor structure of claim 1 wherein said layer of semiconductive material spans the P-N junction between said collector and base regions.
Claim 5
Dependent Claim 27 words
The bipolar-unipolar transistor structure of claim 1 including an oxide layer disposed between said layer of semiconductive material and a contact for said layer of semiconductive material.
Claim 6
Dependent Claim 15 words
The bipolar-unipolar transistor structure of claim 1 wherein said layer of semiconductive material is polycrystalline.
Claim 7
Dependent Claim 16 words
The bipolar-unipolar transistor structure of claim 1 wherein said layer of semiconductive material comprises cadmium sulfide.

References Cited (Backward Citations)

US2976426A Cited
US2980831A Cited
US3096442A Cited
US3366793A Cited
US3436548A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1975-05-16 1975-11-15 1976-05-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1979-05-16 1979-11-15 1980-05-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1983-05-16 1983-11-15 1984-05-16 $7700.00 Window Closed / Lapsed

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