Automatic sample changer for a goniometer with means to accomodate samples of different thicknesses

Claim 1

An automatic sample changer for a goniometer, said goniometer having an X-ray source, a rotational mount for said X-ray source, a mount reversing switch mechanically coupled to said mount so that said X-ray source will move through an angular rotation of a fixed number of degrees, a sample changer shaft axially mounted through said rotational mount and means for driving said sample shaft and said X-ray source such that said X-ray source passes through an angular rotation twice that of said sample shaft, said automatic sample changer comprising: a sample changer mount having means to secure said mount to said sample changer shaft; a second shaft; means for securing said second shaft to said sample changer mount so that the axis of said second shaft is parallel to the axis of said sample changer shafT; a drum-shaped sample holder having a plurality of flat surfaces formed on the outer periphery of said drum and wherein said surfaces are normal to a radius of said drum and adapted to hold a sample thereon; power supply means; solenoid means mounted to said sample changer mount; means for coupling the output of said solenoid to said drum for rotating said drum through a fixed angular rotation; detent means carried by said sample changer mount; a plurality of spaced depressions on the inner surface of said drum adapted to receive said detent means and provide for a fixed angular rotation of said drum for each operation of said solenoid; and means for connecting said solenoid to said power supply through said reversing switch wherein said means for securing said second shaft to said sample changer mount comprises a sliding shaft mount, means for securing said sliding shaft mount to said sample changer mount in a plane normal to the axis of said sample chamber shaft, means for adjusting the position of said sliding shaft mount, and locking means for securing the position of said sliding shaft mount whereby the second shaft can be moved perpendicular to the axis of said sample changer shaft so that the position of a sample with relation to the sample changer shaft can be adjusted to account for variations in thickness of a set of samples.