Abstract A device for determining the crystallographic directions in single crystals comprises a holder for a single crystal, a source of primary X-rays, e.g., an X-ray tube, and a recording surface for receiving and recording X-rays reflected by the lattice planes of the crystal, e.g., diffracted X-rays. In order to increase the accuracy of the measurement, the crystal is ground to provide a reference surface the normal of which is inclined at a small angle relative to the path of the beam of primary X-rays which are incident thereon. The film for receiving and registering the reflected X-rays from the lattice planes of the crystal is located to one side of the path of the primary X-ray beam and is so positioned that the normal to the surface of the film is rotated relative to the primary X-ray beam by twice the angle between the normal to the smooth surface of the crystal and the central ray of the primary X-ray beam. Preferably, the crystal is mounted in a holder which with the film are arranged on a common base plate.
Inventors
👤 Peter Eckerlin
Bibliographic Details
Application Number—
JurisdictionUS
Data Sourcegoogle_patents
Last Synchronized2026-10-23 11:14
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/20; G01N23/205
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
114 words
In a device for determining the crystallographic directions in single crystals by a primary beam of X-rays relative to a smooth surface on the crystal, in which X-rays reflected from the crystal are registered on a photographic plate, and the smooth surface of the crystal is inclined to the central ray of the primary X-ray beam, the improvement wherein the recording surface for the X-rays reflected by the crystal is located adjacent the path of the primary rays in a position in which a normal to the recording surface is turned through twice the angle between the normal to the smooth surface of the crystal and the central ray of the primary X-ray beam.
Claim 2
Dependent Claim
114 words
In a device for determining the crystallographic directions in single crystals by a primary beam of X-rays relative to a smooth surface on the crystal, in which X-rays reflected from the crystal are registered on a photographic plate, and the smooth surface of the crystal is inclined to the central ray of the primary X-ray beam, the improvement wherein the recording surface for the X-rays reflected by the crystal is located adjacent the path of the primary rays in a position in which a normal to the recording surface is turned through twice the angle between the normal to the smooth surface of the crystal and the central ray of the primary X-ray beam.
Claim 3
Dependent Claim
27 words
A device as claimed in claim 1, wherein a holder for the recording surface and a holder for the crystal are arranged on a common base plate.
Claim 4
Dependent Claim
21 words
A device as claimed in claim 2, wherein the holder for the crystal is adjustable in the direction of the X-rays.
Claim 5
Independent Claim
128 words
A device for determining the crystallographic directions in a single crystal comprising means to generate a beam of primary X-rays, means to position the single crystal with a given reference surface the normal to which forms a given angle with the central ray of the primary X-ray beam incident thereon, a detector for receiving and recording X-rays reflected by given lattice planes of the crystal, said detector being positioned adjacent the path of the primary X-ray beam and having a given receiving surface on which the reflected X-rays are incident, said detector receiving surface having a normal which forms an angle with the central ray of said primary X-ray beam which is twice that formed between the normal to the crystal reference surface and the primary X-ray beam.
Claim 6
Independent Claim
128 words
A device for determining the crystallographic directions in a single crystal comprising means to generate a beam of primary X-rays, means to position the single crystal with a given reference surface the normal to which forms a given angle with the central ray of the primary X-ray beam incident thereon, a detector for receiving and recording X-rays reflected by given lattice planes of the crystal, said detector being positioned adjacent the path of the primary X-ray beam and having a given receiving surface on which the reflected X-rays are incident, said detector receiving surface having a normal which forms an angle with the central ray of said primary X-ray beam which is twice that formed between the normal to the crystal reference surface and the primary X-ray beam.