Patent US3649488A successfully refreshed from Google Patents.
US3649488A
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Electrochemical etching technique for charting and curing defects in thin film capacitors
Assignee: AT&T Inc
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Filing: 1969-11-07
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Granted: 1972-03-14
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Expires: 1989-11-07
Abstract
Abstract DEFECTS IN PLANAR CAPACITORS MAY BE CHARATED AND CURED BY ELECTROLYTIC ETCHING OF LOCALIZED REGIONS OF CAPACITOR COUNTERELECTRODES ABOVE HIGH CONDUCTIVITY PATHS THROUGH THE DIELECTRIC.
Inventors
- 👤 Raymond C Pitetti
- 👤 Theodore W Zuber Jr
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 12:52
CPC Classifications
C; C25; C25F; C25F3/00; C25F3/02; C25F3/14; Y; Y10; Y10T; Y10T29/00; Y10T29/43; Y10T29/435
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1975-03-14 | 1975-09-13 | 1976-03-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1979-03-14 | 1979-09-13 | 1980-03-14 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1983-03-14 | 1983-09-13 | 1984-03-14 | $7700.00 | Window Closed / Lapsed |