Patent US3647952A successfully refreshed from Google Patents.
US3647952A
Expired / Lapsed
US
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Automatic beam-focusing system
Assignee: RCA Corp
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Filing: 1970-04-15
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Granted: 1972-03-07
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Expires: 1990-04-15
Abstract
Abstract A modulating component is added to a beam-focusing parameter such as a focusing electrode potential or a focusing parameter such as a focusing electrode potential or a focusing coil current utilized in conjunction with an image pickup device. A modulation component derived from a video output terminal of the image pickup device is detected and utilized for providing a beamfocusing error correction signal which controls the beam-focusing parameter.
Inventors
- 👤 Henry Ball
- 👤 Harold Leroy Peterson
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 18:46
CPC Classifications
H; H04; H04N; H04N3/00; H04N3/10; H04N3/16; H04N3/26
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
118 words
Apparatus for automatically focusing an electron beam of an image pickup device, comprising: an image pickup device including electromagnetic and electrostatic means for focusing an electron beam of said device; means for modulating a beam-focusing parameter coupled to one of said electromagnetic and electrostatic means of said image pickup device; means coupled to a signal output terminal of said image pickup device for detecting modulation components caused by said modulated focusing parameter; means coupled to said detecting means For producing a control signal corresponding to the sense of said detected modulation components; and means responsive to said control signal for altering a focusing parameter coupled to the other of said electromagnetic and electrostatic means for focusing said beam.
Claim 2
Dependent Claim
118 words
Apparatus for automatically focusing an electron beam of an image pickup device, comprising: an image pickup device including electromagnetic and electrostatic means for focusing an electron beam of said device; means for modulating a beam-focusing parameter coupled to one of said electromagnetic and electrostatic means of said image pickup device; means coupled to a signal output terminal of said image pickup device for detecting modulation components caused by said modulated focusing parameter; means coupled to said detecting means For producing a control signal corresponding to the sense of said detected modulation components; and means responsive to said control signal for altering a focusing parameter coupled to the other of said electromagnetic and electrostatic means for focusing said beam.
Claim 3
Dependent Claim
29 words
Apparatus for automatically focusing an electron beam of an image pickup device according to claim 1 wherein said modulating means includes means for periodically amplitude modulating said focusing parameter.
Claim 4
Dependent Claim
37 words
Apparatus for automatically focusing an electron beam of an image pickup device according to claim 2 wherein said detecting means includes means for periodically sampling said detected modulation components at the same rate of said amplitude modulation.
Claim 5
Dependent Claim
35 words
Apparatus for automatically focusing an electron beam of an image pickup device according to claim 3 wherein said means for producing a control signal includes means responsive to the polarity of said sampled modulation components.
Claim 6
Dependent Claim
107 words
Apparatus for focusing an electron beam in an image pickup device, comprising: an image pickup device including a focusing electrode to which is coupled a focusing potential; electromagnetic focusing means encircling said pickup device to which a focusing current is coupled; means for periodically modulating one of said focusing potential and current; means for detecting modulation components obtained from a signal electrode of said pickup device; means for producing a control signal from said detected modulation components representative of an out-of-focus state of said electron beam; and means responsive to said control signal for altering the other of said focusing current and potential for focusing said beam.
Claim 7
Dependent Claim
107 words
Apparatus for focusing an electron beam in an image pickup device, comprising: an image pickup device including a focusing electrode to which is coupled a focusing potential; electromagnetic focusing means encircling said pickup device to which a focusing current is coupled; means for periodically modulating one of said focusing potential and current; means for detecting modulation components obtained from a signal electrode of said pickup device; means for producing a control signal from said detected modulation components representative of an out-of-focus state of said electron beam; and means responsive to said control signal for altering the other of said focusing current and potential for focusing said beam.
Claim 8
Dependent Claim
127 words
Apparatus for focusing an electron beam in an image pickup device, comprising: an image pickup device including a signal producing electrode and a focusing electrode; means for continuously modulating a potential coupled to said focusing electrode at a rate relatively slow compared to the field scanning rate of said image pickup device for varying the focus of said electron beam at said modulation rate; means for deriving a signal from said signal producing electrode related to the focus condition of said electron beam; means for producing a control signal from said focus condition related signal said control signal being varied at a rate relatively slow compared to said modulating rate; and means responsive to said control signal for altering said focus potential for focusing said electron beam.
Claim 9
Dependent Claim
127 words
Apparatus for focusing an electron beam in an image pickup device, comprising: an image pickup device including a signal producing electrode and a focusing electrode; means for continuously modulating a potential coupled to said focusing electrode at a rate relatively slow compared to the field scanning rate of said image pickup device for varying the focus of said electron beam at said modulation rate; means for deriving a signal from said signal producing electrode related to the focus condition of said electron beam; means for producing a control signal from said focus condition related signal said control signal being varied at a rate relatively slow compared to said modulating rate; and means responsive to said control signal for altering said focus potential for focusing said electron beam.
Claim 10
Dependent Claim
131 words
Apparatus for focusing an electron beam in an image pickup device comprising: an image pickup device including a signal producing electrode; electromagnetic focusing means disposed around said image pickup device; means for continuously modulating current coupled to said focusing means at a rate relatively slow compared to the field scanning rate of said image pickup device for varying the focus of said electron beam at said modulation rate; means for deriving a signal from said signal producing electrode related to the focus condition of said electron beam; means for producing a control signal from said focus condition related signal said control signal being varied at a rate relatively slow compared to said modulating rate; and means responsive to said control signal for altering said focus current for focusing said electron beam.
Claim 11
Dependent Claim
131 words
Apparatus for focusing an electron beam in an image pickup device comprising: an image pickup device including a signal producing electrode; electromagnetic focusing means disposed around said image pickup device; means for continuously modulating current coupled to said focusing means at a rate relatively slow compared to the field scanning rate of said image pickup device for varying the focus of said electron beam at said modulation rate; means for deriving a signal from said signal producing electrode related to the focus condition of said electron beam; means for producing a control signal from said focus condition related signal said control signal being varied at a rate relatively slow compared to said modulating rate; and means responsive to said control signal for altering said focus current for focusing said electron beam.
References Cited (Backward Citations)
US2939042A
Cited
US3509275A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1975-03-07 | 1975-09-06 | 1976-03-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1979-03-07 | 1979-09-06 | 1980-03-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1983-03-07 | 1983-09-06 | 1984-03-07 | $7700.00 | Window Closed / Lapsed |