US3628140A — Scanning element and aperture wafer for electroni…

Claim 1

Independent Claim 266 words

An aperture wafer used in combination with electronic particle counting and sizing apparatus of the type which includes structure establishing an electric field in a path of very small dimensions whereby a particle flowing in a liquid suspension through said field changes the impedance characteristics of said field in a detectable manner and wherein said path is defined by said aperture wafer which comprises a relatively thin disc of highly heat resistant material having an aperture therethrough and which is mounted to the wall of an aperture vessel and in which apparatus electrical means are provided to detect the passage of said particles in terms of changE of the impedance characteristics of said field, said aperture wafer disc has opposite substantially parallel faces, said aperture being formed through the disc substantially at the center of said disc and having a generally cylindrical configuration, with the axis of the cylinder perpendicular to the faces of the disc and the diameter and axial length of said aperture being of the same order of dimension, a chamber of generally conical configuration formed in said wafer coaxial with the aperture and having its apex end connecting with one axial end of the aperture and its base end opening at one face of the disc, the second axial end of said aperture being connected with the second face of said disc, and the configuration of the chamber being such as to provide a portion of the disc contiguous to the one axial end of said aperture which is substantially thicker in an axial direction than the axial length of said aperture.

Claim 2

Dependent Claim 266 words

An aperture wafer used in combination with electronic particle counting and sizing apparatus of the type which includes structure establishing an electric field in a path of very small dimensions whereby a particle flowing in a liquid suspension through said field changes the impedance characteristics of said field in a detectable manner and wherein said path is defined by said aperture wafer which comprises a relatively thin disc of highly heat resistant material having an aperture therethrough and which is mounted to the wall of an aperture vessel and in which apparatus electrical means are provided to detect the passage of said particles in terms of changE of the impedance characteristics of said field, said aperture wafer disc has opposite substantially parallel faces, said aperture being formed through the disc substantially at the center of said disc and having a generally cylindrical configuration, with the axis of the cylinder perpendicular to the faces of the disc and the diameter and axial length of said aperture being of the same order of dimension, a chamber of generally conical configuration formed in said wafer coaxial with the aperture and having its apex end connecting with one axial end of the aperture and its base end opening at one face of the disc, the second axial end of said aperture being connected with the second face of said disc, and the configuration of the chamber being such as to provide a portion of the disc contiguous to the one axial end of said aperture which is substantially thicker in an axial direction than the axial length of said aperture.

Claim 3

Dependent Claim 26 words

The aperture tube as claimed in claim 1 in which the second axial end of the aperture opens directly to the second face of the disc.

Claim 4

Dependent Claim 47 words

The aperture tube as claimed in claim 1 in which there is a second substantially similar conical chamber formed in said wafer in mirror position relative to said first-mentioned chamber, and the second axial end of the aperture connects with the apex end of said second chamber.

Claim 5

Dependent Claim 24 words

The aperture wafer as claimed in claim 1 in which the conical angle of said chamber considered on a diametral plane is approximately 90*.

Claim 6

Dependent Claim 35 words

The aperture wafer as claimed in claim 1 in which the apex of the chamber is slightly spherical with the radius of such apex being no more than several times the diameter of the aperture.

Claim 7

Dependent Claim 21 words

The aperture wafer as claimed in claim 1 in which the juncture between the chamber and the aperture is substantially sharp.

Claim 8

Dependent Claim 212 words

A scanner element used in combination with electronic particle counting and sizing apparatus of the type which includes a vessel having an aperture therein through which fluids carrying suspensions of particles are adapted to pass and in which there is established an electric field and electrical means are provided to detect the passage of particles in terms of a change in the impedance characteristics of said electric field, said scanner element comprising: a. an aperture tube adapted to be connected into a closed fluid system so that a suspension may be drawn into the interior of the tube through a wall thereof and b. means providing a passageway through the wall of the tube, said means comprising i. a flat-faced corundum disc secured to said wall, ii. a cylindrical aperture in said disc having a diameter and length of the same dimensional order, iii. the aperture axis being substantially perpendicular to the faces of said disc, iv. a chamber of generally conical configuration formed in said wafer coaxial with said aperture and having its apex connecting with one axial end of said aperture and its base end opening to one face of said disc, and v. the second axial end of said aperture being connected with the second face of said disc.

Claim 9

Dependent Claim 212 words

A scanner element used in combination with electronic particle counting and sizing apparatus of the type which includes a vessel having an aperture therein through which fluids carrying suspensions of particles are adapted to pass and in which there is established an electric field and electrical means are provided to detect the passage of particles in terms of a change in the impedance characteristics of said electric field, said scanner element comprising: a. an aperture tube adapted to be connected into a closed fluid system so that a suspension may be drawn into the interior of the tube through a wall thereof and b. means providing a passageway through the wall of the tube, said means comprising i. a flat-faced corundum disc secured to said wall, ii. a cylindrical aperture in said disc having a diameter and length of the same dimensional order, iii. the aperture axis being substantially perpendicular to the faces of said disc, iv. a chamber of generally conical configuration formed in said wafer coaxial with said aperture and having its apex connecting with one axial end of said aperture and its base end opening to one face of said disc, and v. the second axial end of said aperture being connected with the second face of said disc.

Claim 10

Dependent Claim 57 words

The scanner element as claimed in claim 7 in which there is one conical chamber only and the one face of said disc to which the base end of the conical chamber opens is on the interior of the aperture tube the second axial end of the aperture opens directly to the second face of the disc.

Claim 11

Dependent Claim 39 words

The scanner element as claimed in claim 8 in which the disc is fusedly secured to the wall of the aperture tube with its flat surface disposed in position to be rubbed from the outside of the aperture tube.

Annuity Stage	Window Opens	Payment Deadline	Surcharge Period Until	Estimated Fee	Status
3.5 Years (Year 4)	1974-12-13	1975-06-14	1975-12-14	$2000.00	Window Closed / Lapsed
7.5 Years (Year 8)	1978-12-13	1979-06-14	1979-12-14	$3760.00	Window Closed / Lapsed
11.5 Years (Year 12)	1982-12-13	1983-06-14	1983-12-14	$7700.00	Window Closed / Lapsed

Scanning element and aperture wafer for electronic particle counting and sizing apparatus

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