Patent US3573617A successfully refreshed from Google Patents.
US3573617A
Expired / Lapsed
US
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Method and apparatus for testing packaged integrated circuits
Assignee: Amphenol Corp
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Filing: 1967-10-27
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Granted: 1971-04-06
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Expires: 1987-10-27
Abstract
Abstract A test apparatus is disclosed for testing a dual in-line packaged integrated circuit having dual rows of leads protruding laterally in respectively opposite directions from the package and bent normal thereto in a common direction. The test apparatus has a test head with dual rows of oppositely paired interfacing spaced contacts which are resiliently laterally inwardly biased towards each other and adapted to be engaged and laterally outwardly displaced from their quiescent position by the leads of the dual in-line packaged integrated circuit inserted between the dual rows of oppositely paired contacts. Each of the contacts is connected to a tester adapted to apply selected signals to selected contacts and sense the result thereof to determine the electrical condition of the integrated circuit inserted on the test head. To protect the dual rows of contacts, a cover with separators extending between each of the adjacent contacts is provided on the test socket which also serves to guide a packaged integrated circuit into engagement with the contacts on the test head. In addition, finger-accommodating recesses are provided to facilitate the insertion of a packaged integrated circuit onto the test head.
Inventors
- 👤 Ellwood A Randolph
- 👤 Paul A Baump
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 12:28
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/04; G01R1/0408; G01R1/0433
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
151 words
The method of testing a packaged electrical circuit having a central electrical-circuit-containing body with a plurality of leads arranged in dual rows protruding in respectively opposite lateral directions from the central body and bent normal thereto in a common direction, comprising the steps of: moving the central electrical-circuit-containing body with its associated packaged electrical circuit and rows of leads into male engagement with dual rows of laterally spaced test contacts forming a joint female union and with the dual leads of the packaged electrical circuit extending oppositely to the direction of movement; applying selected electrical signals to selected test contacts and sensing the result thereof to determine the electrical characteristics of the packaged electrical circuit; and removing the central body with its packaged electrical circuit from engagement with the dual rows of test contacts with the leads of the packaged electrical circuit extending in the direction of the initial removal movement.
Claim 2
Independent Claim
151 words
The method of testing a packaged electrical circuit having a central electrical-circuit-containing body with a plurality of leads arranged in dual rows protruding in respectively opposite lateral directions from the central body and bent normal thereto in a common direction, comprising the steps of: moving the central electrical-circuit-containing body with its associated packaged electrical circuit and rows of leads into male engagement with dual rows of laterally spaced test contacts forming a joint female union and with the dual leads of the packaged electrical circuit extending oppositely to the direction of movement; applying selected electrical signals to selected test contacts and sensing the result thereof to determine the electrical characteristics of the packaged electrical circuit; and removing the central body with its packaged electrical circuit from engagement with the dual rows of test contacts with the leads of the packaged electrical circuit extending in the direction of the initial removal movement.
Claim 3
Dependent Claim
39 words
The method of testing a packaged electrical circuit according to claim 1, further comprising the initial step of gripping the packaged electrical circuit central electrical-circuit-containing body at the opposite ends of the body between the dual rows of leads.
Claim 4
Dependent Claim
87 words
The method of testing a packaged electrical circuit according to claim 1, further comprising the initial step of manually gripping the packaged electrical circuit central electrical-circuit-containing body at the opposite ends of the body between the dual rows of leads, and effecting said movement of said packaged electrical circuit central electrical-circuit-containing body into the position for testing by transporting the packaged electrical circuit manually into said engagement with the dual rows of test contacts and effecting said removal of said electrical-circuit-containing body from said test socket manually.
Claim 5
Dependent Claim
157 words
Apparatus for testing a packaged electrical circuit having a plurality of leads arranged in dual rows protruding in respectively opposite lateral directions from the package and bent normal thereto in a common direction, comprising: a test head having a plurality of oppositely interfacing female unit contacts arranged in dual rows and spaced apart on support means; said oppositely interfacing contacts being upwardly opening and resiliently biased laterally toward each other with a quiescent space therebetween less than the outermost distance between the dual rows of the packaged electrical circuit leads; a finger-accommodating effective end opening at each end of said dual rows of interfacing contacts and communicating with said open quiescent space therebetween; and a tester electrically connected to the contacts of said test head and adapted to apply and sense the result of selected electrical signals at selected contacts of said test head to determine the electrical characteristics of the packaged electrical circuit engaging said contacts.
Claim 6
Dependent Claim
157 words
Apparatus for testing a packaged electrical circuit having a plurality of leads arranged in dual rows protruding in respectively opposite lateral directions from the package and bent normal thereto in a common direction, comprising: a test head having a plurality of oppositely interfacing female unit contacts arranged in dual rows and spaced apart on support means; said oppositely interfacing contacts being upwardly opening and resiliently biased laterally toward each other with a quiescent space therebetween less than the outermost distance between the dual rows of the packaged electrical circuit leads; a finger-accommodating effective end opening at each end of said dual rows of interfacing contacts and communicating with said open quiescent space therebetween; and a tester electrically connected to the contacts of said test head and adapted to apply and sense the result of selected electrical signals at selected contacts of said test head to determine the electrical characteristics of the packaged electrical circuit engaging said contacts.
Claim 7
Dependent Claim
52 words
Apparatus for testing a packaged electrical circuit according to claim 4, further comprising dual protective covers on the test head for the dual rows of test contacts and having separators extending between the adjacent test contacts which serve as guides for the insertion of a packaged electrical circuit onto said test head.
Claim 8
Dependent Claim
193 words
Apparatus for testing a packaged electrical circuit having a plurality of leads arranged in dual rows protruding in respectively opposite lateral directions from the package and bent normal thereto in a common direction, comprising: a test head having a plurality of oppositely interfacing contacts arranged in dual rows and spaced apart on support means, said oppositely interfacing contacts being upwardly open and resiliently biased laterally toward each other and adapted to be engaged and laterally displaced from a quiescent position and away from each other by the leads of the packaged electrical circuit inserted therebetween; stop means formed on said test head and adapted to be engaged by a packaged electrical circuit inserted between the dual rows of interfacing contacts; a finger-accommodating effect opening between the dual rows of test contacts and at each end thereof to facilitate the insertion of a packaged electrical circuit onto said test head; and a tester electrically connected to the contacts of said test head and adapted to apply and sense the result of selected electrical signals at selected contacts of said test head to determine the electrical characteristics of the packaged electrical circuit engaging said contacts.
Claim 9
Dependent Claim
193 words
Apparatus for testing a packaged electrical circuit having a plurality of leads arranged in dual rows protruding in respectively opposite lateral directions from the package and bent normal thereto in a common direction, comprising: a test head having a plurality of oppositely interfacing contacts arranged in dual rows and spaced apart on support means, said oppositely interfacing contacts being upwardly open and resiliently biased laterally toward each other and adapted to be engaged and laterally displaced from a quiescent position and away from each other by the leads of the packaged electrical circuit inserted therebetween; stop means formed on said test head and adapted to be engaged by a packaged electrical circuit inserted between the dual rows of interfacing contacts; a finger-accommodating effect opening between the dual rows of test contacts and at each end thereof to facilitate the insertion of a packaged electrical circuit onto said test head; and a tester electrically connected to the contacts of said test head and adapted to apply and sense the result of selected electrical signals at selected contacts of said test head to determine the electrical characteristics of the packaged electrical circuit engaging said contacts.
Claim 10
Dependent Claim
52 words
Apparatus for testing a packaged electrical circuit according to claim 6, further comprising dual protective covers on said test head for the dual rows of test contacts and having separators extending between the adjacent test contacts which serve as guides for the insertion of a packaged electrical circuit onto said test head.
Claim 11
Dependent Claim
89 words
Apparatus for testing a packaged electrical circuit according to claim 7 said oppositely interfacing contacts being formed from an electrically conductive elastically resilient material with each contact protruding upwardly from said test head and having an upstanding portion and being bent downwardly toward said oppositely interfacing contact to form a first bent portion and a camming portion adapted to be engaged by a lead of a packaged electrical circuit inserted between the dual rows of the upwardly protruding contacts, said contacts being resiliently self-biased at said first bent portion.
Claim 12
Dependent Claim
65 words
Apparatus for testing a packaged electrical circuit accordIng to claim 8 said upwardly protruding oppositely interfacing contact having the end of the downwardly extending camming portion being bent upwardly and away from said oppositely interfacing contact to form a second bent portion with the end of the contact engaging said upstanding portion, said contacts being resiliently self-biased at both said first and second bent portions.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1974-04-05 | 1974-10-05 | 1975-04-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1978-04-05 | 1978-10-05 | 1979-04-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1982-04-05 | 1982-10-05 | 1983-04-06 | $7700.00 | Window Closed / Lapsed |