Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
165 words
A three terminal solid state device having a negative resistance in the current-voltage characteristics of a current conductive path thereof between two of said terminals which comprises: a planar structure in said current conductive path having a metal layer, a semiconductor layer and an insulator layer therebetween which exhibits a negative resistance characteristic in said current conductive path, said metal layer and said semiconductor layer being connected to one each of said two terminals, respectively; and control electrode layer means connected to said other terminal and located adjacent to said semiconductor layer for providing a minority carrier injecting and extracting control electrode junction with said semiconductor layer, said control electrode junction being near to the surfaCe of said semiconductor layer defined by said semiconductor layer and said insulator layer and substantially perpendicular to said semiconductor surface and proximate to and outside of said current conductive path for interchanging two stable operating conditions of said device by minority carrier injection and extraction in said semiconductor layer.
Claim 2
Dependent Claim
165 words
A three terminal solid state device having a negative resistance in the current-voltage characteristics of a current conductive path thereof between two of said terminals which comprises: a planar structure in said current conductive path having a metal layer, a semiconductor layer and an insulator layer therebetween which exhibits a negative resistance characteristic in said current conductive path, said metal layer and said semiconductor layer being connected to one each of said two terminals, respectively; and control electrode layer means connected to said other terminal and located adjacent to said semiconductor layer for providing a minority carrier injecting and extracting control electrode junction with said semiconductor layer, said control electrode junction being near to the surfaCe of said semiconductor layer defined by said semiconductor layer and said insulator layer and substantially perpendicular to said semiconductor surface and proximate to and outside of said current conductive path for interchanging two stable operating conditions of said device by minority carrier injection and extraction in said semiconductor layer.
Claim 3
Dependent Claim
23 words
A device as set forth in claim 1 wherein said control electrode junction is in contact with said surface of said semiconductor layer.
Claim 4
Dependent Claim
37 words
A device as set forth in claim 1 wherein said junction is proximate to said current conductive path in said insulator layer by the order of the diffusion length for said minority carriers in said semiconductor layer.
Claim 5
Dependent Claim
23 words
A device as set forth in claim 1 wherein said control electrode is an N-type semiconductor and said semiconductor layer is P-type semiconductor.
Claim 6
Dependent Claim
24 words
A device as set forth in claim 4 wherein said metal is A1, said insulator layer is Si02 and said semiconductor is P-type Si.
Claim 7
Dependent Claim
26 words
A device as set forth in claim 5 wherein said Si02 insulator layer is doped with a dopant selected from the group of Ga and GaP.
Claim 8
Dependent Claim
22 words
A device as set forth in claim 1 wherein said control electrode is P-type semiconductor and said semiconductor layer is N-type semiconductor.
Claim 9
Dependent Claim
31 words
A device as set forth in claim 7 wherein said metal is A1, said insulator layer is Si02, said semiconductor layer is N-type Si, and said control electrode is P-type semiconductor.
Claim 10
Dependent Claim
27 words
A device is set forth in claim 8 wherein said Si02 insulator layer is doped with a dopant selected from the group consisting of Ga and GaP.