US3562599A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Cycling delay circuit testing device
Assignee: United States Department of the Army
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Filing: 1968-12-13
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Granted: 1971-02-09
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Expires: 1988-12-13
Abstract
Abstract A voltage cycling testing device for a delay circuit. A unijunction relaxation oscillator delivers a trigger pulse to a monostable multivibrator which activates a relay to apply power to a circuit under test. The unijunction transistor is activated periodically for a predetermined time period by a resistancecapacitance network. The relay is deactivated each time the multivibrator switches back to its stable state.
Inventors
- 👤 David R Dreitzler
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-22 21:35
CPC Classifications
H; H03; H03K; H03K3/00; H03K3/02; H03K3/35; H03K3/351
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
251 words
A voltage cycling testing device comprising a direct current power source; a resistance-capacitance charging means responsive to said power source for accruing a potential therein; triggering means having an input responsive to a certain potential in the charging means to cause the trigger means to discharge the potential of the charging means through an output of the trigger means; switching means connected across said power source and having an input and an output; said switching means including first and second transistors, and first, second, and third diodes; said transistors having the emitters thereof connected to a negative side of said power source; the anodes of said diodes being connected in common and through a first resistor to a positive side of said power source; the cathode of said first diode being the input of said switching means and being connected to the output of said triggering means; the cathode of said second diode being connected to the base of said first transistor and through a second resistor to said negative power source, the cathode of said third diode being connected through a third resistor to said negative power source and through a fourth resistor to said positive power source; the collector of said first transistor being connected to the base of said second transistor and through a low impedance to said positive power source; the collector of said second transistor being the output of said switching means; and a load responsive to said switching means for providing an output signal therefrom.
Claim 2
Dependent Claim
251 words
A voltage cycling testing device comprising a direct current power source; a resistance-capacitance charging means responsive to said power source for accruing a potential therein; triggering means having an input responsive to a certain potential in the charging means to cause the trigger means to discharge the potential of the charging means through an output of the trigger means; switching means connected across said power source and having an input and an output; said switching means including first and second transistors, and first, second, and third diodes; said transistors having the emitters thereof connected to a negative side of said power source; the anodes of said diodes being connected in common and through a first resistor to a positive side of said power source; the cathode of said first diode being the input of said switching means and being connected to the output of said triggering means; the cathode of said second diode being connected to the base of said first transistor and through a second resistor to said negative power source, the cathode of said third diode being connected through a third resistor to said negative power source and through a fourth resistor to said positive power source; the collector of said first transistor being connected to the base of said second transistor and through a low impedance to said positive power source; the collector of said second transistor being the output of said switching means; and a load responsive to said switching means for providing an output signal therefrom.
Claim 3
Dependent Claim
43 words
A testing device as set forth in claim 1 wherein said load is connected between the collector of said second transistor and said positive power source, and a capacitor is connected between said second transistor collector and the cathode of said third diode.
Claim 4
Dependent Claim
60 words
A testing device as set forth in claim 2 wherein said low impedance is a resistor; said resistance-capacitive network has the resistance thereof connected on one side to said positive power source and the capacitance thereof connected on one side to said negative power source, a common point between said resistance and capacitance being connected to said triggering means input.
Claim 5
Dependent Claim
36 words
A testing device as set forth in claim 3 wherein said load is an electromagnetic relay having a plurality of break-make contacts responsive to the operation thereof to activate and deactivate a plurality of external circuits.
Claim 6
Dependent Claim
39 words
A testing device as set forth in claim 3 wherein said load is an electromagnetic relay having a break-make contact responsive to the operation thereof to create an electrical path to an external circuit for a predetermined time interval.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1974-02-08 | 1974-08-10 | 1975-02-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1978-02-08 | 1978-08-10 | 1979-02-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1982-02-08 | 1982-08-10 | 1983-02-09 | $7700.00 | Window Closed / Lapsed |