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US3558348A Expired / Lapsed US ⏱️ 0.0 years remaining

Dielectric films for semiconductor devices

Assignee: AT&T Inc
•
Filing: 1968-04-18
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Granted: 1971-01-26
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Expires: 1988-04-18
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Abstract

Abstract MIXED SILICON OXIDE-SILICON NITRIDE FILMS OF PARTICULAR COMPOSITIONS ARE VAPOR DEPOSITED CONTROLLABLY ON SEMICONDUCTOR DEVICES BY A REACTION PROCESS IN NITROGEN AT BETWEEN 700-900*C. USING SILANE (SIH4) AND NITRIC OXIDE (NO) AS THE REACTANTS. THE COMPOSITION OF THE DEPOSITED FILM IS A FUNCTION OF THE RATIO OF REACTANT CONCENTRATIONS. PARTICULAR COMPOSITIONS YIELD FILMS WHICH COMBINE MINIMAL STRESS, RESISTANCE TO PENETRATION OF CONTAMINANTS, AND ETCHABILITY.

Inventors

  • 👤 Myron J Rand

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 12:57
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/69; H10P14/692; H10P14/6921; H10P14/6922; H10P14/6927; C; C23; C23C; C23C16/00; C23C16/22; C23C16/30; C23C16/308; H10P14/63; H10P14/6326; H10P14/6328; H10P14/6334; Y; Y10; Y10S; Y10S148/00; Y10S148/113; Y10S148/114

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1974-01-25 1974-07-27 1975-01-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1978-01-25 1978-07-27 1979-01-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1982-01-25 1982-07-27 1983-01-26 $7700.00 Window Closed / Lapsed

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