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US3537919A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of fabrication of gunn effect devices

Assignee: Fairchild Semiconductor Corp
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Filing: 1968-05-22
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Granted: 1970-11-03
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Expires: 1988-05-22
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Abstract

No abstract record available.

Inventors

  • 👤 Charles A Bittmann

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 12:58
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/24; H10P50/246; H10N; H10N80/00; Y; Y10; Y10S; Y10S148/00; Y10S148/05; Y10S148/051; Y10S148/135; Y10S438/00; Y10S438/90

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

US3435306A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1973-11-02 1974-05-04 1974-11-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1977-11-02 1978-05-04 1978-11-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1981-11-02 1982-05-04 1982-11-03 $7700.00 Window Closed / Lapsed

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