US3529249A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Sample and store apparatus including means to compensate for base line drift
Assignee: Texas Instruments Inc
•
Filing: 1965-12-07
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Granted: 1970-09-15
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Expires: 1985-12-07
Abstract
Abstract 1,160,970. Circuit testing. TEXAS INSTRUMENTS Inc. Aug.24, 1966 [Dec. 7, 1965], No. 37971/66. Heading G1U. The description repeats a large part of that in Specification 1,160, 969), especially that part concerned with the sampling system used in making dynamic tests. The claims are particularly directed to this sampling system.
Inventors
- 👤 Leslie L Jasper
- 👤 Howell R Phelps
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 18:01
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/319; G01R31/3193; G01R31/31937; G01R31/2851
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
US2468684A
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US2946013A
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US3007112A
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US3011129A
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US3010071A
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US3119984A
Cited
US3248655A
Cited
US3229212A
Cited
US3244989A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1973-09-14 | 1974-03-16 | 1974-09-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1977-09-14 | 1978-03-16 | 1978-09-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1981-09-14 | 1982-03-16 | 1982-09-15 | $7700.00 | Window Closed / Lapsed |