US3450986A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Magnetic reaction testing apparatus and method of testing utilizing semiconductor means for magnetic field sensing of an eddy-current-reaction magnetic field
Assignee: F W BELL Inc
•
Filing: 1966-04-06
•
Granted: 1969-06-17
•
Expires: 1986-04-06
Abstract
No abstract record available.
Inventors
- 👤 Richard M Chapman
- 👤 Donald M Yore
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-07 22:31
CPC Classifications
G; G01; G01N; G01N27/00; G01N27/72; G01N27/82; G01N27/90; G01N27/9046; G01N27/9006
Claims Analysis
Total Claims: 0
No claims parsed yet. Click Sync Now above to re-index claims from Google Patents.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1972-06-16 | 1972-12-16 | 1973-06-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1976-06-16 | 1976-12-16 | 1977-06-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1980-06-16 | 1980-12-16 | 1981-06-17 | $7700.00 | Window Closed / Lapsed |