← Back to Patent Explorer
US3359495A Expired / Lapsed US ⏱️ 0.0 years remaining

Magnetic reaction testing apparatus and method of testing utilizing semiconductor means for magnetic field sensing of an eddy-current-reaction magnetic field

Assignee: F W BELL Inc
•
Filing: 1964-08-13
•
Granted: 1967-12-19
•
Expires: 1984-08-13
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

No abstract record available.

Inventors

  • 👤 Robert C Mcmaster
  • 👤 Edwin D Sisson

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-25 21:49
CPC Classifications
G; G01; G01N; G01N27/00; G01N27/72; G01N27/82; G01N27/90; G01N27/9046; G01N27/9006

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 52 words
A MAGNETIC-REACTION TEST APPARATUS FOR NONDESTRUCTIVE TESTING COMPRISING INDUCTOR MEANS ENERGIZED TO PRODUCE A TIME-VARYING MAGNETIC FIELD OF PULSE OR PERIODIC WAVEFORM POSITIONED IN PREDETERMINED RELATIONSHIP TO A MATERIAL TO BE TESTED HAVING SPECIFIC PARAMETERS AND DISPOSED TO ELECTROMAGNETICALLY COUPLE SAID MAGNETIC FIELD WITH THE MATERIAL AND EFFECT AN EDDY-CURRENT REACTION MAG-
Claim 2
Dependent Claim 52 words
A MAGNETIC-REACTION TEST APPARATUS FOR NONDESTRUCTIVE TESTING COMPRISING INDUCTOR MEANS ENERGIZED TO PRODUCE A TIME-VARYING MAGNETIC FIELD OF PULSE OR PERIODIC WAVEFORM POSITIONED IN PREDETERMINED RELATIONSHIP TO A MATERIAL TO BE TESTED HAVING SPECIFIC PARAMETERS AND DISPOSED TO ELECTROMAGNETICALLY COUPLE SAID MAGNETIC FIELD WITH THE MATERIAL AND EFFECT AN EDDY-CURRENT REACTION MAG-

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1970-12-18 1971-06-19 1971-12-19 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1974-12-18 1975-06-19 1975-12-19 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1978-12-18 1979-06-19 1979-12-19 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag