Patent US3426201A successfully refreshed from Google Patents.
US3426201A
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US
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Method and apparatus for measuring the thickness of films by means of elliptical polarization of reflected infrared radiation
Assignee: Texas Instruments Inc
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Filing: 1965-10-12
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Granted: 1969-02-04
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Expires: 1985-10-12
Abstract
No abstract record available.
Inventors
- 👤 Albert R Hilton
- 👤 Charlie E Jones Jr
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 23:45
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/17; G01N21/21; G01N21/211; G01B; G01B11/00; G01B11/02; G01B11/06; G01B11/0616; G01B11/0641
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1972-02-04 | 1972-08-05 | 1973-02-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1976-02-04 | 1976-08-05 | 1977-02-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1980-02-04 | 1980-08-05 | 1981-02-04 | $7700.00 | Window Closed / Lapsed |