System for measurement of microwave delay line length

Claim 1

A SYSTEM FOR MEASURING THE LENGTH OF A MICROWAVE DELAY LINE, COMPRISING: (A) A SWEEP OSCILLATOR FOR REPEATEDLY SWEEPING THROUGH A DESIRED FREQUENCY RANGE, (B) FIRST AND SECOND WAVEGUIDE H-PLANE T''S, (C) A FIRST WAVEGUIDE MEANS INCLUDING A FIRST WAVEGUIDE ISOLATOR, A DIRECTIONAL COUPLED AND AN E-H PLANE TUNER CONNECTED IN SERIES TO FEED THE FREQUENCY SWEPT SIGNAL FROM SAID SWEEP OSCILLATOR TO THE CENTER PORT OF SAID FIRST H-PLANE T, (D) A SECOND WAVEGUIDE MEANS FORMING A REFERENCE LOOP OF KNOWN LENGTH AND INCLUDING A VARIABLE ATTENUATOR AND A SECOND WAVEGUIDE ISOLATOR CONNECTED IN SERIES BETWEEN A SIDE PORT OF SAID FIRST H-PLANE T AND A SIDE PORT OF SAID SECOND H-PLANE T, (E) A DELAY LINE OF UNKNOWN LENGTH TO BE MEASURED BEING CONNECTED BETWEEN THE OTHER SIDE PORT OF SAID FIRST H-PLANE T AND THE OTHER SIDE PORT OF SAID SECOND H-PLANE T AND FORMING AN UNKNOWN LOOP, (F) A THIRD WAVEGUIDE MEANS INCLUDING A FIRST CRYSTAL DETECTOR AND A WAVEGUIDE ISOLATOR CONNECTED IN SERIES TO THE CENTER PORT OF SAID SECOND H-PLANE T FOR OBSERVING THE SIGNAL LEVEL IN SAID SECOND H-PLANE T, (G) A FOURTH WAVEGUIDE MEANS CONSISTING OF A SECOND CRYSTAL DETECTOR AND A FREQUENCY METER CONNECTED IN SERIES TO SAID DIRECTIONAL COUPLER FOR DETERMINING THE FREQUENCY OF THE SYSTEM AT DESIRED INTERVALS, (H) A DISPLAY MEANS TO WHICH SAID CRYSTAL DETECTORS ARE CONNECTED FOR VIEWING SERIES OF POWER CHANGES IN SAID SECOND H-PLANE T DUE TO PHASE INTERACTIONS OF THE FREQUENCY SWEPT SIGNAL THROUGH SAID KNOWN AND UNKNOWN LOOPS AND MEASURING THE NUMBER OF NULLS THEREOF, (I) THE LENGTH OF SAID DELAY LINE (LU) BEING DETERMINED FROM THE MEASURED NUMBER OF ADDITIONAL NULLS (N), GENERATED AS A RESULT OF THE FREQUENCY OF SAID SIGNAL POWER LEVEL BEING CHANGED FROM A FIRST SELECTED FREQUENCY (F1) TO A SECOND SELECTED FREQUENCY (F2), AND THE MEASURED VALUE OF THE FREQUENCIES (F1 AND F2 IN ACCORDANCE WITH THE FORMULA

Claim 2

A SYSTEM FOR MEASURING THE LENGTH OF A MICROWAVE DELAY LINE, COMPRISING: (A) A SWEEP OSCILLATOR FOR REPEATEDLY SWEEPING THROUGH A DESIRED FREQUENCY RANGE, (B) FIRST AND SECOND WAVEGUIDE H-PLANE T''S, (C) A FIRST WAVEGUIDE MEANS INCLUDING A FIRST WAVEGUIDE ISOLATOR, A DIRECTIONAL COUPLED AND AN E-H PLANE TUNER CONNECTED IN SERIES TO FEED THE FREQUENCY SWEPT SIGNAL FROM SAID SWEEP OSCILLATOR TO THE CENTER PORT OF SAID FIRST H-PLANE T, (D) A SECOND WAVEGUIDE MEANS FORMING A REFERENCE LOOP OF KNOWN LENGTH AND INCLUDING A VARIABLE ATTENUATOR AND A SECOND WAVEGUIDE ISOLATOR CONNECTED IN SERIES BETWEEN A SIDE PORT OF SAID FIRST H-PLANE T AND A SIDE PORT OF SAID SECOND H-PLANE T, (E) A DELAY LINE OF UNKNOWN LENGTH TO BE MEASURED BEING CONNECTED BETWEEN THE OTHER SIDE PORT OF SAID FIRST H-PLANE T AND THE OTHER SIDE PORT OF SAID SECOND H-PLANE T AND FORMING AN UNKNOWN LOOP, (F) A THIRD WAVEGUIDE MEANS INCLUDING A FIRST CRYSTAL DETECTOR AND A WAVEGUIDE ISOLATOR CONNECTED IN SERIES TO THE CENTER PORT OF SAID SECOND H-PLANE T FOR OBSERVING THE SIGNAL LEVEL IN SAID SECOND H-PLANE T, (G) A FOURTH WAVEGUIDE MEANS CONSISTING OF A SECOND CRYSTAL DETECTOR AND A FREQUENCY METER CONNECTED IN SERIES TO SAID DIRECTIONAL COUPLER FOR DETERMINING THE FREQUENCY OF THE SYSTEM AT DESIRED INTERVALS, (H) A DISPLAY MEANS TO WHICH SAID CRYSTAL DETECTORS ARE CONNECTED FOR VIEWING SERIES OF POWER CHANGES IN SAID SECOND H-PLANE T DUE TO PHASE INTERACTIONS OF THE FREQUENCY SWEPT SIGNAL THROUGH SAID KNOWN AND UNKNOWN LOOPS AND MEASURING THE NUMBER OF NULLS THEREOF, (I) THE LENGTH OF SAID DELAY LINE (LU) BEING DETERMINED FROM THE MEASURED NUMBER OF ADDITIONAL NULLS (N), GENERATED AS A RESULT OF THE FREQUENCY OF SAID SIGNAL POWER LEVEL BEING CHANGED FROM A FIRST SELECTED FREQUENCY (F1) TO A SECOND SELECTED FREQUENCY (F2), AND THE MEASURED VALUE OF THE FREQUENCIES (F1 AND F2 IN ACCORDANCE WITH THE FORMULA