High frequency semi-conductor device test fixture having inductive loop signal injection means

Claim 1

IN A TESTING DEVICE SITUATABLE FOR MEASURING PARAMETERS IN A SEMICONDUCTOR DEVICE UNDER HIGH FREQUENCY CONDITIONS, THE COMBINATION OF CONDUCTIVE SHIELDS ADAPTED TO SURROUND ALL THE LEADS FROM THE DEVICE, AND HAVING MEANS THEREIN FOR SUPPORTING EACH OF SAID LEADS IN INSULATED RELATIONSHIP TO SAID SHIELDS, THE RECEIVING ENDS OF SAID SHIELDS BEING SUBSTANTIALLY CONTIGUOUS WITH THE DEVICE, ALL BUT AT LEAST ONE OF SAID SHIELDS BEING CONNECTED TOGETHER AT THE END OF SAID SHIELDS RECEIVING THE LEADS FROM THE DEVICE, ALL OF SAID SHIELDS BEING CONNECTED TOGETHER AT A POINT REMOVED FROM THE DEVICE SO THAT AN INDUCTANCE LOOP IS FORMED IN CLUDING THE ONE OF SAID SHIELDS NOT CONNECTED TO THE OTHERS AT THEIR RECEIVING ENDS, THE CONNECTION CONNECTING ALL SHIELDS TOGETHER, AND THE SHIELDS OF THOSE BEING CONNECTED AT THEIR RECEIVING ENDS, SAID INDUCTANCE LOOP BEING SUITABE FOR HAVING IMPRESSED THEREIN A DRIVING TEST CURRENT BY TRANSFORMER ACTION FROM AN EXCITING SOURCE, A DC BIAS SOURCE ADAPTED TO BE CONNECTED TO THE APPROPRIATE ONE OF THE LEADS FROM THE DEVICE AT THE END OPPOSITE FROM THE RECEIVING END TO CONDITION THE DEVICE FOR OPERATION, AND CURRENT METERING MEANS ADAPTED TO BE CONNECTED TO THE APPROPRIATE ONES OF THE LEADS FROM THE DEVICE AT THE ENDS OPPOSITE FROM THEIR RECEIVING ENDS.