Patent US3333146A successfully refreshed from Google Patents.
US3333146A
Expired / Lapsed
US
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Opto-electronic device
Assignee: International Business Machines Corp
•
Filing: 1964-06-29
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Granted: 1967-07-25
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Expires: 1984-06-29
Abstract
No abstract record available.
Inventors
- 👤 Jr Frederick H Dill
- 👤 Jr Karl L Konnerth
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 18:09
CPC Classifications
H; H01; H01J; H01J3/00; H01J3/02; H01J3/024; G; G02; G02F; G02F2/00; H01J31/00; H04; H04N; H04N23/00; H04N23/40
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
126 words
A SYSTEM FOR ANALYZING A VARIABLE AMPLITUDE LIGHT BEAM INCLUDING: A LIGHT SOURCE; AN OPTO-ELECTRONIC DEVICE COMPRISING: AN EVACUATED TUBE CLOSURE HAVING A PHOTOCATHODE AT ONE END THEREOF; ELECTRON GUN MEANS FOR FORMING PHOTOELECTRONS EMITTED FROM SAID PHOTOCATHODE IN AN ELECTRON BEAM; DEFLECTION MEANS FOR SAID BEAM; A PLURALITY OF SEMICONDUCTOR DIODES LOCATED AT THE OPPOSITE END OF SAID TUBE ENCLOSURE FROM SAID PHOTOCATHODE; EACH SAID DIODE HAVING A SEPARATE OUTPUT TERMINAL; MEANS FOR DEFLECTING SAID ELECTRON BEAM IN A PREDETERMINED PATTERN WITH RESPECT TO SAID DIODES TO SWEEP SAID ELECTRON BEAM ACROSS SAID DIODES AS LIGHT IS BEING RECEIVED AT SAID PHOTOCATHODE FROM SAID LIGHT SOURCE; AND MEANS FOR DETECTING THE CURRENT GENERATED IN SAID DIODES AS A RESULT OF THE ELECTRON BEAM STRIKING SAME.
Claim 2
Independent Claim
126 words
A SYSTEM FOR ANALYZING A VARIABLE AMPLITUDE LIGHT BEAM INCLUDING: A LIGHT SOURCE; AN OPTO-ELECTRONIC DEVICE COMPRISING: AN EVACUATED TUBE CLOSURE HAVING A PHOTOCATHODE AT ONE END THEREOF; ELECTRON GUN MEANS FOR FORMING PHOTOELECTRONS EMITTED FROM SAID PHOTOCATHODE IN AN ELECTRON BEAM; DEFLECTION MEANS FOR SAID BEAM; A PLURALITY OF SEMICONDUCTOR DIODES LOCATED AT THE OPPOSITE END OF SAID TUBE ENCLOSURE FROM SAID PHOTOCATHODE; EACH SAID DIODE HAVING A SEPARATE OUTPUT TERMINAL; MEANS FOR DEFLECTING SAID ELECTRON BEAM IN A PREDETERMINED PATTERN WITH RESPECT TO SAID DIODES TO SWEEP SAID ELECTRON BEAM ACROSS SAID DIODES AS LIGHT IS BEING RECEIVED AT SAID PHOTOCATHODE FROM SAID LIGHT SOURCE; AND MEANS FOR DETECTING THE CURRENT GENERATED IN SAID DIODES AS A RESULT OF THE ELECTRON BEAM STRIKING SAME.
References Cited (Backward Citations)
US2365006A
Cited
US2886739A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1970-07-24 | 1971-01-23 | 1971-07-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1974-07-24 | 1975-01-23 | 1975-07-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1978-07-24 | 1979-01-23 | 1979-07-25 | $7700.00 | Window Closed / Lapsed |